| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A 2-D analytical threshold-voltage model for GeOI/GeON MOSFET with high-k gate dielectric
|
Ji, Feng
|
|
2016
|
57 |
C |
p. 24-33
10 p.
|
artikel
|
| 2 |
An efficient temperature dependent hot carrier injection reliability simulation flow
|
Kamal, Mehdi
|
|
2016
|
57 |
C |
p. 10-19
10 p.
|
artikel
|
| 3 |
An embedded trace FCCSP substrate without glass cloth
|
Chao, Shin-Hua
|
|
2016
|
57 |
C |
p. 101-110
10 p.
|
artikel
|
| 4 |
Degradation behavior and mechanism of polymer films for high-ohmic resistor protection in a heat and humid environment
|
Wang, X.Y.
|
|
2016
|
57 |
C |
p. 79-85
7 p.
|
artikel
|
| 5 |
Design, evaluation and fault-tolerance analysis of stochastic FIR filters
|
Wang, Ran
|
|
2016
|
57 |
C |
p. 111-127
17 p.
|
artikel
|
| 6 |
Editorial Board
|
|
|
2016
|
57 |
C |
p. IFC-
1 p.
|
artikel
|
| 7 |
ESD protection for negative charge pump (CP) using CP internal switches
|
Srivastava, Ankit
|
|
2016
|
57 |
C |
p. 59-63
5 p.
|
artikel
|
| 8 |
Experimental study of multilayer SiCN barrier film in 45/40nm technological node and beyond
|
Ming, Zhou
|
|
2016
|
57 |
C |
p. 86-92
7 p.
|
artikel
|
| 9 |
Experiments and root cause analysis for active-precharge hammering fault in DDR3 SDRAM under 3× nm technology
|
Park, Kyungbae
|
|
2016
|
57 |
C |
p. 39-46
8 p.
|
artikel
|
| 10 |
Hardening silicon-on-insulator nMOSFETs by multiple-step Si+ implantation
|
Huang, Huixiang
|
|
2016
|
57 |
C |
p. 1-9
9 p.
|
artikel
|
| 11 |
Impact of on- and off-chip protection on the transient-induced latch-up sensitivity of CMOS IC
|
Scholz, Mirko
|
|
2016
|
57 |
C |
p. 53-58
6 p.
|
artikel
|
| 12 |
Improved inductive-system-level IEC ESD performance for automotive applications using mutual ballasted ESD protection technique
|
Salman, Akram A.
|
|
2016
|
57 |
C |
p. 47-52
6 p.
|
artikel
|
| 13 |
Improved performance of ITO/TiO2/HfO2/Pt random resistive accessory memory by nitrogen annealing treatment
|
Deng, Tengfei
|
|
2016
|
57 |
C |
p. 34-38
5 p.
|
artikel
|
| 14 |
Lifetime estimation of LED lamp using gamma process model
|
Park, Sung Ho
|
|
2016
|
57 |
C |
p. 71-78
8 p.
|
artikel
|
| 15 |
Study of gate leakage mechanism in advanced charge-coupled MOSFET (CC-MOSFET) technology
|
Barletta, G.
|
|
2016
|
57 |
C |
p. 20-23
4 p.
|
artikel
|
| 16 |
Temperature dependent Young's modulus and quality factor of CMOS-MEMS resonator: Modelling and experimental approach
|
Jan, Mohammad Tariq
|
|
2016
|
57 |
C |
p. 64-70
7 p.
|
artikel
|
| 17 |
Thermo-mechanical reliability of a multi-walled carbon nanotube-incorporated solderable isotropic conductive adhesive
|
Yim, Byung-Seung
|
|
2016
|
57 |
C |
p. 93-100
8 p.
|
artikel
|
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