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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
6 results found
| no | title | author | magazine | year | volume | issue | page(s) | type |
| 1 | Etude de la fiabilite d'un transistor a effet de champ As Ga pour hyperfrequences par des methodes d'analyse factorielle et de classification automatique |
Alain, Lelievre |
1983 |
23 | 4 |
p. 745-759 15 p. |
article |
|
| 2 | European integrated circuit reliability |
Dummer, G.W.A. |
1983 |
23 | 4 |
p. 607- 1 p. |
article |
|
| 3 | Failure physics of integrated circuits — A review |
Stojadinović, N.D. |
1983 |
23 | 4 |
p. 609-707 99 p. |
article |
|
| 4 | Investigation of information loss mechanisms in EPROMs |
Bertotti, D. |
1983 |
23 | 4 |
p. 717-743 27 p. |
article |
|
| 5 | Quality assurance system and reliability testing of LSI circuits |
Wurnik, F.M. |
1983 |
23 | 4 |
p. 709-715 7 p. |
article |
|
| 6 | Updating of CMOS reliability |
Brambilla, P. |
1983 |
23 | 4 |
p. 761-765 5 p. |
article |
6 results found