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                             20 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A new empirical extrapolation method for time-dependent dielectric breakdown reliability projections of thin SiO2 and nitride–oxide dielectrics Chen, Fen
2002
42 3 p. 335-341
7 p.
artikel
2 A novel, zone based process monitoring method for low cost MCM-D substrates manufactured on large area panels Cottet, Didier
2002
42 3 p. 417-426
10 p.
artikel
3 A review of ULSI failure analysis techniques for DRAMs 1. Defect localization and verification Benstetter, Guenther
2002
42 3 p. 307-316
10 p.
artikel
4 A thermo-mechanical study on the electrical resistance of aluminum wire conductors Liu, De-Shin
2002
42 3 p. 367-374
8 p.
artikel
5 Board level reliability of a stacked CSP subjected to cyclic bending Wu, J.D
2002
42 3 p. 407-416
10 p.
artikel
6 Bump formation for flip chip and CSP by solder paste printing Kloeser, Joachim
2002
42 3 p. 391-398
8 p.
artikel
7 Calendar of forthcoming events 2002
42 3 p. I-VIII
nvt p.
artikel
8 Development of gold to gold interconnection flip chip bonding for chip on suspension assemblies Luk, C.F
2002
42 3 p. 381-389
9 p.
artikel
9 1/f noise as a reliability indicator for subsurface Zener diodes Zhuang, Yiqi
2002
42 3 p. 355-360
6 p.
artikel
10 Impact of component placement in solder joint reliability Alander, T
2002
42 3 p. 399-406
8 p.
artikel
11 Influence of polysilicon-gate depletion on the subthreshold behavior of submicron MOSFETs Liou, Juin J.
2002
42 3 p. 343-347
5 p.
artikel
12 Investigation and modeling of stressed thermal oxides Caputo, Domenico
2002
42 3 p. 327-333
7 p.
artikel
13 MOS characteristics of NO-grown oxynitrides on n-type 6H-SiC Chakraborty, S
2002
42 3 p. 455-458
4 p.
artikel
14 Multichannel mixed-mode IC for digital readout of silicon strip detectors Gryboś, P.
2002
42 3 p. 427-436
10 p.
artikel
15 On-line testable data path synthesis for minimizing testing time Ismaeel, A.A.
2002
42 3 p. 437-453
17 p.
artikel
16 Prediction of long-term thermal behavior of an irradiated SRAM based on isochronal annealing measurements Saigné, F.
2002
42 3 p. 459-461
3 p.
artikel
17 Recent developments in silicon optoelectronic devices Wong, Hei
2002
42 3 p. 317-326
10 p.
artikel
18 Temperature-dependent noise characterization and modeling of on-wafer microwave transistors Caddemi, A.
2002
42 3 p. 361-366
6 p.
artikel
19 The abnormality in gate oxide failure induced by stress-enhanced diffusion of polycrystalline silicon Ahn, Yongseok
2002
42 3 p. 349-354
6 p.
artikel
20 The impact of copper contamination on the quality of the second wire bonding process using X-ray photoelectron spectroscopy method Lin, T.Y.
2002
42 3 p. 375-380
6 p.
artikel
                             20 gevonden resultaten
 
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