| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
A new empirical extrapolation method for time-dependent dielectric breakdown reliability projections of thin SiO2 and nitride–oxide dielectrics
|
Chen, Fen
|
|
2002
|
42 |
3 |
p. 335-341
7 p.
|
article
|
| 2 |
A novel, zone based process monitoring method for low cost MCM-D substrates manufactured on large area panels
|
Cottet, Didier
|
|
2002
|
42 |
3 |
p. 417-426
10 p.
|
article
|
| 3 |
A review of ULSI failure analysis techniques for DRAMs 1. Defect localization and verification
|
Benstetter, Guenther
|
|
2002
|
42 |
3 |
p. 307-316
10 p.
|
article
|
| 4 |
A thermo-mechanical study on the electrical resistance of aluminum wire conductors
|
Liu, De-Shin
|
|
2002
|
42 |
3 |
p. 367-374
8 p.
|
article
|
| 5 |
Board level reliability of a stacked CSP subjected to cyclic bending
|
Wu, J.D
|
|
2002
|
42 |
3 |
p. 407-416
10 p.
|
article
|
| 6 |
Bump formation for flip chip and CSP by solder paste printing
|
Kloeser, Joachim
|
|
2002
|
42 |
3 |
p. 391-398
8 p.
|
article
|
| 7 |
Calendar of forthcoming events
|
|
|
2002
|
42 |
3 |
p. I-VIII
nvt p.
|
article
|
| 8 |
Development of gold to gold interconnection flip chip bonding for chip on suspension assemblies
|
Luk, C.F
|
|
2002
|
42 |
3 |
p. 381-389
9 p.
|
article
|
| 9 |
1/f noise as a reliability indicator for subsurface Zener diodes
|
Zhuang, Yiqi
|
|
2002
|
42 |
3 |
p. 355-360
6 p.
|
article
|
| 10 |
Impact of component placement in solder joint reliability
|
Alander, T
|
|
2002
|
42 |
3 |
p. 399-406
8 p.
|
article
|
| 11 |
Influence of polysilicon-gate depletion on the subthreshold behavior of submicron MOSFETs
|
Liou, Juin J.
|
|
2002
|
42 |
3 |
p. 343-347
5 p.
|
article
|
| 12 |
Investigation and modeling of stressed thermal oxides
|
Caputo, Domenico
|
|
2002
|
42 |
3 |
p. 327-333
7 p.
|
article
|
| 13 |
MOS characteristics of NO-grown oxynitrides on n-type 6H-SiC
|
Chakraborty, S
|
|
2002
|
42 |
3 |
p. 455-458
4 p.
|
article
|
| 14 |
Multichannel mixed-mode IC for digital readout of silicon strip detectors
|
Gryboś, P.
|
|
2002
|
42 |
3 |
p. 427-436
10 p.
|
article
|
| 15 |
On-line testable data path synthesis for minimizing testing time
|
Ismaeel, A.A.
|
|
2002
|
42 |
3 |
p. 437-453
17 p.
|
article
|
| 16 |
Prediction of long-term thermal behavior of an irradiated SRAM based on isochronal annealing measurements
|
Saigné, F.
|
|
2002
|
42 |
3 |
p. 459-461
3 p.
|
article
|
| 17 |
Recent developments in silicon optoelectronic devices
|
Wong, Hei
|
|
2002
|
42 |
3 |
p. 317-326
10 p.
|
article
|
| 18 |
Temperature-dependent noise characterization and modeling of on-wafer microwave transistors
|
Caddemi, A.
|
|
2002
|
42 |
3 |
p. 361-366
6 p.
|
article
|
| 19 |
The abnormality in gate oxide failure induced by stress-enhanced diffusion of polycrystalline silicon
|
Ahn, Yongseok
|
|
2002
|
42 |
3 |
p. 349-354
6 p.
|
article
|
| 20 |
The impact of copper contamination on the quality of the second wire bonding process using X-ray photoelectron spectroscopy method
|
Lin, T.Y.
|
|
2002
|
42 |
3 |
p. 375-380
6 p.
|
article
|
Journal description