nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
An aqueous developable photoimageable silver conductor composition for high density electronic packaging
|
Umarji, G.G. |
|
2005 |
45 |
12 |
p. 1903-1909 7 p. |
artikel |
2 |
A statistical approach to characterizing the reliability of systems utilizing HBT devices
|
Chen, Yuan |
|
2005 |
45 |
12 |
p. 1869-1874 6 p. |
artikel |
3 |
Author index for Volume 45 - autogenerate
|
|
|
2005 |
45 |
12 |
p. 1969-1976 8 p. |
artikel |
4 |
Conductive adhesives for through holes and blind vias metallization
|
Kisiel, Ryszard |
|
2005 |
45 |
12 |
p. 1935-1940 6 p. |
artikel |
5 |
Contents of Volume 45 - autogenerate
|
|
|
2005 |
45 |
12 |
p. 1953-1968 16 p. |
artikel |
6 |
Degradation mechanisms of GaAs PHEMTs in high humidity conditions
|
Hisaka, Takayuki |
|
2005 |
45 |
12 |
p. 1894-1900 7 p. |
artikel |
7 |
Design and fabrication of neurostimulator implants—selected problems
|
Zaraska, W. |
|
2005 |
45 |
12 |
p. 1930-1934 5 p. |
artikel |
8 |
Determining constant voltage lifetimes for silicon nitride capacitors in a GaAs IC process by a step stress method
|
Whitman, Charles |
|
2005 |
45 |
12 |
p. 1882-1893 12 p. |
artikel |
9 |
Editorial
|
Ersland, Peter |
|
2005 |
45 |
12 |
p. 1868- 1 p. |
artikel |
10 |
Evaluation of compatibility of thick-film PTC thermistors and LTCC structures
|
Belavič, Darko |
|
2005 |
45 |
12 |
p. 1924-1929 6 p. |
artikel |
11 |
IMAPS Poland 2004—Guest Editorial
|
Dziedzic, Andrzej |
|
2005 |
45 |
12 |
p. 1901-1902 2 p. |
artikel |
12 |
Influence of halogen-free compound and lead-free solder paste on on-board reliability of green CSP (chip scale package)
|
Chung, Cho-Liang |
|
2005 |
45 |
12 |
p. 1916-1923 8 p. |
artikel |
13 |
Is the power-law model applicable beyond the direct tunneling regime?
|
Duschl, Rainer |
|
2005 |
45 |
12 |
p. 1861-1867 7 p. |
artikel |
14 |
Metal defect yield and reliability relationships
|
Roesch, William J. |
|
2005 |
45 |
12 |
p. 1875-1881 7 p. |
artikel |
15 |
Multi-vibrational hydrogen release: Physical origin of T bd,Q bd power-law voltage dependence of oxide breakdown in ultra-thin gate oxides
|
Ribes, G. |
|
2005 |
45 |
12 |
p. 1842-1854 13 p. |
artikel |
16 |
New trim configurations for laser trimmed thick-film resistors—theoretical analysis, numerical simulation and experimental verification
|
Wroński, Marek |
|
2005 |
45 |
12 |
p. 1941-1948 8 p. |
artikel |
17 |
[No title]
|
Stojcev, Mile |
|
2005 |
45 |
12 |
p. 1951-1952 2 p. |
artikel |
18 |
[No title]
|
Stojcev, Mile |
|
2005 |
45 |
12 |
p. 1949-1950 2 p. |
artikel |
19 |
Photoacoustic inspection of thermal properties of layered structure with pulse excitations
|
Suszynski, Zbigniew |
|
2005 |
45 |
12 |
p. 1910-1915 6 p. |
artikel |
20 |
Physical model for the power-law voltage and current acceleration of TDDB
|
Haggag, A. |
|
2005 |
45 |
12 |
p. 1855-1860 6 p. |
artikel |
21 |
Power-law voltage acceleration: A key element for ultra-thin gate oxide reliability
|
Wu, Ernest Y. |
|
2005 |
45 |
12 |
p. 1809-1834 26 p. |
artikel |
22 |
The TDDB power-law model—Physics and experimental evidences
|
Vollertsen, Rolf-Peter |
|
2005 |
45 |
12 |
p. 1807-1808 2 p. |
artikel |
23 |
Voltage acceleration of time-dependent breakdown of ultra-thin gate dielectrics
|
Pompl, Thomas |
|
2005 |
45 |
12 |
p. 1835-1841 7 p. |
artikel |