| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A novel approach for fabricating light-emitting porous polysilicon films
|
Han, P.G.
|
|
2002
|
42 |
6 |
p. 929-933
5 p.
|
artikel
|
| 2 |
Calendar of forthcoming events
|
|
|
2002
|
42 |
6 |
p. I-VI
nvt p.
|
artikel
|
| 3 |
Charged device model metrology: limitations and problems
|
Henry, Leo G.
|
|
2002
|
42 |
6 |
p. 919-927
9 p.
|
artikel
|
| 4 |
Correlation considerations: Real HBM to TLP and HBM testers
|
Barth, Jon
|
|
2002
|
42 |
6 |
p. 909-917
9 p.
|
artikel
|
| 5 |
Dependability of Engineering Systems
|
Stojadinovic, Ninoslav
|
|
2002
|
42 |
6 |
p. 993-
1 p.
|
artikel
|
| 6 |
Development of substrate-pumped nMOS protection for a 0.13 μm technology
|
Salling, Craig
|
|
2002
|
42 |
6 |
p. 887-899
13 p.
|
artikel
|
| 7 |
Efficient test pattern generators based on specific cellular automata structures
|
Garbolino, T.
|
|
2002
|
42 |
6 |
p. 975-983
9 p.
|
artikel
|
| 8 |
Erratum to “The effect of image potential on electron transmission and electric current in the direct tunneling regime of ultra-thin MOS structures” [Microelectronics Reliability 2001;41:927–931]
|
Mao, Lingfeng
|
|
2002
|
42 |
6 |
p. 991-
1 p.
|
artikel
|
| 9 |
ESD protection design for CMOS RF integrated circuits using polysilicon diodes
|
Ker, Ming-Dou
|
|
2002
|
42 |
6 |
p. 863-872
10 p.
|
artikel
|
| 10 |
ESR concerns in tantalum chip capacitors exposed to non-oxygen-containing environments
|
Siplon, Jocelyn
|
|
2002
|
42 |
6 |
p. 829-834
6 p.
|
artikel
|
| 11 |
Failure modes of tantalum capacitors made by different technologies
|
Vasina, P
|
|
2002
|
42 |
6 |
p. 849-854
6 p.
|
artikel
|
| 12 |
Highly accelerated lifetesting of base-metal-electrode ceramic chip capacitors
|
Paulsen, Jonathan L.
|
|
2002
|
42 |
6 |
p. 815-820
6 p.
|
artikel
|
| 13 |
High temperature reliability testing of aluminum and tantalum electrolytic capacitors
|
Dehbi, A.
|
|
2002
|
42 |
6 |
p. 835-840
6 p.
|
artikel
|
| 14 |
Impact of circuit resistance on the breakdown voltage of tantalum chip capacitors
|
Reed, Erik K.
|
|
2002
|
42 |
6 |
p. 821-827
7 p.
|
artikel
|
| 15 |
Investigation of a constant behavior of aliasing errors in signature analysis due to the use of different ordered test-patterns in LFSR based testing techniques
|
Ahmad, Afaq
|
|
2002
|
42 |
6 |
p. 967-974
8 p.
|
artikel
|
| 16 |
Mechanical characterization of Sn–Ag-based lead-free solders
|
Amagai, Masazumi
|
|
2002
|
42 |
6 |
p. 951-966
16 p.
|
artikel
|
| 17 |
Minimizing equivalent series resistance measurement errors
|
Amorese, Gregory L.
|
|
2002
|
42 |
6 |
p. 855-860
6 p.
|
artikel
|
| 18 |
Modeling of the I–V characteristics of high-field stressed MOS structures using a Fowler–Nordheim-type tunneling expression
|
Miranda, E.
|
|
2002
|
42 |
6 |
p. 935-941
7 p.
|
artikel
|
| 19 |
Modular, portable, and easily simulated ESD protection networks for advanced CMOS technologies
|
Torres, Cynthia A.
|
|
2002
|
42 |
6 |
p. 873-885
13 p.
|
artikel
|
| 20 |
Noise and transport characterisation of tantalum capacitors
|
Pavelka, Jan
|
|
2002
|
42 |
6 |
p. 841-847
7 p.
|
artikel
|
| 21 |
On-Chip ESD
|
Mergens, Markus P.J.
|
|
2002
|
42 |
6 |
p. 861-
1 p.
|
artikel
|
| 22 |
Reliability of thin-film resistors: impact of third harmonic screenings
|
Kuehl, Reiner W
|
|
2002
|
42 |
6 |
p. 807-813
7 p.
|
artikel
|
| 23 |
Significance of the failure criterion on transmission line pulse testing
|
Keppens, B.
|
|
2002
|
42 |
6 |
p. 901-907
7 p.
|
artikel
|
| 24 |
Special Section on Reliability of Passive Components
|
Wondrak, Wolfgang
|
|
2002
|
42 |
6 |
p. 805-
1 p.
|
artikel
|
| 25 |
The effects of in-plane orthotropic properties in a multi-chip ball grid array assembly
|
Moore, Thomas D.
|
|
2002
|
42 |
6 |
p. 943-949
7 p.
|
artikel
|
| 26 |
Weibull characteristics of n-MOSFET's with ultrathin gate oxides under FN stress and lifetime prediction
|
Mu, Fuchen
|
|
2002
|
42 |
6 |
p. 985-989
5 p.
|
artikel
|
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