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                             40 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A device analysis system based on laser scanning techniques
14 3 p. 92
artikel
2 Analyser tests bare and loaded boards
14 3 p. 92
artikel
3 A new dielectric isolation method using porous silicon
14 3 p. 91
artikel
4 Architectural considerations for an uncommitted circuit intended for combined digital and analogue functions Kemp, A.J.

14 3 p. 21-30
artikel
5 Book Review Walker, P.A.

14 3 p. 87-88
artikel
6 Book Review Rathkey, P.W.K.

14 3 p. 88
artikel
7 Change of the electron effective mass in extremely heavily doped n-type Si obtained by ion implantation and laser annealing
14 3 p. 91
artikel
8 Developments in products, technology and design tools Chan, S.

14 3 p. 53-59
artikel
9 Editorial Butcher, John

14 3 p. 3
artikel
10 Epitaxial layer blocks unwanted charge in MOS RAMs
14 3 p. 91
artikel
11 GaAs semi-insulating materials: key parameters and characterisation methods
14 3 p. 90
artikel
12 High speed CMOS gate arrays Dantec, A.

14 3 p. 41-52
artikel
13 Hot-wall CVD Tungsten for VLSI
14 3 p. 89
artikel
14 Individual wafer metallisation utilising load-locked, close-coupled conical magnetron sputtering
14 3 p. 91
artikel
15 Innovations which reduce costs and turn-around time of integrated circuit production for small electronic engineering companies
14 3 p. 91
artikel
16 Lasers automate pc-board inspection
14 3 p. 92
artikel
17 Low frequency excess noise in SOS MOS FETs
14 3 p. 89
artikel
18 Monolithic microwave circuits
14 3 p. 89
artikel
19 Ni-P as a new material for thick-film technology
14 3 p. 90
artikel
20 [No title] McClelland, S.

14 3 p. 87
artikel
21 On anomalous drift mobility results in a-silicon alloys
14 3 p. 90
artikel
22 Oxidised porous silicon isolates better than sapphire
14 3 p. 90
artikel
23 Personality modules' firmware controls VLSI circuit tester
14 3 p. 92
artikel
24 Polymer-monomer conversion in anthracene thin-films as a switching and memory device
14 3 p. 90
artikel
25 Post-characterisation of GaAs field-effect transistors and integrated circuits on test patterns
14 3 p. 92
artikel
26 Progress in and technology of low-cost silver containing thick-film conductors
14 3 p. 89
artikel
27 Raman spectra of Si-implanted silicon on sapphire
14 3 p. 91
artikel
28 Safety in chemical vapour deposition
14 3 p. 91
artikel
29 Scanning electron beam probes VLSI chips
14 3 p. 92
artikel
30 Semiconductor industry silicon: physical and thermodynamic properties
14 3 p. 89
artikel
31 Stress dependence of electron-hole liquied parameters in silicon
14 3 p. 90
artikel
32 Test and reliability evaluation of microprocessors
14 3 p. 92
artikel
33 Testing logic arrays Walker, R.

14 3 p. 31-39
artikel
34 Test optimisation for static RAM memories
14 3 p. 92
artikel
35 The diffusion of silicon in germanium
14 3 p. 89
artikel
36 The future of custom MOS Shenton, G.

14 3 p. 13-19
artikel
37 The use of bipolar semiconductor junctions in linear circuit design Bray, Derek

14 3 p. 61-86
artikel
38 Transport equations for the analysis of heavily doped semiconductor devices
14 3 p. 90
artikel
39 Trends in semi-custom integrated circuits — An overview Pyne, A.

14 3 p. 5-11
artikel
40 Uniform aluminum deposits on large non-planar and planar polyimide substrates by physical vapour deposition
14 3 p. 91
artikel
                             40 gevonden resultaten
 
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