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                             165 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A boolean algebra method for reliability calculations Gupta, P.P.
1983
23 5 p. 863-865
3 p.
artikel
2 A ceramic capacitor substrate for high speed switching VLSI chips 1983
23 5 p. 1003-
1 p.
artikel
3 A CMOS process for VLSI instrumentation 1983
23 5 p. 1000-
1 p.
artikel
4 Acoustic-emission-monitored tests for TAB inner lead bond quality 1983
23 5 p. 992-
1 p.
artikel
5 A dynamic bias system for burn-in or thermal endurance treatments of 8085A microprocessors 1983
23 5 p. 993-
1 p.
artikel
6 A Heuristic approach to the generation of tests for faults on the intermediate lines 1983
23 5 p. 995-
1 p.
artikel
7 A Kolmogorov-Smirnov goodness-of-fit test for the two-parameter Weibull distribution when the parameters are estimated from the data 1983
23 5 p. 996-
1 p.
artikel
8 Alteration of diffusion profiles in semiconductors due to p-n junctions 1983
23 5 p. 1001-
1 p.
artikel
9 A multicomponent two-unit cold standby system with three modes Goel, L.R.
1983
23 5 p. 799-803
5 p.
artikel
10 A multi-standby multi-failure mode system with repair and replacement policy Goel, L.R.
1983
23 5 p. 809-812
4 p.
artikel
11 An alternate approach to syndrome algebra for diagnostics 1983
23 5 p. 996-
1 p.
artikel
12 Analysis of series deviance in a parallel state transition diagram and applications to fault tolerant computing Lombardi, Fabrizio
1983
23 5 p. 963-980
18 p.
artikel
13 An entropy barrier against vacancy-interstitial recombination in silicon 1983
23 5 p. 1001-
1 p.
artikel
14 A notation for designing restoring logic circuitry in CMOS 1983
23 5 p. 999-
1 p.
artikel
15 A Petri net approach to enumerate all system success paths for reliability evaluation of a complex system 1983
23 5 p. 996-
1 p.
artikel
16 Application of molecular beam epitaxy to III–V microwave and high speed device fabrication 1983
23 5 p. 1004-
1 p.
artikel
17 A radiation hardened 256 × 4 bulk CMOS RAM 1983
23 5 p. 1000-
1 p.
artikel
18 A re-extrapolation technique in Newton-Sor computer simulation of semiconductor devices 1983
23 5 p. 1000-
1 p.
artikel
19 A repairable system with N failure modes and K standby units 1983
23 5 p. 994-
1 p.
artikel
20 A semi-regenerative process of two-unit warm standby system 1983
23 5 p. 995-
1 p.
artikel
21 A simple evaporation process for producing improved interlevel via resistance 1983
23 5 p. 998-
1 p.
artikel
22 A single unit multicomponent system subject to various types of failures Goel, L.R.
1983
23 5 p. 813-816
4 p.
artikel
23 A unified switching theory with applications to VLSI design 1983
23 5 p. 998-999
2 p.
artikel
24 Availability measures for an intermittently used repairable system Kapur, P.K.
1983
23 5 p. 841-844
4 p.
artikel
25 Bias humidity performance and failure mechanisms of nonhermetic aluminium SIC's in an environment contaminated with SO2 1983
23 5 p. 992-993
2 p.
artikel
26 Bounds of age replacement time 1983
23 5 p. 995-
1 p.
artikel
27 Burn-in board design, material and component selection 1983
23 5 p. 992-
1 p.
artikel
28 Calendar of international conferences, symposia, lectures and meetings of interest 1983
23 5 p. 767-771
5 p.
artikel
29 Can velocity overshoot or ballistic transport be efficient in submicron devices? 1983
23 5 p. 999-
1 p.
artikel
30 Characterisation of Se implanted layers for GaAs FETs Singh, B.R.
1983
23 5 p. 857-861
5 p.
artikel
31 Chemically vapour-deposited borophosphosilicate glasses for silicon device applications 1983
23 5 p. 992-
1 p.
artikel
32 Chipstrate interconnection substrates for advanced electronic systems 1983
23 5 p. 1002-
1 p.
artikel
33 Controlling semiconductor processes 1983
23 5 p. 998-
1 p.
artikel
34 Copper impurity levels in silicon 1983
23 5 p. 1001-
1 p.
artikel
35 Cost based reliability growth apportionment Govil, K.K.
1983
23 5 p. 789-792
4 p.
artikel
36 Creating the integrated engineering design office 1983
23 5 p. 999-
1 p.
artikel
37 CVD Tungsten interconnect and contact barrier technology for VLSI 1983
23 5 p. 999-
1 p.
artikel
38 DC leakage currents in trichloroethylene oxides 1983
23 5 p. 1001-
1 p.
artikel
39 Debunking the learning curve 1983
23 5 p. 991-
1 p.
artikel
40 Defect levels in chromium-doped silicon 1983
23 5 p. 1001-1002
2 p.
artikel
41 Delay times in fault tree analysis 1983
23 5 p. 994-
1 p.
artikel
42 Deposition and properties of RF reactively sputtered SiO2 layers 1983
23 5 p. 1000-
1 p.
artikel
43 Designing reliable communication networks in a planned failure environment 1983
23 5 p. 997-
1 p.
artikel
44 Designing the CF-18 to be operationally ready 1983
23 5 p. 994-
1 p.
artikel
45 Design parameters of four-terminal distributed thin film integrated band-reject filter Singh, H.R.
1983
23 5 p. 795-797
3 p.
artikel
46 Determination of the oxygen precipitate-free zone width in silicon wafers from surface photovoltage measurements 1983
23 5 p. 1001-
1 p.
artikel
47 Devices meeting probes the limits of semiconductors and circuitry 1983
23 5 p. 997-
1 p.
artikel
48 Diffusivity and growth rate of silicon in solid-phase epitaxy with an aluminium medium 1983
23 5 p. 1001-
1 p.
artikel
49 Digital systems with algorithm implementation G.W.A.D.,
1983
23 5 p. 989-
1 p.
artikel
50 Effects of accelerated temperature testing on the low-frequency noise of planar NPN transistors Stojadinović, N.D.
1983
23 5 p. 899-901
3 p.
artikel
51 Enumeration of all 2-trees in a graph through Petri nets Hura, G.S.
1983
23 5 p. 851-853
3 p.
artikel
52 Erratum 1983
23 5 p. 1005-
1 p.
artikel
53 Etch delineation of defects in phosphosilicate glass layers 1983
23 5 p. 992-
1 p.
artikel
54 Evaluating the MIL-STD-883B alternate die visual screen for LSI 1983
23 5 p. 997-
1 p.
artikel
55 Expected repair cost under doubly stochastic damage processes 1983
23 5 p. 994-
1 p.
artikel
56 Fabrication of through-wafer via conductors in Si by laser photochemical processing 1983
23 5 p. 1004-
1 p.
artikel
57 Fault-cover investigations of fan-out reconvergent circuits using Boolean differences 1983
23 5 p. 993-
1 p.
artikel
58 Fault spectrums—comparative experiences 1983
23 5 p. 993-
1 p.
artikel
59 Geometric programming method for optimal reliability allocation for a series system subject to cost constraint Govil, K.K.
1983
23 5 p. 783-784
2 p.
artikel
60 High reliability polymer thick film 1983
23 5 p. 1002-
1 p.
artikel
61 Implant gettering and ion beam detection of generation impurities in silicon 1983
23 5 p. 1004-
1 p.
artikel
62 Inspecting incoming components 1983
23 5 p. 992-
1 p.
artikel
63 Interconnection and circuit packaging for electromagnetic compatibility 1983
23 5 p. 997-998
2 p.
artikel
64 Ion-cleaning damage in (100) GaAs, and its effect on Schottky diodes 1983
23 5 p. 1004-
1 p.
artikel
65 Isolation techniques for very large scale integration 1983
23 5 p. 999-
1 p.
artikel
66 Laser and electron beam scanning of GaAs FETS 1983
23 5 p. 1003-
1 p.
artikel
67 Laser processing cuts wider swath 1983
23 5 p. 1003-
1 p.
artikel
68 Laser processing of semiconductor silicon. Part II 1983
23 5 p. 1003-
1 p.
artikel
69 Linewidth measurement on IC masks by diffraction from grating test patterns 1983
23 5 p. 999-
1 p.
artikel
70 Low temperature double-exposed polyimide/oxide dielectric for VLSI multilevel metal interconnection 1983
23 5 p. 998-
1 p.
artikel
71 LPCVD of aluminium and Al-Si alloys for semiconductor metallization 1983
23 5 p. 997-
1 p.
artikel
72 Magnetron sputtering systems 1983
23 5 p. 1002-
1 p.
artikel
73 Maintainability and availability calculations for series, parallel and r-out-of-n configurations Govil, K.K.
1983
23 5 p. 785-787
3 p.
artikel
74 Maintenance of reliable real time systems: hardware versus software tradeoffs 1983
23 5 p. 997-
1 p.
artikel
75 Major circuit yield improvement: yours for the price of minor resistor redesign 1983
23 5 p. 1003-
1 p.
artikel
76 Metal migrations outside the package during accelerated life tests 1983
23 5 p. 999-
1 p.
artikel
77 Microcomputer real time software reliability and fault recovery 1983
23 5 p. 995-
1 p.
artikel
78 Mix-and-match of 10 : 1 wafer steppers with die-by-die alignment to 1 : 1 proximity and projection systems 1983
23 5 p. 999-
1 p.
artikel
79 Modelling systems with high early failure occurrence patterns 1983
23 5 p. 994-
1 p.
artikel
80 Moderate inversion in MOS devices 1983
23 5 p. 1000-
1 p.
artikel
81 Modification of cutsets for reliability evaluation of communication systems 1983
23 5 p. 994-
1 p.
artikel
82 Modification to the reduction technique of Thomas Case for obtaining a simplified reliability expression Govil, K.K.
1983
23 5 p. 793-
1 p.
artikel
83 Modified periodic preventive maintenance policies Nakagawa, Toshio
1983
23 5 p. 945-951
7 p.
artikel
84 More reliable connections to condensation-soldered terminals 1983
23 5 p. 992-
1 p.
artikel
85 More than a decade of the non-saturating autoclave as a highly accelerated stress technique for evaluating the reliability of nonhermetic microelectronic components Sinnadurai, N.
1983
23 5 p. 833-836
4 p.
artikel
86 Morphology of copper precipitates characterizing lattice imperfection in EFG ribbon silicon 1983
23 5 p. 1002-
1 p.
artikel
87 Multiprocessor architecture tunes in to transaction processing 1983
23 5 p. 1000-
1 p.
artikel
88 Multi-standby system with repair and replacement policy Goel, L.R.
1983
23 5 p. 805-808
4 p.
artikel
89 New thick film multilayer interconnection technology using a Nd- YAG laser 1983
23 5 p. 1003-
1 p.
artikel
90 Non-noble metal inks for thick film hybrid circuits 1983
23 5 p. 1002-
1 p.
artikel
91 Nonparametric tests for testing the homogenetty of k (> 2) exponential, gamma and weibull populations using censored data Padmanabhan, A.R.
1983
23 5 p. 953-961
9 p.
artikel
92 On a model for software reliability performance 1983
23 5 p. 994-
1 p.
artikel
93 On creating a reliable programming environment 1983
23 5 p. 996-
1 p.
artikel
94 On early stage degradation in Zn diffused GaAs LED 1983
23 5 p. 1000-
1 p.
artikel
95 On optimal maintenance of a series system Kumar, Ashok
1983
23 5 p. 827-831
5 p.
artikel
96 On profit evaluation in a modular system with two types of failures Gupta, M.C.
1983
23 5 p. 823-825
3 p.
artikel
97 On standby redundant system with repair, post repair and preventive maintenance Mahmoud, M.I.
1983
23 5 p. 817-819
3 p.
artikel
98 On the analysis of diffusion length measurements by SEM 1983
23 5 p. 1000-
1 p.
artikel
99 On the canonical representation of homogeneous Markov processes modelling failure-time distributions 1983
23 5 p. 994-
1 p.
artikel
100 Operational repairable equipments and the Duane model 1983
23 5 p. 996-
1 p.
artikel
101 Optical emission and pressure correlations during plasma etching 1983
23 5 p. 1003-1004
2 p.
artikel
102 Optimal structure of sensor systems composed of nonidentical sensors 1983
23 5 p. 996-
1 p.
artikel
103 Packaging reliability—how to define and measure it 1983
23 5 p. 997-
1 p.
artikel
104 Petri net approach to the analysis of a structured program 1983
23 5 p. 995-
1 p.
artikel
105 Petri net as a modelling tool 1983
23 5 p. 996-
1 p.
artikel
106 Plasma etching of aluminium: review of process and equipment technology 1983
23 5 p. 999-
1 p.
artikel
107 Positive resist material requirements for VLSI device fabrication. Part II 1983
23 5 p. 998-
1 p.
artikel
108 Prediction of component temperatures on circuit cards cooled by natural convection 1983
23 5 p. 998-
1 p.
artikel
109 Preventive maintenance of a 1-unit system with two types of repair 1983
23 5 p. 996-
1 p.
artikel
110 Principles of manufacturing data management 1983
23 5 p. 991-
1 p.
artikel
111 Publications, notices, calls for paper, etc. 1983
23 5 p. 773-782
10 p.
artikel
112 Punch-through gate protection of M.O.S. devices 1983
23 5 p. 993-
1 p.
artikel
113 Quality assurance in an electronics production 1983
23 5 p. 991-
1 p.
artikel
114 Quality assurance in an enterprise of the computer branch 1983
23 5 p. 993-
1 p.
artikel
115 Quality assurance with soft soldering in electronics 1983
23 5 p. 991-
1 p.
artikel
116 Quality improvement program addressed to M.O.S. microprocessors 1983
23 5 p. 995-
1 p.
artikel
117 Reliability analysis of time-dependent cascade system with deterministic cycle times 1983
23 5 p. 995-
1 p.
artikel
118 Reliability analysis: optimal inspection and maintenance schedules of failing systems 1983
23 5 p. 993-
1 p.
artikel
119 Reliability and availability analysis of systems operating in multiple environments Dhillon, B.S.
1983
23 5 p. 883-898
16 p.
artikel
120 Reliability theory for multistate systems with multistate components 1983
23 5 p. 993-994
2 p.
artikel
121 Replacing destructive by non-destructive testing 1983
23 5 p. 995-
1 p.
artikel
122 Review of reliability improvements of GaAlAs laser diodes 1983
23 5 p. 992-
1 p.
artikel
123 Review paper. Approximations for Fermi-Dirac integrals, especially the function J 1 2 (η) used to describe electron density in a semiconductor 1983
23 5 p. 1000-
1 p.
artikel
124 Sawing systems update 1983
23 5 p. 999-
1 p.
artikel
125 Seeded bug volume for software validation Ramzan, Mohammed Tahir
1983
23 5 p. 981-988
8 p.
artikel
126 Sequential evaluation of terminal pair reliability in a reliability network 1983
23 5 p. 993-
1 p.
artikel
127 Services for monitoring hazardous conditions 1983
23 5 p. 997-
1 p.
artikel
128 Significant features of solder connections to gold-plated thin films 1983
23 5 p. 1003-
1 p.
artikel
129 Software implemented fault tolerance: a methodology 1983
23 5 p. 995-
1 p.
artikel
130 Software reliability models: A review Shanthikumar, J.G.
1983
23 5 p. 903-943
41 p.
artikel
131 Solid-state power relays enter the IC era 1983
23 5 p. 1000-
1 p.
artikel
132 Some stress—strength reliability models 1983
23 5 p. 995-
1 p.
artikel
133 Specific contact resistance and noise in contacts on thin layers 1983
23 5 p. 1003-
1 p.
artikel
134 Steiner trees in probabilistic networks Wald, Joseph A.
1983
23 5 p. 837-840
4 p.
artikel
135 Stochastic analysis of outdoor power systems in fluctuating environment Dhillon, B.S.
1983
23 5 p. 867-881
15 p.
artikel
136 Stochastic behavior of a 1-server n-unit system subject to arbitrary failure, exponential inspection and repair Subramanyam Naidu, R.
1983
23 5 p. 845-849
5 p.
artikel
137 Stochastic models for predicting human reliability 1983
23 5 p. 991-
1 p.
artikel
138 Study of electron traps in the thin interfacial oxide layer of Al-, Au- and Sn-n GaAs Schottky barriers by detrapping experiments 1983
23 5 p. 1002-
1 p.
artikel
139 Success with handling hazardous gases 1983
23 5 p. 997-
1 p.
artikel
140 Systems safety: a survey 1983
23 5 p. 994-
1 p.
artikel
141 Test device structures for integrated circuit design, process technology development and evaluation 1983
23 5 p. 996-
1 p.
artikel
142 The application of marginal voltage measurements to detect and locate defects in digital microcircuits 1983
23 5 p. 993-
1 p.
artikel
143 The art of package sealing 1983
23 5 p. 998-
1 p.
artikel
144 The chemistry and stability of ruthenium-based resistors 1983
23 5 p. 1002-
1 p.
artikel
145 The common thread for operational reliability and failure physics 1983
23 5 p. 991-
1 p.
artikel
146 The effect of preventive maintenance on a system with imperfect switchover Mahmoud, M.I.
1983
23 5 p. 821-822
2 p.
artikel
147 The measurement and sources of substrate heat flux encountered with magnetron sputtering 1983
23 5 p. 1002-
1 p.
artikel
148 The present situation on hybrid techniques in Hungary especially in high frequency applications 1983
23 5 p. 1002-
1 p.
artikel
149 Thermal emission rates and capture cross-section of majority carriers at titanium levels in silicon 1983
23 5 p. 1001-
1 p.
artikel
150 Thermosonic gold wire bonding to copper conductors 1983
23 5 p. 998-
1 p.
artikel
151 The role of CAD in semicustom IC design 1983
23 5 p. 998-
1 p.
artikel
152 The role of germanium in evaporated Au-Ge OHMIC contacts to GaAs 1983
23 5 p. 1000-
1 p.
artikel
153 Thick film materials and reliability 1983
23 5 p. 1002-
1 p.
artikel
154 Threshold shift of p-channel transistors by boron implantation and the C-V characteristics of the corresponding MOS structures 1983
23 5 p. 1004-
1 p.
artikel
155 Tin and tin-alloy plating G.W.A.D.,
1983
23 5 p. 989-990
2 p.
artikel
156 Transient transport and transferred electron behaviour in gallium arsenide under the condition of high-energy electron injection 1983
23 5 p. 1001-
1 p.
artikel
157 Trends in metallization materials 1983
23 5 p. 999-
1 p.
artikel
158 Une modelisation Bayesienne du taux de defaillance en fiabilite 1983
23 5 p. 996-997
2 p.
artikel
159 VLSI thermal management in cost driven systems 1983
23 5 p. 998-
1 p.
artikel
160 Wafer marking and reading 1983
23 5 p. 998-
1 p.
artikel
161 Water defect detection systems 1983
23 5 p. 992-
1 p.
artikel
162 Weapons systems analysis, part II: simulation techniques and models 1983
23 5 p. 995-
1 p.
artikel
163 Weapons systems analysis, part I: system effectiveness 1983
23 5 p. 995-
1 p.
artikel
164 Wirebonding reliability techniques and analysis 1983
23 5 p. 991-992
2 p.
artikel
165 Worst case reliability bounds Govindachar, Suresh
1983
23 5 p. 855-856
2 p.
artikel
                             165 gevonden resultaten
 
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