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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 12 of 12 found articles
| Title: |
Thermal parameters identification of micrometric layers of microelectronic devices by thermoreflectance microscopy |
| Author: |
Dilhaire, Stefan Grauby, Stéphane Claeys, Wilfrid Batsale, Jean-Christophe |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 35 () nr. 10 pages 811-816 |
| Year: |
2004 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 12 of 12 found articles
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