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                             23 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 An aqueous developable photoimageable silver conductor composition for high density electronic packaging Umarji, G.G.
2005
45 12 p. 1903-1909
7 p.
artikel
2 A statistical approach to characterizing the reliability of systems utilizing HBT devices Chen, Yuan
2005
45 12 p. 1869-1874
6 p.
artikel
3 Author index for Volume 45 - autogenerate 2005
45 12 p. 1969-1976
8 p.
artikel
4 Conductive adhesives for through holes and blind vias metallization Kisiel, Ryszard
2005
45 12 p. 1935-1940
6 p.
artikel
5 Contents of Volume 45 - autogenerate 2005
45 12 p. 1953-1968
16 p.
artikel
6 Degradation mechanisms of GaAs PHEMTs in high humidity conditions Hisaka, Takayuki
2005
45 12 p. 1894-1900
7 p.
artikel
7 Design and fabrication of neurostimulator implants—selected problems Zaraska, W.
2005
45 12 p. 1930-1934
5 p.
artikel
8 Determining constant voltage lifetimes for silicon nitride capacitors in a GaAs IC process by a step stress method Whitman, Charles
2005
45 12 p. 1882-1893
12 p.
artikel
9 Editorial Ersland, Peter
2005
45 12 p. 1868-
1 p.
artikel
10 Evaluation of compatibility of thick-film PTC thermistors and LTCC structures Belavič, Darko
2005
45 12 p. 1924-1929
6 p.
artikel
11 IMAPS Poland 2004—Guest Editorial Dziedzic, Andrzej
2005
45 12 p. 1901-1902
2 p.
artikel
12 Influence of halogen-free compound and lead-free solder paste on on-board reliability of green CSP (chip scale package) Chung, Cho-Liang
2005
45 12 p. 1916-1923
8 p.
artikel
13 Is the power-law model applicable beyond the direct tunneling regime? Duschl, Rainer
2005
45 12 p. 1861-1867
7 p.
artikel
14 Metal defect yield and reliability relationships Roesch, William J.
2005
45 12 p. 1875-1881
7 p.
artikel
15 Multi-vibrational hydrogen release: Physical origin of T bd,Q bd power-law voltage dependence of oxide breakdown in ultra-thin gate oxides Ribes, G.
2005
45 12 p. 1842-1854
13 p.
artikel
16 New trim configurations for laser trimmed thick-film resistors—theoretical analysis, numerical simulation and experimental verification Wroński, Marek
2005
45 12 p. 1941-1948
8 p.
artikel
17 [No title] Stojcev, Mile
2005
45 12 p. 1951-1952
2 p.
artikel
18 [No title] Stojcev, Mile
2005
45 12 p. 1949-1950
2 p.
artikel
19 Photoacoustic inspection of thermal properties of layered structure with pulse excitations Suszynski, Zbigniew
2005
45 12 p. 1910-1915
6 p.
artikel
20 Physical model for the power-law voltage and current acceleration of TDDB Haggag, A.
2005
45 12 p. 1855-1860
6 p.
artikel
21 Power-law voltage acceleration: A key element for ultra-thin gate oxide reliability Wu, Ernest Y.
2005
45 12 p. 1809-1834
26 p.
artikel
22 The TDDB power-law model—Physics and experimental evidences Vollertsen, Rolf-Peter
2005
45 12 p. 1807-1808
2 p.
artikel
23 Voltage acceleration of time-dependent breakdown of ultra-thin gate dielectrics Pompl, Thomas
2005
45 12 p. 1835-1841
7 p.
artikel
                             23 gevonden resultaten
 
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