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34 gevonden resultaten

nr	titel	auteur	tijdschrift	jaar	jaarg.	afl.	pagina('s)	type
1	A CAD-oriented non-quasi-static approach for the transient analysis of MOS ICs				18	4	p. 43	artikel
2	A CAD-system for GaAs VHSIC design				18	4	p. 45	artikel
3	An extended two-region-MOSFET-model for network analysis				18	4	p. 42	artikel
4	An integrated VLSI design environment				18	4	p. 43	artikel
5	An interactive simulation program for MESFET and TEGFET structures				18	4	p. 45	artikel
6	A nonlinear method to estimate model parameters of junction field-effect transistors				18	4	p. 43	artikel
7	A portable analytical GaAs MESFET simulation model including temperature and negative differential mobility effects				18	4	p. 45	artikel
8	A simple expert system for a mask shop	Gupta, S.N.			18	4	p. 35-39	artikel
9	Automated design of MOS circuits and layout				18	4	p. 42	artikel
10	Bit-map CAD system of IC design employing BIT-I language				18	4	p. 44	artikel
11	CAD-images of process spread				18	4	p. 44	artikel
12	CAD studies of MESFET devices with a modified BAMBI				18	4	p. 45	artikel
13	CCDTS program in designing CCD device with buried channel				18	4	p. 43	artikel
14	Clock distribution in application specific integrated circuits	Mijuskovic, Dejan			18	4	p. 15-27	artikel
15	Computer modelling of polysiliconcontacted emitter bipolar transistors for VLSI circuits	Bradley, Susan M.			18	4	p. 5-14	artikel
16	Curve fitting to SPICE MOS level 3				18	4	p. 45	artikel
17	Defining a new environment for developing VLSI production tests				18	4	p. 43	artikel
18	Editorial	Butcher, John			18	4	p. 3-4	artikel
19	Forthcoming events				18	4	p. 63-64	artikel
20	Hierarchical timing verification system				18	4	p. 42	artikel
21	Joint Ventures				18	4	p. 61-62	artikel
22	Large-signal FET simulation using time domain and harmonic balance methods				18	4	p. 43-44	artikel
23	Matching of GaAs power FETs using a large-signal modelling technique				18	4	p. 44	artikel
24	Microelectronics into the 90's				18	4	p. 50-54	artikel
25	Microprocessors and Programmed Logic	Seals, R.			18	4	p. 55	artikel
26	Multiquantity intelligent measurement system for investigating thermal properties of semiconductor devices				18	4	p. 44	artikel
27	Optical considerations in target alignment using a non-actinic wavelength microscope	Yao, Shi-Kay			18	4	p. 29-34	artikel
28	Optimization of breakdown voltage in DMOS structures				18	4	p. 45	artikel
29	Parliamentary Report				18	4	p. 47-49	artikel
30	Research and Development				18	4	p. 56-60	artikel
31	Simulation of bipolar high-voltage devices in the neighbourhood of breakdown				18	4	p. 44	artikel
32	Sixth European Microelectronics Exhibition				18	4	p. 41	artikel
33	VLSI design methodology for ASIC development				18	4	p. 44	artikel
34	Wirability expert system				18	4	p. 42-43	artikel

34 gevonden resultaten

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