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Journal description
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Details for article 8 of 26 found articles
| Title: |
Erratum to “The effect of image potential on electron transmission and electric current in the direct tunneling regime of ultra-thin MOS structures” [Microelectronics Reliability 2001;41:927–931] |
| Author: |
Mao, Lingfeng Tan, Changhua Xu, Mingzhen |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 42 (2002) nr. 6 pages 1 p. |
| Year: |
2002 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 8 of 26 found articles
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