| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A Built-In Self-Test (BIST) system with non-intrusive TPG and ORA for FPGA test and diagnosis
|
Ruan, Aiwu
|
|
2013
|
53 |
3 |
p. 488-498
11 p.
|
artikel
|
| 2 |
Accurate modeling of the influence of back gate bias and interface roughness on the threshold voltage of nanoscale DG MOSFETs
|
Biswas, Abhijit
|
|
2013
|
53 |
3 |
p. 363-370
8 p.
|
artikel
|
| 3 |
Adaptive error correction in Orthogonal Latin Square Codes for low-power, resilient on-chip interconnection network
|
Lee, Seung Eun
|
|
2013
|
53 |
3 |
p. 509-511
3 p.
|
artikel
|
| 4 |
Analysis and validation of neural network approach for extraction of small-signal model parameters of microwave transistors
|
Marinković, Zlatica
|
|
2013
|
53 |
3 |
p. 414-419
6 p.
|
artikel
|
| 5 |
Application of nanoindentation technique for investigation of elasto-plastic properties of the selected thin film materials
|
Wymysłowski, Artur
|
|
2013
|
53 |
3 |
p. 443-451
9 p.
|
artikel
|
| 6 |
Characteristics of random telegraph signal noise in time delay integration CMOS image sensor
|
Han, Liqiang
|
|
2013
|
53 |
3 |
p. 400-404
5 p.
|
artikel
|
| 7 |
Device simulation studies on latch-up effects in CMOS inverters induced by microwave pulse
|
Chen, Jie
|
|
2013
|
53 |
3 |
p. 371-378
8 p.
|
artikel
|
| 8 |
Drain currents and their excess noise in triple gate bulk p-channel FinFETs of different geometry
|
Lukyanchikova, N.
|
|
2013
|
53 |
3 |
p. 394-399
6 p.
|
artikel
|
| 9 |
Engineering buried oxide in dopant-segregated Schottky barrier SOI MOSFET for nanoscale CMOS circuits
|
Patil, Ganesh C.
|
|
2013
|
53 |
3 |
p. 349-355
7 p.
|
artikel
|
| 10 |
Estimation of reliability of mobile handsets using Cox-proportional hazard model
|
Tiwari, Anupama
|
|
2013
|
53 |
3 |
p. 481-487
7 p.
|
artikel
|
| 11 |
FEM simulation approach to investigate electro-thermal behavior of power transistors in 3-D
|
Košel, V.
|
|
2013
|
53 |
3 |
p. 356-362
7 p.
|
artikel
|
| 12 |
Improving the dielectric breakdown field of silicon light-emitting-diode sub-mount by a hybrid nanosecond laser drilling strategy
|
Tang, Chao-Wei
|
|
2013
|
53 |
3 |
p. 420-427
8 p.
|
artikel
|
| 13 |
Inside front cover - Editorial board
|
|
|
2013
|
53 |
3 |
p. IFC-
1 p.
|
artikel
|
| 14 |
Low frequency noise in field-plate multigate AlGaN/GaN single-pole–single-throw RF switches on silicon substrate
|
Chiu, Hsien-Chin
|
|
2013
|
53 |
3 |
p. 405-408
4 p.
|
artikel
|
| 15 |
Mechanical assessment of an anisotropic conductive adhesive joint of a direct access sensor on a flexible substrate for a swallowable capsule application
|
Jesudoss, P.
|
|
2013
|
53 |
3 |
p. 452-462
11 p.
|
artikel
|
| 16 |
On the configuration- and frequency-dependent linearity characteristics of SiGe HBTs under different impedance matching conditions
|
Qin, Guoxuan
|
|
2013
|
53 |
3 |
p. 409-413
5 p.
|
artikel
|
| 17 |
Optimum design domain of LED-based solid state lighting considering cost, energy consumption and reliability
|
Song, Bong-Min
|
|
2013
|
53 |
3 |
p. 435-442
8 p.
|
artikel
|
| 18 |
Reliability of sintered Ag80–Al20 die attach nanopaste for high temperature applications on SiC power devices
|
Manikam, Vemal Raja
|
|
2013
|
53 |
3 |
p. 473-480
8 p.
|
artikel
|
| 19 |
Reliability of TCT and HH/HT test performed in chips and flex substrates assembled by thermosonic flip-chip bonding process
|
Aoh, Jong-Ning
|
|
2013
|
53 |
3 |
p. 463-472
10 p.
|
artikel
|
| 20 |
Remote carrier trapping in FinFETs with ONO buried layer: Temperature effects
|
Chang, Sung-Jae
|
|
2013
|
53 |
3 |
p. 386-393
8 p.
|
artikel
|
| 21 |
Subthreshold performance of gate engineered FinFET devices and circuit with high-k dielectrics
|
Nirmal, D.
|
|
2013
|
53 |
3 |
p. 499-504
6 p.
|
artikel
|
| 22 |
The impact of process-induced mechanical stress on CMOS buffer design using multi-fingered devices
|
Alam, Naushad
|
|
2013
|
53 |
3 |
p. 379-385
7 p.
|
artikel
|
| 23 |
Thermal analysis of LED spot lighting device operating in external natural or forced heat convection
|
Maaspuro, Mika
|
|
2013
|
53 |
3 |
p. 428-434
7 p.
|
artikel
|
| 24 |
Unit capacitor array based SAR ADC
|
Pun, Kong-Pang
|
|
2013
|
53 |
3 |
p. 505-508
4 p.
|
artikel
|
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