| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A DDA in MTOS
|
|
|
1970
|
9 |
3 |
p. 225-
1 p.
|
artikel
|
| 2 |
Adhesion mechanism of gold-underlayer film combinations to oxide substrates
|
|
|
1970
|
9 |
3 |
p. 227-228
2 p.
|
artikel
|
| 3 |
Advanced developments in sub-nanosecond integrated logic circuits
|
|
|
1970
|
9 |
3 |
p. 225-
1 p.
|
artikel
|
| 4 |
A hybrid thick-film chroma demodulator and color-difference amplifier
|
|
|
1970
|
9 |
3 |
p. 224-225
2 p.
|
artikel
|
| 5 |
A local approach to testing IC's
|
|
|
1970
|
9 |
3 |
p. 217-
1 p.
|
artikel
|
| 6 |
A look at semiconductor reliability
|
|
|
1970
|
9 |
3 |
p. 218-
1 p.
|
artikel
|
| 7 |
Analysis of transistor second breakdown
|
|
|
1970
|
9 |
3 |
p. 218-
1 p.
|
artikel
|
| 8 |
An automatic design system of IC logic package
|
|
|
1970
|
9 |
3 |
p. 222-
1 p.
|
artikel
|
| 9 |
An introduction to value management
|
|
|
1970
|
9 |
3 |
p. 215-
1 p.
|
artikel
|
| 10 |
Anodic growth, dielectric breakdown and carrier transport in amorphous SiO2 films
|
|
|
1970
|
9 |
3 |
p. 227-
1 p.
|
artikel
|
| 11 |
Antiphase boundaries in semiconducting compounds
|
|
|
1970
|
9 |
3 |
p. 229-
1 p.
|
artikel
|
| 12 |
A pulse generator using R.T.L. integrated circuits
|
|
|
1970
|
9 |
3 |
p. 224-
1 p.
|
artikel
|
| 13 |
Batch acceptance sampling by attributes to reduce overall costs
|
|
|
1970
|
9 |
3 |
p. 217-
1 p.
|
artikel
|
| 14 |
Boosting reliability of disk memories
|
|
|
1970
|
9 |
3 |
p. 219-
1 p.
|
artikel
|
| 15 |
Bulk negative resistance device operated in a relaxation mode
|
|
|
1970
|
9 |
3 |
p. 227-
1 p.
|
artikel
|
| 16 |
Calendar of International Conferences, Symposia, Lectures and Meetings of Interest
|
|
|
1970
|
9 |
3 |
p. 203-205
3 p.
|
artikel
|
| 17 |
Call for papers
|
|
|
1970
|
9 |
3 |
p. 209-
1 p.
|
artikel
|
| 18 |
Capacitor designs aim for IC compatibility
|
|
|
1970
|
9 |
3 |
p. 225-
1 p.
|
artikel
|
| 19 |
Characterization control, and use of dielectric charge effects in silicon technology
|
|
|
1970
|
9 |
3 |
p. 227-
1 p.
|
artikel
|
| 20 |
Chromium masks
|
|
|
1970
|
9 |
3 |
p. 222-
1 p.
|
artikel
|
| 21 |
Conference report
|
Thomas, J.W.
|
|
1970
|
9 |
3 |
p. 207-208
2 p.
|
artikel
|
| 22 |
Contact injection into dielectric films in microelectronic structures
|
Pitt, C.W.
|
|
1970
|
9 |
3 |
p. 239-266
28 p.
|
artikel
|
| 23 |
Courses in microelectronics and reliability
|
|
|
1970
|
9 |
3 |
p. 199-201
3 p.
|
artikel
|
| 24 |
Design considerations in thick-film hybrid microcircuits layout
|
|
|
1970
|
9 |
3 |
p. 231-
1 p.
|
artikel
|
| 25 |
Designing for reliability in automatic message processing system
|
|
|
1970
|
9 |
3 |
p. 218-219
2 p.
|
artikel
|
| 26 |
Developing and organising an effective value engineering programme—Part 3. A case history on the largest scale
|
|
|
1970
|
9 |
3 |
p. 215-
1 p.
|
artikel
|
| 27 |
Development of CSL type integrated logic circuit
|
|
|
1970
|
9 |
3 |
p. 223-
1 p.
|
artikel
|
| 28 |
Device modeling for computer-aided design and analysis of integrated circuits
|
|
|
1970
|
9 |
3 |
p. 220-
1 p.
|
artikel
|
| 29 |
Die and wire bonding capabilities of representative thick-film conductors
|
|
|
1970
|
9 |
3 |
p. 231-
1 p.
|
artikel
|
| 30 |
Dielectric breakdown voltage characteristics of evaporated silicon oxide films
|
|
|
1970
|
9 |
3 |
p. 217-
1 p.
|
artikel
|
| 31 |
Dielectric materials in semiconductor devices
|
|
|
1970
|
9 |
3 |
p. 227-
1 p.
|
artikel
|
| 32 |
Dielectric properties of reactively sputtered films of aluminium nitride
|
|
|
1970
|
9 |
3 |
p. 229-
1 p.
|
artikel
|
| 33 |
Dielectric properties of silicone thin films cross-linked by an electron beam
|
Aoe, Hiroyuki
|
|
1970
|
9 |
3 |
p. 267-270
4 p.
|
artikel
|
| 34 |
Die Metall-Halbleiter-Kontaktbarrieren der Metalle aus der Nebengruppe I und VIII auf Silizium und Germanium
|
|
|
1970
|
9 |
3 |
p. 226-
1 p.
|
artikel
|
| 35 |
Doping of epitaxial silicon—Behavior of solid solutions
|
|
|
1970
|
9 |
3 |
p. 229-
1 p.
|
artikel
|
| 36 |
Electrical characterization of radio-frequency sputtering gas discharge
|
|
|
1970
|
9 |
3 |
p. 230-
1 p.
|
artikel
|
| 37 |
Electrical conduction in evaporated silicon oxide films
|
|
|
1970
|
9 |
3 |
p. 228-
1 p.
|
artikel
|
| 38 |
Electrical suppression of avalanche currents in semiconductor junctions
|
|
|
1970
|
9 |
3 |
p. 226-
1 p.
|
artikel
|
| 39 |
Failure mechanisms in large-scale integrated circuits
|
|
|
1970
|
9 |
3 |
p. 217-
1 p.
|
artikel
|
| 40 |
Fault location—An approach to systematic fault finding
|
|
|
1970
|
9 |
3 |
p. 218-
1 p.
|
artikel
|
| 41 |
Frequency characteristics of thin film plane resistor
|
|
|
1970
|
9 |
3 |
p. 230-
1 p.
|
artikel
|
| 42 |
General theory for pinched operation of the junction-gate FET
|
|
|
1970
|
9 |
3 |
p. 226-
1 p.
|
artikel
|
| 43 |
Glass-ceramics for the coating and bonding of silicon semiconductor material
|
|
|
1970
|
9 |
3 |
p. 221-
1 p.
|
artikel
|
| 44 |
Heterojonctions Ge p-Si n Obtenues par epitaxie sous vide
|
|
|
1970
|
9 |
3 |
p. 226-
1 p.
|
artikel
|
| 45 |
High-quality video switcher using integrated circuit devices
|
|
|
1970
|
9 |
3 |
p. 223-
1 p.
|
artikel
|
| 46 |
High-resistivity thin-film resistors for monolithic circuits—A review
|
|
|
1970
|
9 |
3 |
p. 231-
1 p.
|
artikel
|
| 47 |
How reliable are MOS IC's? As good as bipolars, says NASA
|
|
|
1970
|
9 |
3 |
p. 218-
1 p.
|
artikel
|
| 48 |
How to prototype hybrid-circuit patterns and screens at budget prices
|
|
|
1970
|
9 |
3 |
p. 219-
1 p.
|
artikel
|
| 49 |
Hybrids move ahead in '69
|
|
|
1970
|
9 |
3 |
p. 220-
1 p.
|
artikel
|
| 50 |
IC pattern exposure by scanning electron beam apparatus
|
|
|
1970
|
9 |
3 |
p. 232-
1 p.
|
artikel
|
| 51 |
Integrated circuits for television receivers
|
|
|
1970
|
9 |
3 |
p. 223-
1 p.
|
artikel
|
| 52 |
Integrated electronics
|
|
|
1970
|
9 |
3 |
p. 220-
1 p.
|
artikel
|
| 53 |
Interconnections for microcircuits—Part 2
|
|
|
1970
|
9 |
3 |
p. 221-
1 p.
|
artikel
|
| 54 |
Intrinsic stress in evaporated metal films
|
|
|
1970
|
9 |
3 |
p. 229-
1 p.
|
artikel
|
| 55 |
Jack-of-all-trades: Monolithic i. f. is a universal subsystem
|
|
|
1970
|
9 |
3 |
p. 224-
1 p.
|
artikel
|
| 56 |
La fiabilite en France
|
Chaigneau, Y.
|
|
1970
|
9 |
3 |
p. 235-238
4 p.
|
artikel
|
| 57 |
Linear metal-oxide-semiconductor integrated circuits
|
|
|
1970
|
9 |
3 |
p. 224-
1 p.
|
artikel
|
| 58 |
Make systems fail-operational by using multiple channels with automatic voters to select best signal
|
|
|
1970
|
9 |
3 |
p. 219-
1 p.
|
artikel
|
| 59 |
Measurements on the depletion layer properties of planar diodes
|
|
|
1970
|
9 |
3 |
p. 225-226
2 p.
|
artikel
|
| 60 |
Merging technologies—Microelectronics and microwaves
|
|
|
1970
|
9 |
3 |
p. 220-
1 p.
|
artikel
|
| 61 |
Microcircuit testing—matching the value with the cost—Part 2
|
|
|
1970
|
9 |
3 |
p. 217-
1 p.
|
artikel
|
| 62 |
Microelectronic realization and circuit properties of a circulator
|
Bozic, S.M.
|
|
1970
|
9 |
3 |
p. 283-286
4 p.
|
artikel
|
| 63 |
Microelectronique et technique du vide
|
Bobenrieth, A.
|
|
1970
|
9 |
3 |
p. 193-195
3 p.
|
artikel
|
| 64 |
Micropower—An answer to the power-speed trade-off in digital systems
|
|
|
1970
|
9 |
3 |
p. 223-
1 p.
|
artikel
|
| 65 |
Mil Std 883—A real test case
|
|
|
1970
|
9 |
3 |
p. 216-
1 p.
|
artikel
|
| 66 |
MOS-FET fabrication problems
|
|
|
1970
|
9 |
3 |
p. 222-
1 p.
|
artikel
|
| 67 |
MOS memories save power
|
|
|
1970
|
9 |
3 |
p. 225-
1 p.
|
artikel
|
| 68 |
No West German “creativity gap” where linear IC's are concerned
|
|
|
1970
|
9 |
3 |
p. 220-
1 p.
|
artikel
|
| 69 |
On the reliability of logical circuits and systems
|
|
|
1970
|
9 |
3 |
p. 219-
1 p.
|
artikel
|
| 70 |
Optical projection system design for photoresist exposure
|
|
|
1970
|
9 |
3 |
p. 220-221
2 p.
|
artikel
|
| 71 |
Organic thin-film capacitor
|
|
|
1970
|
9 |
3 |
p. 225-
1 p.
|
artikel
|
| 72 |
Packaging and assembly of integrated circuits
|
|
|
1970
|
9 |
3 |
p. 223-
1 p.
|
artikel
|
| 73 |
Papers to be published in future issues
|
|
|
1970
|
9 |
3 |
p. 233-
1 p.
|
artikel
|
| 74 |
Parametric study of temperature profiles in chips joined by controlled collapse techniques
|
|
|
1970
|
9 |
3 |
p. 221-
1 p.
|
artikel
|
| 75 |
Photoelectrochemical and electrochemical properties of germanium and silicon—Part 1
|
|
|
1970
|
9 |
3 |
p. 228-
1 p.
|
artikel
|
| 76 |
Photo-optical aspects of mask technology
|
|
|
1970
|
9 |
3 |
p. 222-
1 p.
|
artikel
|
| 77 |
Photoresist materials and applications
|
|
|
1970
|
9 |
3 |
p. 221-
1 p.
|
artikel
|
| 78 |
Plastic IC'S demand new physical
|
|
|
1970
|
9 |
3 |
p. 216-
1 p.
|
artikel
|
| 79 |
Prediction by sampling
|
|
|
1970
|
9 |
3 |
p. 216-
1 p.
|
artikel
|
| 80 |
Problems of measuring the reliability of semiconductor components
|
|
|
1970
|
9 |
3 |
p. 218-
1 p.
|
artikel
|
| 81 |
Progress in making thin and thick-film circuits
|
|
|
1970
|
9 |
3 |
p. 230-
1 p.
|
artikel
|
| 82 |
Quality and reliability of electronic components
|
|
|
1970
|
9 |
3 |
p. 217-
1 p.
|
artikel
|
| 83 |
Recent United Kingdom patents in microelectronics
|
|
|
1970
|
9 |
3 |
p. 211-214
4 p.
|
artikel
|
| 84 |
Reliability of a quasi-redundant electronic system subject to two kinds of failures
|
Kumar, S.
|
|
1970
|
9 |
3 |
p. 287-293
7 p.
|
artikel
|
| 85 |
Reliability of plated-wire memories
|
|
|
1970
|
9 |
3 |
p. 216-
1 p.
|
artikel
|
| 86 |
RF sputtering of multilayer thin films
|
|
|
1970
|
9 |
3 |
p. 229-
1 p.
|
artikel
|
| 87 |
Satellite reliability
|
Downey, M.J.
|
|
1970
|
9 |
3 |
p. 271-282
12 p.
|
artikel
|
| 88 |
Semiconductor whodunit: Who's to blame for failures?
|
|
|
1970
|
9 |
3 |
p. 219-
1 p.
|
artikel
|
| 89 |
Setting up a value programme
|
|
|
1970
|
9 |
3 |
p. 215-216
2 p.
|
artikel
|
| 90 |
Simple multi-level logic circuit design
|
|
|
1970
|
9 |
3 |
p. 222-
1 p.
|
artikel
|
| 91 |
Simulated failure analysis of integrated circuits
|
|
|
1970
|
9 |
3 |
p. 217-
1 p.
|
artikel
|
| 92 |
SLT device metallurgy and its monolithic extension
|
|
|
1970
|
9 |
3 |
p. 221-
1 p.
|
artikel
|
| 93 |
Solid-state imaging is easy with MSI
|
|
|
1970
|
9 |
3 |
p. 224-
1 p.
|
artikel
|
| 94 |
Some thoughts on the relationship between reliability, maintainability and quality control
|
Wenger, F.E.
|
|
1970
|
9 |
3 |
p. 197-198
2 p.
|
artikel
|
| 95 |
Sorting IC's economically
|
|
|
1970
|
9 |
3 |
p. 218-
1 p.
|
artikel
|
| 96 |
Stability of thick film resistors
|
|
|
1970
|
9 |
3 |
p. 230-
1 p.
|
artikel
|
| 97 |
State-variable analysis of integrated CML and ACML circuits
|
|
|
1970
|
9 |
3 |
p. 223-
1 p.
|
artikel
|
| 98 |
Studies of the SLT chip terminal metallurgy
|
|
|
1970
|
9 |
3 |
p. 216-217
2 p.
|
artikel
|
| 99 |
Substrate bombardment during RF sputtering
|
|
|
1970
|
9 |
3 |
p. 230-
1 p.
|
artikel
|
| 100 |
Synthesis of fail-safe logical systems
|
|
|
1970
|
9 |
3 |
p. 219-
1 p.
|
artikel
|
| 101 |
Taming a technology
|
|
|
1970
|
9 |
3 |
p. 219-220
2 p.
|
artikel
|
| 102 |
Testing and reliability of semiconductor devices
|
|
|
1970
|
9 |
3 |
p. 216-
1 p.
|
artikel
|
| 103 |
The cooling of microelectronic systems
|
|
|
1970
|
9 |
3 |
p. 223-
1 p.
|
artikel
|
| 104 |
The evaporation of metals and elemental semiconductors using a work-accelerated electron beam source
|
|
|
1970
|
9 |
3 |
p. 232-
1 p.
|
artikel
|
| 105 |
The influence of substrate surface conditions on the nucleation and growth of epitaxial silicon films
|
|
|
1970
|
9 |
3 |
p. 228-
1 p.
|
artikel
|
| 106 |
Theory and application of a linear four-quadrant monolithic multiplier
|
|
|
1970
|
9 |
3 |
p. 224-
1 p.
|
artikel
|
| 107 |
Thermal analysis of microcircuits
|
|
|
1970
|
9 |
3 |
p. 218-
1 p.
|
artikel
|
| 108 |
Thick-film screen printing
|
|
|
1970
|
9 |
3 |
p. 231-
1 p.
|
artikel
|
| 109 |
Thick films in automotive equipment
|
|
|
1970
|
9 |
3 |
p. 231-
1 p.
|
artikel
|
| 110 |
Thin film capacitors
|
|
|
1970
|
9 |
3 |
p. 224-
1 p.
|
artikel
|
| 111 |
Transistor abnormalities as revealed by current-voltage characteristics
|
|
|
1970
|
9 |
3 |
p. 218-
1 p.
|
artikel
|
| 112 |
Twyman-Green interferometry for measurement of stresses in thin film on optically flat silicon substrates
|
|
|
1970
|
9 |
3 |
p. 228-229
2 p.
|
artikel
|
| 113 |
Uber die Rolle von Versetzungen bei der Diffusion von Kupfer in thermisch konvertiertem Galliumarsenid
|
|
|
1970
|
9 |
3 |
p. 226-227
2 p.
|
artikel
|
| 114 |
User guidelines for removal of microcircuits from equipment
|
Robertson, F.A.
|
|
1970
|
9 |
3 |
p. 198-
1 p.
|
artikel
|
| 115 |
Vacuum applications of the quartz crystal microbalance
|
|
|
1970
|
9 |
3 |
p. 231-
1 p.
|
artikel
|
| 116 |
Want to be a good loser? Go about it systematically
|
|
|
1970
|
9 |
3 |
p. 215-
1 p.
|
artikel
|
| 117 |
XYMASK
|
|
|
1970
|
9 |
3 |
p. 222-
1 p.
|
artikel
|
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