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                                       Details for article 38 of 38 found articles
 
 
  Yield model for productivity optimisation of VLSI memory chips with redundancy and partially good product
 
 
Title: Yield model for productivity optimisation of VLSI memory chips with redundancy and partially good product
Author:
Appeared in: Microelectronics journal
Paging: Volume 13 () nr. 4 pages 43
Year: 1982
Contents:
Publisher: Benn Electronics Publications Limited, Luton
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 38 of 38 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands