| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Effects of preexisting voids on electromigration failure of flip chip solder bumps
|
Tang, Zirong
|
|
|
32 |
7 |
p. 605-613
|
artikel
|
| 2 |
Finite element analysis of the transmission characteristics of quantum wires in a magnetic field
|
Hirayama, Koichi
|
|
|
32 |
7 |
p. 569-577
|
artikel
|
| 3 |
Influence of ionising radiation on the performance of CMOS inverter
|
Chauhan, R.K
|
|
|
32 |
7 |
p. 615-620
|
artikel
|
| 4 |
Influence of γ radiation on thin Ta2O5–Si structures
|
Atanassova, E
|
|
|
32 |
7 |
p. 553-562
|
artikel
|
| 5 |
Modeling and optimization of process parameters for GaAs/AlGaAs multiple quantum well avalanche photodiodes using genetic algorithms
|
Kim, Eui-Seung
|
|
|
32 |
7 |
p. 563-567
|
artikel
|
| 6 |
Optical Sensors and Microsystems: New Concepts, Materials, Technologies
|
Saidane, A
|
|
|
32 |
7 |
p. 621-622
|
artikel
|
| 7 |
Patents Alert
|
|
|
|
32 |
7 |
p. 623-629
|
artikel
|
| 8 |
Space–Time Processing for CDMA Mobile Communications
|
Saidane, A
|
|
|
32 |
7 |
p. 621
|
artikel
|
| 9 |
Structural parameters governing properties of GaInSb/InAs infra-red detectors
|
Shaw, M.J
|
|
|
32 |
7 |
p. 593-598
|
artikel
|
| 10 |
Study of microstructure and resistivity evolution for electroplated copper films at near-room temperature
|
Teh, W.H
|
|
|
32 |
7 |
p. 579-585
|
artikel
|
| 11 |
The degradation of p-MOSFETs under off-state stress
|
Yang, Cunyu
|
|
|
32 |
7 |
p. 587-591
|
artikel
|
| 12 |
VDMOSFET model parameter extraction based on electrical and optical measurements
|
Salame, C.
|
|
|
32 |
7 |
p. 599-603
|
artikel
|
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