nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Ar+ and He+-ion influence on Si2p and O1s atomic lines an XPS study
|
Benkherourou, O |
|
1998 |
49 |
2 |
p. 121-124 4 p. |
artikel |
2 |
Comparison of unbalanced magnetron sputtering and filtered arc evaporation for the preparation of films onto insulating substrates
|
Mustapha, N |
|
1998 |
49 |
2 |
p. 75-79 5 p. |
artikel |
3 |
Detection of CH3 radicals in an RF CH4 H2 plasma by photoionization mass spectrometry
|
Ando, S |
|
1998 |
49 |
2 |
p. 113-120 8 p. |
artikel |
4 |
Growth and thermal stability of Pd and Pt adsorption layers on the Ta (211) face
|
Ubogyi, I |
|
1998 |
49 |
2 |
p. 145-151 7 p. |
artikel |
5 |
Identification of induced reaction during XPS depth profile measurements of CeO2 Si films grown by ion beam epitaxy
|
Wu, Z |
|
1998 |
49 |
2 |
p. 133-137 5 p. |
artikel |
6 |
Mechanism of induced reaction during XPS depth profile measurements of CeO2 Si films grown by ion beam epitaxy
|
Yang, X |
|
1998 |
49 |
2 |
p. 139-143 5 p. |
artikel |
7 |
Nondestructive determination of the concentration profile in the surface layer of AuCu alloy with the use of directional AES and Monte-Carlo simulations
|
Mróz, S |
|
1998 |
49 |
2 |
p. 101-105 5 p. |
artikel |
8 |
Physical parameters affecting deposition rates of binary alloys in a magnetron sputtering system
|
Habib, SK |
|
1998 |
49 |
2 |
p. 153-160 8 p. |
artikel |
9 |
Post-treatment of titanium nitride by ion implantation
|
Perry, Anthony J |
|
1998 |
49 |
2 |
p. 89-95 7 p. |
artikel |
10 |
Synthesis of high quality CdTe films by graphite box annealing
|
Chakrabarti, R |
|
1998 |
49 |
2 |
p. 107-112 6 p. |
artikel |
11 |
Temperature corrections for the calibration of vacuum gauges
|
Jousten, K |
|
1998 |
49 |
2 |
p. 81-87 7 p. |
artikel |
12 |
The energy distributions of major ions in the cathode zone of a strongly abnormal nitrogen DC glow discharge
|
Wronski, Z |
|
1998 |
49 |
2 |
p. 97-100 4 p. |
artikel |
13 |
Vacuum diary
|
|
|
1998 |
49 |
2 |
p. I-III nvt p. |
artikel |
14 |
X-ray photoemission study of soldered lead materials relevance to the surface and interface chemical composition of Roman lead pipes “fistulae”
|
Paparazzo, E |
|
1998 |
49 |
2 |
p. 125-131 7 p. |
artikel |