nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Absorption effects on ESR and conductance of RF sputtered a-Si films
|
|
|
|
13 |
4 |
p. 41 |
artikel |
2 |
A new production technique: Ion milling
|
|
|
|
13 |
4 |
p. 42 |
artikel |
3 |
An offset-free switched-capacitor biquad
|
Gregorian, Roubik |
|
|
13 |
4 |
p. 37-40 |
artikel |
4 |
A review of bulk unipolar diodes and their applications
|
Board, K. |
|
|
13 |
4 |
p. 19-22 |
artikel |
5 |
A simple optimisation procedure for bipolar subnanosecond ICs with low power dissipation
|
Ranfft, R. |
|
|
13 |
4 |
p. 23-28 |
artikel |
6 |
Book review
|
Mander, H.F. |
|
|
13 |
4 |
p. 44 |
artikel |
7 |
Book review
|
Krejcik, Milos |
|
|
13 |
4 |
p. 44 |
artikel |
8 |
Book review
|
Krejcik, Milos |
|
|
13 |
4 |
p. 44 |
artikel |
9 |
Characteristics of metal-semiconductor contacts fabricated by the electroless deposition method
|
|
|
|
13 |
4 |
p. 43 |
artikel |
10 |
Comparison of enamelled steel substrate properties for thick film use
|
|
|
|
13 |
4 |
p. 42 |
artikel |
11 |
Contamination control in lead bonding to thick and thin films
|
|
|
|
13 |
4 |
p. 41 |
artikel |
12 |
Deep UV projection system
|
|
|
|
13 |
4 |
p. 42 |
artikel |
13 |
Editorial
|
Butcher, John |
|
|
13 |
4 |
p. 3 |
artikel |
14 |
Electrical Rutherford backscattering and transmission electron microscopy studies of furnace annealed zinc implanted GaAs
|
|
|
|
13 |
4 |
p. 43 |
artikel |
15 |
Electric measurement of impurity concentration in p-type epitaxially grown and ion-implanted base regions
|
|
|
|
13 |
4 |
p. 43 |
artikel |
16 |
Electron beam harmlessly probes high-density chips
|
|
|
|
13 |
4 |
p. 43 |
artikel |
17 |
Energy saving production of silicon single crystal solar cells by ion implantation and laser annealing
|
|
|
|
13 |
4 |
p. 42 |
artikel |
18 |
Fabrication process techniques for switched-capacitor filter circuits
|
Maddox, R.L. |
|
|
13 |
4 |
p. 29-36 |
artikel |
19 |
20 GHz low noise beam lead GaAs FET
|
Baudet, Pierre |
|
|
13 |
4 |
p. 15-18 |
artikel |
20 |
I/C packaging and interconnection developments
|
|
|
|
13 |
4 |
p. 42 |
artikel |
21 |
Influence of manufacturing process on ultrasonic bondability of thick film gold conductors
|
|
|
|
13 |
4 |
p. 42 |
artikel |
22 |
Liquid crystal technique as a failure analysis tool
|
|
|
|
13 |
4 |
p. 43 |
artikel |
23 |
LSI circuit for AC motor speed control
|
|
|
|
13 |
4 |
p. 43 |
artikel |
24 |
LSI helps telephones go digital
|
|
|
|
13 |
4 |
p. 43 |
artikel |
25 |
Magnetic bubble reliability testing — component and system level aspects
|
|
|
|
13 |
4 |
p. 43 |
artikel |
26 |
Mask making for custom VLSI
|
|
|
|
13 |
4 |
p. 43 |
artikel |
27 |
Medium-power GaAs bipolar transistors
|
Beneking, H. |
|
|
13 |
4 |
p. 5-14 |
artikel |
28 |
New light-sensitive positive-working thick resist materials for various electronic applications
|
|
|
|
13 |
4 |
p. 41 |
artikel |
29 |
Overlay in lithography
|
|
|
|
13 |
4 |
p. 42 |
artikel |
30 |
Quality assurance of electrical distribution products
|
|
|
|
13 |
4 |
p. 42 |
artikel |
31 |
Reticles for wafer imaging systems
|
|
|
|
13 |
4 |
p. 42 |
artikel |
32 |
Scanning light spot analysis of faulty solar cells
|
|
|
|
13 |
4 |
p. 43 |
artikel |
33 |
Simultaneous contacting — modern assembly methods of microelectronics
|
|
|
|
13 |
4 |
p. 42 |
artikel |
34 |
Step-and-repeat wafer imaging
|
|
|
|
13 |
4 |
p. 42 |
artikel |
35 |
Stimulus unit simplifies failure analysis
|
|
|
|
13 |
4 |
p. 43 |
artikel |
36 |
Theremoelectric heat pumps cool packages electronically
|
|
|
|
13 |
4 |
p. 43 |
artikel |
37 |
Thick-film base-metal conductors on beryllia
|
|
|
|
13 |
4 |
p. 41 |
artikel |
38 |
Yield model for productivity optimisation of VLSI memory chips with redundancy and partially good product
|
|
|
|
13 |
4 |
p. 43 |
artikel |