| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
A case study in availability forecasting
|
Baxter, Laurence A.
|
|
1985
|
25 |
5 |
p. 927-942
16 p.
|
article
|
| 2 |
A general method for turning a coherent system's structure function to SLE
|
Lu, Pei-En
|
|
1985
|
25 |
5 |
p. 833-835
3 p.
|
article
|
| 3 |
Analysis of a one-server two-unit parallel system
|
Gopalan, M.N.
|
|
1985
|
25 |
5 |
p. 859-863
5 p.
|
article
|
| 4 |
Analysis of two-unit-standby redundant system with administrative delay in repair
|
Pandey, D.K.
|
|
1985
|
25 |
5 |
p. 917-920
4 p.
|
article
|
| 5 |
Analyzing data for CMOS leakage faults
|
Malaiya, Yashwant K.
|
|
1985
|
25 |
5 |
p. 943-948
6 p.
|
article
|
| 6 |
Bayesian shrinkage estimation of reliability in parallel system with exponential failure of the components
|
Pandey, M.
|
|
1985
|
25 |
5 |
p. 899-903
5 p.
|
article
|
| 7 |
Calculate coherent system's reliability by using SLE
|
Lu, Pei-En
|
|
1985
|
25 |
5 |
p. 829-831
3 p.
|
article
|
| 8 |
Calendar of International Conferences, Symposia, Lectures and Meetings of Interest
|
|
|
1985
|
25 |
5 |
p. 815-817
3 p.
|
article
|
| 9 |
Call for papers
|
|
|
1985
|
25 |
5 |
p. 819-825
7 p.
|
article
|
| 10 |
4493059 Circuit and method for writing in a semiconductor memory device
|
|
|
1985
|
25 |
5 |
p. 1012-
1 p.
|
article
|
| 11 |
Cost analysis of a two-unit electronic parallel redundant system with overloading effect
|
Gupta, P.P.
|
|
1985
|
25 |
5 |
p. 847-851
5 p.
|
article
|
| 12 |
Cost-benefit analysis of a one-server two-nonidentical-unit cold standby system with repair and preventive maitenance
|
Gopalan, M.N.
|
|
1985
|
25 |
5 |
p. 991-1000
10 p.
|
article
|
| 13 |
Cost-benefit analysis of a one-server two-unit cold standby system with repair and age replacement
|
Gopalan, M.N.
|
|
1985
|
25 |
5 |
p. 977-990
14 p.
|
article
|
| 14 |
Cost-benefit analysis of a one-server two-unit imperfect switch system with delayed repair
|
Gopalan, M.N.
|
|
1985
|
25 |
5 |
p. 865-867
3 p.
|
article
|
| 15 |
Cost-benefit analysis of a two-unit adaptive system subject to slow switch with random service
|
Radhakrishnan, R.
|
|
1985
|
25 |
5 |
p. 869-875
7 p.
|
article
|
| 16 |
Cost-benefit analysis of one-server two-unit imperfect switch system with degradation
|
Gopalan, M.N.
|
|
1985
|
25 |
5 |
p. 949-958
10 p.
|
article
|
| 17 |
Cost-benefit analysis of one-server two-unit parallel system subject to random service
|
Gopalan, M.N.
|
|
1985
|
25 |
5 |
p. 959-975
17 p.
|
article
|
| 18 |
Cost-benefit analysis of one-server two-unit replacement system with imperfect switch
|
Gopalan, M.N.
|
|
1985
|
25 |
5 |
p. 877-879
3 p.
|
article
|
| 19 |
4493010 Electronic packaging module utilizing phase-chage conductive cooling
|
|
|
1985
|
25 |
5 |
p. 1012-
1 p.
|
article
|
| 20 |
Fitting cost-reliability data in a standard curve
|
Kamal Kumar Govil,
|
|
1985
|
25 |
5 |
p. 913-915
3 p.
|
article
|
| 21 |
Further results on the solution of a queueing model by Sharda and Garg
|
Sharda,
|
|
1985
|
25 |
5 |
p. 909-912
4 p.
|
article
|
| 22 |
Invited guest editorial
|
Ryerson, Clifford M.
|
|
1985
|
25 |
5 |
p. 827-
1 p.
|
article
|
| 23 |
4489479 Method for repair of buried contacts in mosfet devices
|
|
|
1985
|
25 |
5 |
p. 1011-
1 p.
|
article
|
| 24 |
4490783 Microcomputer with self-test of microcode
|
|
|
1985
|
25 |
5 |
p. 1011-
1 p.
|
article
|
| 25 |
4496900 Nonlinearity detection using fault-generated second harmonic
|
|
|
1985
|
25 |
5 |
p. 1013-
1 p.
|
article
|
| 26 |
Note on the solution of a queueing model by Sharda and Garg
|
Sharda,
|
|
1985
|
25 |
5 |
p. 905-907
3 p.
|
article
|
| 27 |
Preliminary test estimator for life data
|
Gupta, V.P.
|
|
1985
|
25 |
5 |
p. 881-887
7 p.
|
article
|
| 28 |
Program verification for microprocessors through Petri net modeling
|
Hura, G.S.
|
|
1985
|
25 |
5 |
p. 1001-1010
10 p.
|
article
|
| 29 |
Reliability/performance evaluation for a multisystem with preventive maintenance
|
Ohshimo, Hideshi
|
|
1985
|
25 |
5 |
p. 841-846
6 p.
|
article
|
| 30 |
4493077 Scan testable integrated circuit
|
|
|
1985
|
25 |
5 |
p. 1012-
1 p.
|
article
|
| 31 |
Screen printed thick film nickel-silicon interaction
|
Singh, Awatar
|
|
1985
|
25 |
5 |
p. 889-893
5 p.
|
article
|
| 32 |
Some notes on availability theory
|
Baxter, Laurence A.
|
|
1985
|
25 |
5 |
p. 921-926
6 p.
|
article
|
| 33 |
Specific resistivity of a metal-n GaAs OHMIC contact with an intermediate N + layer
|
Gupta, R.P.
|
|
1985
|
25 |
5 |
p. 837-840
4 p.
|
article
|
| 34 |
Stochastic behaviour of a three-state complex repairable system with three types of failures
|
Gupta, P.P.
|
|
1985
|
25 |
5 |
p. 853-858
6 p.
|
article
|
| 35 |
4490673 Testing an integrated circuit containing a tristate driver and a control signal generating network therefor
|
|
|
1985
|
25 |
5 |
p. 1011-
1 p.
|
article
|
| 36 |
Thermal stresses developed in thin films of germanium
|
Arora, R.K.
|
|
1985
|
25 |
5 |
p. 895-898
4 p.
|
article
|
| 37 |
4498227 Wafer fabrication by implanting through protective layer
|
|
|
1985
|
25 |
5 |
p. 1013-
1 p.
|
article
|
| 38 |
4493055 Wafer-scale integrated circuits
|
|
|
1985
|
25 |
5 |
p. 1012-
1 p.
|
article
|
Journal description