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                             29 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Amorphous BN films produced in a double-plasma reactor for semiconductor applications
17 5 p. 41
artikel
2 A normalized analytical solution for the capacitance associated with uniformly doped semiconductors at equilibrium
17 5 p. 43
artikel
3 Apology
17 5 p. 48
artikel
4 Book review Howson, M.

17 5 p. 33
artikel
5 Carrier lifetime in (Al,Ga)As epilayers and double heterostructure lasers grown with metal-organic vapour-phase epitaxy and liquid-phase epitaxy
17 5 p. 44
artikel
6 CHMOS improves system efficiency
17 5 p. 41
artikel
7 Diffusivity and growth rate of silicon in solid-phase epitaxy with an aluminium medium
17 5 p. 42
artikel
8 E-beam system metrology
17 5 p. 43
artikel
9 Economics of multiple site testing of PCBs
17 5 p. 43
artikel
10 Editorial Butcher, John

17 5 p. 3
artikel
11 Facing the headaches of early failures: a state-of-the-art review of burn-in decisions
17 5 p. 42
artikel
12 General purpose intelligent sensors Haskard, Malcolm R.

17 5 p. 9-14
artikel
13 Inversion electron mobility in Si−SiO2 structures oxidized at low and high temperatures Kassabov, J.

17 5 p. 15-22
artikel
14 Joint ventures
17 5 p. 40
artikel
15 Lifetime and drift velocity for electromigration in sputtered Al films, multilayers and alloys
17 5 p. 41
artikel
16 Low temperature processed MOSFET's using laser recrystalized polycrystalline silicon films
17 5 p. 42
artikel
17 Microelectronic ball-bond shear test—a critical review and comprehensive guide to its users
17 5 p. 43
artikel
18 Modelling DC characteristics of heterostructure bipolar junction transistors Abuelma'atti, Muhammad Taher

17 5 p. 5-8
artikel
19 Printed board assembly cleanliness—standards, practice and reliability considerations
17 5 p. 41
artikel
20 Quality assurance system and reliability testing of LSI circuits
17 5 p. 43
artikel
21 Research and Development
17 5 p. 35-36
artikel
22 Semiconductor surfaces and interfaces
17 5 p. 44
artikel
23 Technique for measuring the moisture content of sealed IC packages
17 5 p. 43
artikel
24 Temperature dependence of carrier transport in polycrystalline silicon Lee, J.Y.

17 5 p. 23-32
artikel
25 The Eureka joint projects list
17 5 p. 37-39
artikel
26 The influence of corrosion inhibitor and surface abrasion on the failure of aluminium-wired twist-on connections
17 5 p. 43
artikel
27 The measurement and sources of substrate heat flux encountered with magnetron sputtering
17 5 p. 42
artikel
28 Thermal management of electronic packages
17 5 p. 42
artikel
29 Trends in packaging and interconnection of integrated circuits
17 5 p. 42
artikel
                             29 gevonden resultaten
 
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