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34 results found

no	title	author	magazine	year	volume	issue	page(s)	type
1	A CAD-oriented non-quasi-static approach for the transient analysis of MOS ICs				18	4	p. 43	article
2	A CAD-system for GaAs VHSIC design				18	4	p. 45	article
3	An extended two-region-MOSFET-model for network analysis				18	4	p. 42	article
4	An integrated VLSI design environment				18	4	p. 43	article
5	An interactive simulation program for MESFET and TEGFET structures				18	4	p. 45	article
6	A nonlinear method to estimate model parameters of junction field-effect transistors				18	4	p. 43	article
7	A portable analytical GaAs MESFET simulation model including temperature and negative differential mobility effects				18	4	p. 45	article
8	A simple expert system for a mask shop	Gupta, S.N.			18	4	p. 35-39	article
9	Automated design of MOS circuits and layout				18	4	p. 42	article
10	Bit-map CAD system of IC design employing BIT-I language				18	4	p. 44	article
11	CAD-images of process spread				18	4	p. 44	article
12	CAD studies of MESFET devices with a modified BAMBI				18	4	p. 45	article
13	CCDTS program in designing CCD device with buried channel				18	4	p. 43	article
14	Clock distribution in application specific integrated circuits	Mijuskovic, Dejan			18	4	p. 15-27	article
15	Computer modelling of polysiliconcontacted emitter bipolar transistors for VLSI circuits	Bradley, Susan M.			18	4	p. 5-14	article
16	Curve fitting to SPICE MOS level 3				18	4	p. 45	article
17	Defining a new environment for developing VLSI production tests				18	4	p. 43	article
18	Editorial	Butcher, John			18	4	p. 3-4	article
19	Forthcoming events				18	4	p. 63-64	article
20	Hierarchical timing verification system				18	4	p. 42	article
21	Joint Ventures				18	4	p. 61-62	article
22	Large-signal FET simulation using time domain and harmonic balance methods				18	4	p. 43-44	article
23	Matching of GaAs power FETs using a large-signal modelling technique				18	4	p. 44	article
24	Microelectronics into the 90's				18	4	p. 50-54	article
25	Microprocessors and Programmed Logic	Seals, R.			18	4	p. 55	article
26	Multiquantity intelligent measurement system for investigating thermal properties of semiconductor devices				18	4	p. 44	article
27	Optical considerations in target alignment using a non-actinic wavelength microscope	Yao, Shi-Kay			18	4	p. 29-34	article
28	Optimization of breakdown voltage in DMOS structures				18	4	p. 45	article
29	Parliamentary Report				18	4	p. 47-49	article
30	Research and Development				18	4	p. 56-60	article
31	Simulation of bipolar high-voltage devices in the neighbourhood of breakdown				18	4	p. 44	article
32	Sixth European Microelectronics Exhibition				18	4	p. 41	article
33	VLSI design methodology for ASIC development				18	4	p. 44	article
34	Wirability expert system				18	4	p. 42-43	article

34 results found

Koninklijke Bibliotheek - National Library of the Netherlands