| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A k-out-of-N:G redundant system with dependent failure rates and common-cause failures
|
Who Kee Chung,
|
|
1988
|
28 |
2 |
p. 201-203
3 p.
|
artikel
|
| 2 |
An algorithm for fault-tree probabilities using the factoring theorem
|
Page, Lavon B.
|
|
1988
|
28 |
2 |
p. 273-286
14 p.
|
artikel
|
| 3 |
An efficient solution procedure for transient Markov processes
|
Eddaifi, D.
|
|
1988
|
28 |
2 |
p. 235-241
7 p.
|
artikel
|
| 4 |
4693777 Apparatus for producing semiconductor devices
|
Hazano, Shigeki
|
|
1988
|
28 |
2 |
p. 330-
1 p.
|
artikel
|
| 5 |
Bayesian inference in mixtures of two exponentials
|
Pandey, M.
|
|
1988
|
28 |
2 |
p. 217-221
5 p.
|
artikel
|
| 6 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1988
|
28 |
2 |
p. 167-169
3 p.
|
artikel
|
| 7 |
Changes in electrical characteristics of AlTi contacts on silicon
|
Brezeanu, G.
|
|
1988
|
28 |
2 |
p. 205-211
7 p.
|
artikel
|
| 8 |
4694372 Circuit diagnosis and control device
|
Sibeud, Jean-Paul
|
|
1988
|
28 |
2 |
p. 330-331
2 p.
|
artikel
|
| 9 |
CMOS3cell library
|
G.W.A.D.,
|
|
1988
|
28 |
2 |
p. 325-326
2 p.
|
artikel
|
| 10 |
Computer aids for VLSI design
|
G.W.A.D.,
|
|
1988
|
28 |
2 |
p. 324-325
2 p.
|
artikel
|
| 11 |
4686468 Contact set for test apparatus for testing integrated circuit package
|
Lee, Kenneth
|
|
1988
|
28 |
2 |
p. 327-
1 p.
|
artikel
|
| 12 |
4686606 Device for cooling integrated circuit chip
|
Yamada, Minoru
|
|
1988
|
28 |
2 |
p. 327-
1 p.
|
artikel
|
| 13 |
Effect of statistical dependencies in strict consecutive-k-out-of-n:F systems
|
Rushdi, Ali M.
|
|
1988
|
28 |
2 |
p. 309-318
10 p.
|
artikel
|
| 14 |
Electromigration on oxide steps
|
Wild, Andreas
|
|
1988
|
28 |
2 |
p. 243-255
13 p.
|
artikel
|
| 15 |
Erratum
|
|
|
1988
|
28 |
2 |
p. 333-
1 p.
|
artikel
|
| 16 |
Failure mechanisms in semiconductor devices
|
D.J.S.,
|
|
1988
|
28 |
2 |
p. 323-324
2 p.
|
artikel
|
| 17 |
4694193 Fault recognition circuit for parallel power supply devices feeding a user
|
Schlenk, Manfred
|
|
1988
|
28 |
2 |
p. 330-
1 p.
|
artikel
|
| 18 |
Fault tolerance in N-MOS random access memories with dynamic redundancy methods
|
Naidu, R.Venkatapathi
|
|
1988
|
28 |
2 |
p. 193-200
8 p.
|
artikel
|
| 19 |
4692923 Fault tolerant memory
|
Poeppelman, AlanD
|
|
1988
|
28 |
2 |
p. 329-330
2 p.
|
artikel
|
| 20 |
GERT analysis of two-stage attribute sampling plans based on an exponential failure model
|
Singh, H.R.
|
|
1988
|
28 |
2 |
p. 319-321
3 p.
|
artikel
|
| 21 |
4691287 IC device and a system for testing the same
|
Suzuki, Soichi
|
|
1988
|
28 |
2 |
p. 328-
1 p.
|
artikel
|
| 22 |
4691831 IC test equipment
|
Suzuki, Kempei
|
|
1988
|
28 |
2 |
p. 329-
1 p.
|
artikel
|
| 23 |
4694242 Integrated circuit tester and remote pin electronics therefor
|
Peterson, JohnL
|
|
1988
|
28 |
2 |
p. 330-
1 p.
|
artikel
|
| 24 |
Liability aspects of procurement contracts
|
Jacobs, Richard M.
|
|
1988
|
28 |
2 |
p. 183-188
6 p.
|
artikel
|
| 25 |
4692694 Load testing apparatus for electronic components
|
Yokoi, Satoru
|
|
1988
|
28 |
2 |
p. 329-
1 p.
|
artikel
|
| 26 |
Metastable states in asynchronous digital systems: Avoidable or unavoidable?
|
Männer, R.
|
|
1988
|
28 |
2 |
p. 295-307
13 p.
|
artikel
|
| 27 |
Microprocessor controlled pre-, post- and instant-gauging with corrective feedback for automatic grinding and cutting machines in line production
|
Tiwari, P.S.
|
|
1988
|
28 |
2 |
p. 229-234
6 p.
|
artikel
|
| 28 |
On simulation of resist profiles in electron beam lithography
|
Deshmukh, P.R.
|
|
1988
|
28 |
2 |
p. 223-228
6 p.
|
artikel
|
| 29 |
On the correlation between inter-arrival delays of shocks
|
Biswas, Suddhendu
|
|
1988
|
28 |
2 |
p. 189-192
4 p.
|
artikel
|
| 30 |
Optimum planned policies with minimal repair
|
Kaio, Naoto
|
|
1988
|
28 |
2 |
p. 287-293
7 p.
|
artikel
|
| 31 |
Probabilistic properties of the exponential distribution
|
Leemis, Lawrence M.
|
|
1988
|
28 |
2 |
p. 257-262
6 p.
|
artikel
|
| 32 |
Publications, notices, calls for papers, etc.
|
|
|
1988
|
28 |
2 |
p. 171-179
9 p.
|
artikel
|
| 33 |
Reliability analysis of the feeding system in the paper industry
|
Kumar, Dinesh
|
|
1988
|
28 |
2 |
p. 213-215
3 p.
|
artikel
|
| 34 |
Reliability Centered Maintenance
|
Reiche, H.
|
|
1988
|
28 |
2 |
p. 181-
1 p.
|
artikel
|
| 35 |
4692904 Semiconductor integrated circuit device
|
Sato, Nobuyuki
|
|
1988
|
28 |
2 |
p. 329-
1 p.
|
artikel
|
| 36 |
4691301 Semiconductor memory with redundant column circuitry
|
Anderson, DanielF
|
|
1988
|
28 |
2 |
p. 328-
1 p.
|
artikel
|
| 37 |
The physics of VLSI systems
|
G.W.A.D.,
|
|
1988
|
28 |
2 |
p. 323-
1 p.
|
artikel
|
| 38 |
Trafficability and reliability analysis for the digital switching network
|
Lee, Kang W.
|
|
1988
|
28 |
2 |
p. 263-272
10 p.
|
artikel
|
| 39 |
4687988 Weighted random pattern testing apparatus and method
|
Eichelberger, EdwardB
|
|
1988
|
28 |
2 |
p. 327-328
2 p.
|
artikel
|
| 40 |
4688223 Weighted random pattern testing apparatus and method
|
Motika, Franco
|
|
1988
|
28 |
2 |
p. 328-
1 p.
|
artikel
|
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