Digital Library
Close Browse articles from a journal
 
<< previous    next >>
     Journal description
       All volumes of the corresponding journal
         All issues of the corresponding volume
           All articles of the corresponding issues
                                       Details for article 39 of 40 found articles
 
 
  4687988 Weighted random pattern testing apparatus and method
 
 
Title: 4687988 Weighted random pattern testing apparatus and method
Author: Eichelberger, EdwardB
Langmaid, RogerN
Lindbloom, Eric
Motika, Franco
Sinchak, John
Waicukauski, JohnA
Appeared in: Microelectronics reliability
Paging: Volume 28 (1988) nr. 2 pages 2 p.
Year: 1988
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 39 of 40 found articles
 
<< previous    next >>
 
 Koninklijke Bibliotheek - National Library of the Netherlands