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                             48 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Amorphous-silicon devices start to shape up
16 2 p. 64
artikel
2 An LSI technology fully compatible EAROM cell
16 2 p. 64
artikel
3 An overview of thickness measurement techniques for metallic thin films
16 2 p. 63
artikel
4 A simple optimisation procedure for bipolar subnanosecond ICs with low power dissipation
16 2 p. 59
artikel
5 Automatic hardware synthesis
16 2 p. 61
artikel
6 Average mobilities of carriers in subdoped silicon layers
16 2 p. 59
artikel
7 16-bit bipolar microprocessor marches to standard instruction set
16 2 p. 64
artikel
8 Bonding temperature measurements during device assembly
16 2 p. 63
artikel
9 Circuit analysis, logic simulation and design verfication for VLSI
16 2 p. 63
artikel
10 Cosmic ray effects in microelectronics Adams, L.

16 2 p. 17-29
artikel
11 Defect density and electrical properties of vacuum evaporated copper films for annealing studies of electrical resistance
16 2 p. 63
artikel
12 Diffusion characteristics of antimony and phosphorus spin-on sources
16 2 p. 61
artikel
13 Diffusivity of moisture in thin films
16 2 p. 60
artikel
14 Digital TV: makers bet on VLSI
16 2 p. 64
artikel
15 Editorial Butcher, John

16 2 p. 3
artikel
16 Epitaxie en phase liquide de GaxIn1−xP1−y
16 2 p. 59
artikel
17 EPROM Testing-Part II: Application to 16k N-channel devices
16 2 p. 61-62
artikel
18 EPROM Testing—Part I: Theoretical considerations
16 2 p. 61
artikel
19 Forthcoming events
16 2 p. 53-55
artikel
20 Generation-recombination noise in p-type silicon
16 2 p. 62
artikel
21 IC process modelling and topography design
16 2 p. 60-61
artikel
22 Influence of series transistors on transfer characteristic of CMOS circuits Dokić, Branko L.

16 2 p. 43-51
artikel
23 Influence variables in the precision thick-film technology
16 2 p. 62
artikel
24 Knowledge databases, emulation extend automated-tester capabilities
16 2 p. 62
artikel
25 Life of magnetic electroless Co-P thin films
16 2 p. 60
artikel
26 Liquid crystal displays Jones, M.

16 2 p. 38-42
artikel
27 Managing VLSI complexity: an outlook
16 2 p. 61
artikel
28 Modification of semiconductor device characteristics by lasers
16 2 p. 62
artikel
29 Multi-chip module technology
16 2 p. 60
artikel
30 Ohmic contacts to III-V compound semiconductors: a review of fabrication techniques
16 2 p. 60
artikel
31 Packages for ultra-high speed GaAs ICs Gheewala, Tushar R.

16 2 p. 30-37
artikel
32 Palladium alloy as a plating alternative for hybrid microelectronic packages
16 2 p. 59
artikel
33 Pascal for fortran programmers Shute, M.J.

16 2 p. 57
artikel
34 Passivation of gallium arsenside by reactively sputtered gallium nitride thin films
16 2 p. 61
artikel
35 Properties of Mn-doped p-type In1−xAsyP1−ygrown by liquid-phase epitaxy
16 2 p. 62
artikel
36 Role of reliability and accelerated testing in VHSIC technology
16 2 p. 63
artikel
37 Specifying multilayer circuit boards to meet the demands of VLSI
16 2 p. 61
artikel
38 Synthesis of techniques creates complete system self-test
16 2 p. 62
artikel
39 The application of reactive ion etching to the definition of patterns in A1-Si-Cu conductor layers and thick silicon oxide films
16 2 p. 60
artikel
40 The cooling of electrical and electronic equipment in sealed enclosures
16 2 p. 64
artikel
41 The detection of microcontaminants in semiconductor process fluids using an acoustic technology
16 2 p. 62
artikel
42 Thermal nitridation of silicon dioxide for thin gate insulators. Part I
16 2 p. 59
artikel
43 The use of high magnetic fields for the characterization of impurities in epitaxial GaAs
16 2 p. 63
artikel
44 The use of solid-state circuitry within hazardous areas
16 2 p. 64
artikel
45 Thin film tansistors and thin film transistor circuits
16 2 p. 64
artikel
46 Wafer cooling in ion implantation Mack, M.E.

16 2 p. 5-16
artikel
47 Wet etching today
16 2 p. 60
artikel
48 Wire-routing machines—new tools for VLSI physical design
16 2 p. 60
artikel
                             48 gevonden resultaten
 
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