| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
An ac microcalorimeter for measuring specific heat of thin films
|
Song, Qinglin
|
|
|
35 |
10 |
p. 817-821
|
article
|
| 2 |
Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope
|
Lopez, Luis David Patiño
|
|
|
35 |
10 |
p. 797-803
|
article
|
| 3 |
Editorial board
|
|
|
|
35 |
10 |
p. i
|
article
|
| 4 |
Effects of temperature in deep-submicron global interconnect optimization in future technology nodes
|
Graziano, Mariagrazia
|
|
|
35 |
10 |
p. 849-857
|
article
|
| 5 |
Electro-thermal chaotic oscillations of paralleled bipolar transistors
|
Codecasa, Lorenzo
|
|
|
35 |
10 |
p. 859-868
|
article
|
| 6 |
Extraction of material parameters based on inverse modeling of three-dimensional interconnect fusing structures
|
Holzer, Stefan
|
|
|
35 |
10 |
p. 805-810
|
article
|
| 7 |
Ion sensitive field effect transistor modelling for multidomain simulation purposes
|
Janicki, Marcin
|
|
|
35 |
10 |
p. 831-840
|
article
|
| 8 |
Nanoscale electrothermal co-simulation: compact dynamic models of hyperbolic heat transport and self-consistent device Monte Carlo
|
Pilgrim, N.J.
|
|
|
35 |
10 |
p. 823-830
|
article
|
| 9 |
Self-heating experimental study of 600V PT-IGBTs under low dissipation energies
|
Perpiñà, X.
|
|
|
35 |
10 |
p. 841-847
|
article
|
| 10 |
Special issue on thermal investigations of integrated circuits and systems (THERMINIC'03)
|
Székely, Vladimir
|
|
|
35 |
10 |
p. 789-790
|
article
|
| 11 |
Thermal measurements of active semiconductor micro-structures acquired through the substrate using near IR thermoreflectance
|
Christofferson, James
|
|
|
35 |
10 |
p. 791-796
|
article
|
| 12 |
Thermal parameters identification of micrometric layers of microelectronic devices by thermoreflectance microscopy
|
Dilhaire, Stefan
|
|
|
35 |
10 |
p. 811-816
|
article
|
Journal description