nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Active thin-film devices, Part 1
|
|
|
1967 |
6 |
3 |
p. 257-258 2 p. |
artikel |
2 |
Active thin-film devices, Part 2
|
|
|
1967 |
6 |
3 |
p. 258- 1 p. |
artikel |
3 |
A downstream look at IC testing
|
|
|
1967 |
6 |
3 |
p. 246- 1 p. |
artikel |
4 |
Advantages and limitations of AOQL and AQL sampling schemes
|
|
|
1967 |
6 |
3 |
p. 241- 1 p. |
artikel |
5 |
Aging mechanisms in thin resistor films
|
|
|
1967 |
6 |
3 |
p. 253-254 2 p. |
artikel |
6 |
An analysis of deep depletion thin-film MOS transistors
|
|
|
1967 |
6 |
3 |
p. 252- 1 p. |
artikel |
7 |
An approach to analysis reliability of switching circuits reliability
|
|
|
1967 |
6 |
3 |
p. 244- 1 p. |
artikel |
8 |
An investigation into marine radar reliability
|
|
|
1967 |
6 |
3 |
p. 244- 1 p. |
artikel |
9 |
Anisotropy of critical field in low-temperature electrical breakdown in n-type silicon
|
|
|
1967 |
6 |
3 |
p. 248- 1 p. |
artikel |
10 |
A process for the determination of the thickness of coating layers
|
|
|
1967 |
6 |
3 |
p. 254- 1 p. |
artikel |
11 |
A simple estimation of failure rate
|
Temler, J |
|
1967 |
6 |
3 |
p. 239-240 2 p. |
artikel |
12 |
A study of factors affecting silicon growth on amorphous SiO2 surfaces
|
|
|
1967 |
6 |
3 |
p. 248- 1 p. |
artikel |
13 |
A survey of diffusion processes for fabricating integrated circuits
|
|
|
1967 |
6 |
3 |
p. 248-249 2 p. |
artikel |
14 |
A survey of second breakdown
|
|
|
1967 |
6 |
3 |
p. 242- 1 p. |
artikel |
15 |
Automatic control and monitoring system for thin-film deposition
|
|
|
1967 |
6 |
3 |
p. 257- 1 p. |
artikel |
16 |
Avalanche breakdown calculations for a planar p-n junction
|
|
|
1967 |
6 |
3 |
p. 243- 1 p. |
artikel |
17 |
Avalanche breakdown of diffused silicon p-n junctions
|
|
|
1967 |
6 |
3 |
p. 253- 1 p. |
artikel |
18 |
A viscosity gauge for pressure measurement in the range 10−6 to 10−4 torr
|
|
|
1967 |
6 |
3 |
p. 256- 1 p. |
artikel |
19 |
Barrier energies in metal-silicon dioxide-silicon structures
|
|
|
1967 |
6 |
3 |
p. 250- 1 p. |
artikel |
20 |
Birefringent tape—a new, easier technique for separating thin film and printed circuit master drawings with perfect registration
|
|
|
1967 |
6 |
3 |
p. 257- 1 p. |
artikel |
21 |
Boat heat-up in diffusion furnaces
|
|
|
1967 |
6 |
3 |
p. 250- 1 p. |
artikel |
22 |
Breakdown voitage of planar silicon junctions
|
|
|
1967 |
6 |
3 |
p. 246- 1 p. |
artikel |
23 |
Calculating the speed of pumping systems
|
|
|
1967 |
6 |
3 |
p. 256-257 2 p. |
artikel |
24 |
Calculations of cutoff frequency, breakdown voltage and capacitance for diffused junctions in thin epitaxial silicon layers
|
|
|
1967 |
6 |
3 |
p. 252-253 2 p. |
artikel |
25 |
Control of diffusion induced dislocations in phosphorus diffused silicon
|
|
|
1967 |
6 |
3 |
p. 247- 1 p. |
artikel |
26 |
Critical excitation function of distributed-parameter devices
|
|
|
1967 |
6 |
3 |
p. 257- 1 p. |
artikel |
27 |
Current transport in metal-semiconductor barriers
|
|
|
1967 |
6 |
3 |
p. 249- 1 p. |
artikel |
28 |
Design of monolithic circuit chips
|
|
|
1967 |
6 |
3 |
p. 251- 1 p. |
artikel |
29 |
Dielectric properties of some thin organic polymer films
|
|
|
1967 |
6 |
3 |
p. 253- 1 p. |
artikel |
30 |
Dielectric thin films through RF sputtering
|
|
|
1967 |
6 |
3 |
p. 254- 1 p. |
artikel |
31 |
Directional growth of single-crystal silicon films across silicon carbide by a moving deposition-zone technique
|
|
|
1967 |
6 |
3 |
p. 247- 1 p. |
artikel |
32 |
“Dirt” in relays—its cause, effect and control
|
|
|
1967 |
6 |
3 |
p. 241- 1 p. |
artikel |
33 |
Dislocation-induced deviation of phosphorus-diffusion profiles in silicon
|
|
|
1967 |
6 |
3 |
p. 250- 1 p. |
artikel |
34 |
Education for the microelectronics era
|
|
|
1967 |
6 |
3 |
p. 245- 1 p. |
artikel |
35 |
Effect of electron energy on defect introduction in silicon
|
|
|
1967 |
6 |
3 |
p. 247- 1 p. |
artikel |
36 |
Effects of fabrication parameters on structural and electronic properties of thin CdS and CdSe films
|
|
|
1967 |
6 |
3 |
p. 254- 1 p. |
artikel |
37 |
Electronic telephone exchanges: component selection and mode of operation
|
|
|
1967 |
6 |
3 |
p. 241-242 2 p. |
artikel |
38 |
Experimental demonstration and theory of a corrective to second breakdown in Si power transistors
|
|
|
1967 |
6 |
3 |
p. 242-243 2 p. |
artikel |
39 |
Factors affecting transistor failure
|
|
|
1967 |
6 |
3 |
p. 243- 1 p. |
artikel |
40 |
Gallium arsemide planar technology
|
|
|
1967 |
6 |
3 |
p. 250- 1 p. |
artikel |
41 |
High mobility thin films of indium antimonide vacuum deposited on to a cold substrate
|
|
|
1967 |
6 |
3 |
p. 255- 1 p. |
artikel |
42 |
High-speed saw for dicing silicon wafers
|
|
|
1967 |
6 |
3 |
p. 252- 1 p. |
artikel |
43 |
Ideal MOS curves for silicon
|
|
|
1967 |
6 |
3 |
p. 248- 1 p. |
artikel |
44 |
Induction heating and solid state technology
|
|
|
1967 |
6 |
3 |
p. 249- 1 p. |
artikel |
45 |
Influence of damaged surface layer on resistivity and mobility of thin semiconductor sheets
|
|
|
1967 |
6 |
3 |
p. 247- 1 p. |
artikel |
46 |
Input power induced thermal effects related to transition time between avalanche and second breakdown in p-n silicon junctions
|
|
|
1967 |
6 |
3 |
p. 243- 1 p. |
artikel |
47 |
Integrated circuit mask fabrication
|
|
|
1967 |
6 |
3 |
p. 250- 1 p. |
artikel |
48 |
Integrated circuits 1966
|
|
|
1967 |
6 |
3 |
p. 246- 1 p. |
artikel |
49 |
Integrated circuits in action: Part 3. Getting your money's worth
|
|
|
1967 |
6 |
3 |
p. 245- 1 p. |
artikel |
50 |
Integrated circuits in action: Part 5. In search of the ideal logic scheme
|
|
|
1967 |
6 |
3 |
p. 245- 1 p. |
artikel |
51 |
Integrated circuits in action: Part 4. Postmortems prevent future failures
|
|
|
1967 |
6 |
3 |
p. 245- 1 p. |
artikel |
52 |
Integrated circuits in action: Part 1. The great design dilemma
|
|
|
1967 |
6 |
3 |
p. 244- 1 p. |
artikel |
53 |
Integrated circuits in action: Part 2. Trends and trade offs
|
|
|
1967 |
6 |
3 |
p. 245- 1 p. |
artikel |
54 |
Integrated thin-film circuits incorporating active and passive elements
|
|
|
1967 |
6 |
3 |
p. 253- 1 p. |
artikel |
55 |
Interconnection of monolithic integrated circuits through the use of advanced materials and techniques
|
|
|
1967 |
6 |
3 |
p. 245- 1 p. |
artikel |
56 |
Irradiation and annealing of silicon planar transistors
|
|
|
1967 |
6 |
3 |
p. 246-247 2 p. |
artikel |
57 |
Large scale integration
|
|
|
1967 |
6 |
3 |
p. 245-246 2 p. |
artikel |
58 |
Metal-semiconductor surface barriers
|
|
|
1967 |
6 |
3 |
p. 249- 1 p. |
artikel |
59 |
Microelectronics—a review
|
|
|
1967 |
6 |
3 |
p. 246- 1 p. |
artikel |
60 |
Microelectronics technology—a look at fabrication methods
|
|
|
1967 |
6 |
3 |
p. 245- 1 p. |
artikel |
61 |
Microinhomogeneity problems in silicon
|
|
|
1967 |
6 |
3 |
p. 251- 1 p. |
artikel |
62 |
Micropower redundant circuits correct errors automatically
|
|
|
1967 |
6 |
3 |
p. 241- 1 p. |
artikel |
63 |
Monelithics-fabrication costs analyzed
|
|
|
1967 |
6 |
3 |
p. 252- 1 p. |
artikel |
64 |
nGe-pGaAs heterojunctions
|
|
|
1967 |
6 |
3 |
p. 249- 1 p. |
artikel |
65 |
Nichromo-silicon monoxide cermet resistors for compatible thin-film monolithic circuits
|
|
|
1967 |
6 |
3 |
p. 254-255 2 p. |
artikel |
66 |
Optimizing transistor parameters in integrated circuits
|
|
|
1967 |
6 |
3 |
p. 248- 1 p. |
artikel |
67 |
Oxidation of thin evaporated rhenium films
|
|
|
1967 |
6 |
3 |
p. 255- 1 p. |
artikel |
68 |
Physical investigation of the mesoplasma in silicon
|
|
|
1967 |
6 |
3 |
p. 251- 1 p. |
artikel |
69 |
Porte logique a emetteurs couples realisee en circuit integre
|
Lacour, J. |
|
1967 |
6 |
3 |
p. 223-224 2 p. |
artikel |
70 |
Prediction of temperature and power handling capabilities of thin-film resistors and circuits
|
|
|
1967 |
6 |
3 |
p. 255-256 2 p. |
artikel |
71 |
Pressure fluctuations in vacuum systems
|
|
|
1967 |
6 |
3 |
p. 257- 1 p. |
artikel |
72 |
Properties and life performance of silicon monoxide capacitors
|
|
|
1967 |
6 |
3 |
p. 242- 1 p. |
artikel |
73 |
Properties of the silicon dioxide-silicon system
|
|
|
1967 |
6 |
3 |
p. 251- 1 p. |
artikel |
74 |
Radar reliability on trawlers
|
|
|
1967 |
6 |
3 |
p. 244- 1 p. |
artikel |
75 |
Reactively sputtered titanium resistors, capacitors and rectifiers for microcircuits
|
Wasa, Kiyotaka |
|
1967 |
6 |
3 |
p. 213-214 2 p. |
artikel |
76 |
Residual gas analysis in a vacuum evaporator
|
|
|
1967 |
6 |
3 |
p. 256- 1 p. |
artikel |
77 |
Second breakdown in simplified transistor structures and diodes
|
|
|
1967 |
6 |
3 |
p. 243- 1 p. |
artikel |
78 |
Service problems with electronic measuring instruments
|
|
|
1967 |
6 |
3 |
p. 244- 1 p. |
artikel |
79 |
Simultaneous three-element condensation
|
|
|
1967 |
6 |
3 |
p. 255- 1 p. |
artikel |
80 |
Some practical considerations in the fabrication of printed glaze resistors and circuits
|
|
|
1967 |
6 |
3 |
p. 256- 1 p. |
artikel |
81 |
Support materials for semiconductor devices
|
|
|
1967 |
6 |
3 |
p. 250- 1 p. |
artikel |
82 |
Surface states at steam-grown silicon-silicon dioxide interfaces
|
|
|
1967 |
6 |
3 |
p. 250-251 2 p. |
artikel |
83 |
Test methods in the manufacture of silicon microcircuits
|
Davidson, I.A. |
|
1967 |
6 |
3 |
p. 209-210 2 p. |
artikel |
84 |
The art of semiconductor doping by ion implantation
|
|
|
1967 |
6 |
3 |
p. 248- 1 p. |
artikel |
85 |
The effect of nonparabolic energy bands on tunneling through thin insulating films
|
|
|
1967 |
6 |
3 |
p. 248- 1 p. |
artikel |
86 |
The preparation and properties of sputtered Al thin films
|
|
|
1967 |
6 |
3 |
p. 254- 1 p. |
artikel |
87 |
The reliability of electronic equipment
|
|
|
1967 |
6 |
3 |
p. 244- 1 p. |
artikel |
88 |
The role of adsorption in heterogeneous vapor-solid nucleation
|
|
|
1967 |
6 |
3 |
p. 249-250 2 p. |
artikel |
89 |
The spatial variation of the quasi-fermi potentials in p-n junctions
|
|
|
1967 |
6 |
3 |
p. 252- 1 p. |
artikel |
90 |
The vapour phase deposition of metals and their compounds: Applications in electronics
|
Buck, R.H. |
|
1967 |
6 |
3 |
p. 231-237 7 p. |
artikel |
91 |
Thick film hybrid microelectronic circuit technology
|
|
|
1967 |
6 |
3 |
p. 256- 1 p. |
artikel |
92 |
Thin-film transistors
|
|
|
1967 |
6 |
3 |
p. 255- 1 p. |
artikel |
93 |
Training for fault diagnosis
|
|
|
1967 |
6 |
3 |
p. 244- 1 p. |
artikel |
94 |
Transistor failure by secondary breakdown
|
|
|
1967 |
6 |
3 |
p. 242- 1 p. |
artikel |