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                                       Details for article 8 of 18 found articles
 
 
  FACE: A failure analysis and characterization environment for E-beam testing
 
 
Title: FACE: A failure analysis and characterization environment for E-beam testing
Author: Pierrel, J.P.
May, D.
Bourdin, L.
Appeared in: Microelectronics reliability
Paging: Volume 33 (1993) nr. 6 pages 10 p.
Year: 1993
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 8 of 18 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands