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48 gevonden resultaten
nr
titel
auteur
tijdschrift
jaar
jaarg.
afl.
pagina('s)
type
1
Amorphous-silicon devices start to shape up
16
2
p. 64
artikel
2
An LSI technology fully compatible EAROM cell
16
2
p. 64
artikel
3
An overview of thickness measurement techniques for metallic thin films
16
2
p. 63
artikel
4
A simple optimisation procedure for bipolar subnanosecond ICs with low power dissipation
16
2
p. 59
artikel
5
Automatic hardware synthesis
16
2
p. 61
artikel
6
Average mobilities of carriers in subdoped silicon layers
16
2
p. 59
artikel
7
16-bit bipolar microprocessor marches to standard instruction set
16
2
p. 64
artikel
8
Bonding temperature measurements during device assembly
16
2
p. 63
artikel
9
Circuit analysis, logic simulation and design verfication for VLSI
16
2
p. 63
artikel
10
Cosmic ray effects in microelectronics
Adams, L.
16
2
p. 17-29
artikel
11
Defect density and electrical properties of vacuum evaporated copper films for annealing studies of electrical resistance
16
2
p. 63
artikel
12
Diffusion characteristics of antimony and phosphorus spin-on sources
16
2
p. 61
artikel
13
Diffusivity of moisture in thin films
16
2
p. 60
artikel
14
Digital TV: makers bet on VLSI
16
2
p. 64
artikel
15
Editorial
Butcher, John
16
2
p. 3
artikel
16
Epitaxie en phase liquide de GaxIn1−xP1−y
16
2
p. 59
artikel
17
EPROM Testing-Part II: Application to 16k N-channel devices
16
2
p. 61-62
artikel
18
EPROM Testing—Part I: Theoretical considerations
16
2
p. 61
artikel
19
Forthcoming events
16
2
p. 53-55
artikel
20
Generation-recombination noise in p-type silicon
16
2
p. 62
artikel
21
IC process modelling and topography design
16
2
p. 60-61
artikel
22
Influence of series transistors on transfer characteristic of CMOS circuits
Dokić, Branko L.
16
2
p. 43-51
artikel
23
Influence variables in the precision thick-film technology
16
2
p. 62
artikel
24
Knowledge databases, emulation extend automated-tester capabilities
16
2
p. 62
artikel
25
Life of magnetic electroless Co-P thin films
16
2
p. 60
artikel
26
Liquid crystal displays
Jones, M.
16
2
p. 38-42
artikel
27
Managing VLSI complexity: an outlook
16
2
p. 61
artikel
28
Modification of semiconductor device characteristics by lasers
16
2
p. 62
artikel
29
Multi-chip module technology
16
2
p. 60
artikel
30
Ohmic contacts to III-V compound semiconductors: a review of fabrication techniques
16
2
p. 60
artikel
31
Packages for ultra-high speed GaAs ICs
Gheewala, Tushar R.
16
2
p. 30-37
artikel
32
Palladium alloy as a plating alternative for hybrid microelectronic packages
16
2
p. 59
artikel
33
Pascal for fortran programmers
Shute, M.J.
16
2
p. 57
artikel
34
Passivation of gallium arsenside by reactively sputtered gallium nitride thin films
16
2
p. 61
artikel
35
Properties of Mn-doped p-type In1−xAsyP1−ygrown by liquid-phase epitaxy
16
2
p. 62
artikel
36
Role of reliability and accelerated testing in VHSIC technology
16
2
p. 63
artikel
37
Specifying multilayer circuit boards to meet the demands of VLSI
16
2
p. 61
artikel
38
Synthesis of techniques creates complete system self-test
16
2
p. 62
artikel
39
The application of reactive ion etching to the definition of patterns in A1-Si-Cu conductor layers and thick silicon oxide films
16
2
p. 60
artikel
40
The cooling of electrical and electronic equipment in sealed enclosures
16
2
p. 64
artikel
41
The detection of microcontaminants in semiconductor process fluids using an acoustic technology
16
2
p. 62
artikel
42
Thermal nitridation of silicon dioxide for thin gate insulators. Part I
16
2
p. 59
artikel
43
The use of high magnetic fields for the characterization of impurities in epitaxial GaAs
16
2
p. 63
artikel
44
The use of solid-state circuitry within hazardous areas
16
2
p. 64
artikel
45
Thin film tansistors and thin film transistor circuits
16
2
p. 64
artikel
46
Wafer cooling in ion implantation
Mack, M.E.
16
2
p. 5-16
artikel
47
Wet etching today
16
2
p. 60
artikel
48
Wire-routing machines—new tools for VLSI physical design
16
2
p. 60
artikel
48 gevonden resultaten
Koninklijke Bibliotheek -
Nationale Bibliotheek van Nederland