| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Analysis of the reservoir effect on electromigration reliability
|
Jeon, Insu
|
|
2004
|
44 |
6 |
p. 917-928
12 p.
|
artikel
|
| 2 |
Boundary element analysis of thermal fatigue effects on high power IGBT modules
|
Khatir, Z.
|
|
2004
|
44 |
6 |
p. 929-938
10 p.
|
artikel
|
| 3 |
Deformation measurement of RF MEMS switches by optical interference
|
Ying, Yu
|
|
2004
|
44 |
6 |
p. 951-955
5 p.
|
artikel
|
| 4 |
Dynamic modeling for resin self-alignment mechanism
|
Kim, J.M.
|
|
2004
|
44 |
6 |
p. 983-992
10 p.
|
artikel
|
| 5 |
Effects of annealing on the electric noise in semiconductor lasers
|
Shi, Yingxue
|
|
2004
|
44 |
6 |
p. 957-961
5 p.
|
artikel
|
| 6 |
FPGA-based Monte Carlo simulation for fault tree analysis
|
Ejlali, Alireza
|
|
2004
|
44 |
6 |
p. 1017-1028
12 p.
|
artikel
|
| 7 |
New observations on intermetallic compound formation in gold ball bonds: general growth patterns and identification of two forms of Au4Al
|
Breach, C.D.
|
|
2004
|
44 |
6 |
p. 973-981
9 p.
|
artikel
|
| 8 |
Operating limits for RF power amplifiers at high junction temperatures
|
Radivojevic, Z.
|
|
2004
|
44 |
6 |
p. 963-972
10 p.
|
artikel
|
| 9 |
Oversampled delta-sigma modulators: analysis applications and novel topologies; Mücahit Kozak, Izzet Kale. Kluwer Academic Publishers, Boston. 2003. Hardcover, pp. 226, plus XII, 112 euro. ISBN 1-4020-7420-4.
|
Stojcev, Mile
|
|
2004
|
44 |
6 |
p. 1029-
1 p.
|
artikel
|
| 10 |
Pull-off test in the assessment of adhesion at printed wiring board metallisation/epoxy interface
|
Turunen, Markus P.K
|
|
2004
|
44 |
6 |
p. 993-1007
15 p.
|
artikel
|
| 11 |
Reliability of 70 nm metamorphic HEMTs
|
Dammann, M.
|
|
2004
|
44 |
6 |
p. 939-943
5 p.
|
artikel
|
| 12 |
Representation of the SiGe HBT's thermal impedance by linear and recursive networks
|
Mnif, Hassène
|
|
2004
|
44 |
6 |
p. 945-950
6 p.
|
artikel
|
| 13 |
Rigorous modeling of high-speed semiconductor devices
|
Palankovski, Vassil
|
|
2004
|
44 |
6 |
p. 889-897
9 p.
|
artikel
|
| 14 |
Smart MEMS concept for high secure RF and millimeterwave communications
|
Dubuc, D.
|
|
2004
|
44 |
6 |
p. 899-907
9 p.
|
artikel
|
| 15 |
Voltage acceleration and t63.2 of 1.6–10 nm gate oxides
|
Vollertsen, R.-P.
|
|
2004
|
44 |
6 |
p. 909-916
8 p.
|
artikel
|
| 16 |
Wire-bond failure mechanisms in plastic encapsulated microcircuits and ceramic hybrids at high temperatures
|
Oldervoll, Frøydis
|
|
2004
|
44 |
6 |
p. 1009-1015
7 p.
|
artikel
|
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