nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Analysis of a standby system with Rayleigh down time and gamma failure time distributions
|
Gupta, Rakesh |
|
1993 |
33 |
6 |
p. 793-796 4 p. |
artikel |
2 |
Bayesian analysis of system availability
|
Sharma, K.K. |
|
1993 |
33 |
6 |
p. 809-811 3 p. |
artikel |
3 |
Bayes interval for the Weibull parameters utilizing guessed estimates
|
Singh, S.K. |
|
1993 |
33 |
6 |
p. 909-912 4 p. |
artikel |
4 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1993 |
33 |
6 |
p. 917-919 3 p. |
artikel |
5 |
Determination of software release instant using a nonhomogeneous error detection rate model
|
Aggarwal, K.K. |
|
1993 |
33 |
6 |
p. 803-807 5 p. |
artikel |
6 |
Dynamics of spin coating on very rough surfaces
|
Hershcovitz, M. |
|
1993 |
33 |
6 |
p. 869-880 12 p. |
artikel |
7 |
Extensions to the Sherif-Dear Simple (SDS) theorem in number theory
|
Sherif, Yosef S. |
|
1993 |
33 |
6 |
p. 827-832 6 p. |
artikel |
8 |
FACE: A failure analysis and characterization environment for E-beam testing
|
Pierrel, J.P. |
|
1993 |
33 |
6 |
p. 895-904 10 p. |
artikel |
9 |
Inaccuracy and the best 1:1 code
|
Bhatia, P.K. |
|
1993 |
33 |
6 |
p. 905-907 3 p. |
artikel |
10 |
Kinetics of red AlGaAs light-emitting diodes degradation
|
Torchinskaya, T.V. |
|
1993 |
33 |
6 |
p. 845-857 13 p. |
artikel |
11 |
On estimation for mixtures of two Rayleigh distribution with censoring
|
Attia, A.F. |
|
1993 |
33 |
6 |
p. 859-867 9 p. |
artikel |
12 |
On the reliability of links in a ring network
|
Abuelyaman, Eltayeb Salih |
|
1993 |
33 |
6 |
p. 813-826 14 p. |
artikel |
13 |
Probabilistic analysis of a two-stage production system subject to inspection at first stage and initial buffer
|
Gopalan, M.N. |
|
1993 |
33 |
6 |
p. 771-783 13 p. |
artikel |
14 |
Publications, notices, calls for papers, etc.
|
|
|
1993 |
33 |
6 |
p. 913-916 4 p. |
artikel |
15 |
Queue dependent probabilistic additional space heterogeneous queueing problem
|
Bansal, K.K. |
|
1993 |
33 |
6 |
p. 797-801 5 p. |
artikel |
16 |
Reliability of polysilicon thin film resistors with irreversible resistance transition
|
Petković, D.M. |
|
1993 |
33 |
6 |
p. 785-791 7 p. |
artikel |
17 |
Reliability survival equivalence
|
Råde, Lennart |
|
1993 |
33 |
6 |
p. 881-894 14 p. |
artikel |
18 |
Two characterizations of geometric distributions
|
Yehia, A.Y. |
|
1993 |
33 |
6 |
p. 833-843 11 p. |
artikel |