nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A bayesian approach to test modelling
|
|
|
1981 |
21 |
4 |
p. 620- 1 p. |
artikel |
2 |
A Bayesian estimate of availability
|
|
|
1981 |
21 |
4 |
p. 618- 1 p. |
artikel |
3 |
A bayesian modelling of failure rate
|
|
|
1981 |
21 |
4 |
p. 619- 1 p. |
artikel |
4 |
A bibliography on silicon nitride films
|
|
|
1981 |
21 |
4 |
p. 622- 1 p. |
artikel |
5 |
About use of ICS for submerged cables: can we reject all infant failures?
|
|
|
1981 |
21 |
4 |
p. 611-612 2 p. |
artikel |
6 |
A device analysis system based on laser scanning techniques
|
|
|
1981 |
21 |
4 |
p. 622- 1 p. |
artikel |
7 |
AFDT1, maintenance software
|
|
|
1981 |
21 |
4 |
p. 619- 1 p. |
artikel |
8 |
A first study on reliability of high radiance burrus diodes
|
|
|
1981 |
21 |
4 |
p. 610- 1 p. |
artikel |
9 |
A k-out-of-N:G three-state unit redundant system with common-cause failures and replacements
|
Chung, Who Kee |
|
1981 |
21 |
4 |
p. 589-591 3 p. |
artikel |
10 |
A life cycle cost computation program
|
|
|
1981 |
21 |
4 |
p. 618-619 2 p. |
artikel |
11 |
A microelectronics technical dictionary
|
Anjard, Ronald P |
|
1981 |
21 |
4 |
p. 601-604 4 p. |
artikel |
12 |
A modular method for LSI circuits testing
|
|
|
1981 |
21 |
4 |
p. 621- 1 p. |
artikel |
13 |
A multistate system with several failure modes and cold standby units
|
|
|
1981 |
21 |
4 |
p. 613- 1 p. |
artikel |
14 |
Analysis and optimization of recovery procedures in a distributed data base
|
|
|
1981 |
21 |
4 |
p. 615- 1 p. |
artikel |
15 |
Analysis of a degraded multistate system with general repair-time distributions
|
|
|
1981 |
21 |
4 |
p. 615- 1 p. |
artikel |
16 |
Analysis of a two-unit parallel redundant system with phase type failure and general repair
|
Ravichandran, N |
|
1981 |
21 |
4 |
p. 569-572 4 p. |
artikel |
17 |
An approach to optimization of spare parts cost in a multilevel maintenance system by introducing repairable modules into maintenance policy
|
|
|
1981 |
21 |
4 |
p. 615- 1 p. |
artikel |
18 |
An availability calculation for k-out-of-N redundant system with common-cause failures and replacement
|
|
|
1981 |
21 |
4 |
p. 613- 1 p. |
artikel |
19 |
An availability evaluation for computer communication networks
|
|
|
1981 |
21 |
4 |
p. 616- 1 p. |
artikel |
20 |
A new dielectric isolation method using porous silicon
|
|
|
1981 |
21 |
4 |
p. 621- 1 p. |
artikel |
21 |
An interview with Klaus D. Bowers: very-large-scale integration; very-large-scale benefits
|
|
|
1981 |
21 |
4 |
p. 620- 1 p. |
artikel |
22 |
Application of Markov chains to the model—building and evaluation of complex satellite telecommunications systems
|
|
|
1981 |
21 |
4 |
p. 613- 1 p. |
artikel |
23 |
Applying new technology in a traditional industry—coal mining
|
|
|
1981 |
21 |
4 |
p. 620- 1 p. |
artikel |
24 |
A redundant system with non-instantaneous switchover and “preparation time” for the repair facility
|
Subramanian, R |
|
1981 |
21 |
4 |
p. 593-596 4 p. |
artikel |
25 |
A review of two dimensional long channel MOSFET modeling
|
|
|
1981 |
21 |
4 |
p. 621- 1 p. |
artikel |
26 |
Assessing component reliability and maintenance schedules for attaining tolerable risks of system-malfunction
|
|
|
1981 |
21 |
4 |
p. 614- 1 p. |
artikel |
27 |
A two-dimensional placement algorithm for the layout of electronic circuits
|
|
|
1981 |
21 |
4 |
p. 621- 1 p. |
artikel |
28 |
A two-unit parallel redundant system with bivariate exponential lifetimes
|
|
|
1981 |
21 |
4 |
p. 614- 1 p. |
artikel |
29 |
Availability analysis of systems with two types of repair facilities
|
|
|
1981 |
21 |
4 |
p. 613- 1 p. |
artikel |
30 |
Availability analysis of two-unit warm standby system with inspection time
|
|
|
1981 |
21 |
4 |
p. 615- 1 p. |
artikel |
31 |
Bibliography of literature on medical equipment reliability
|
|
|
1981 |
21 |
4 |
p. 615- 1 p. |
artikel |
32 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1981 |
21 |
4 |
p. 479-481 3 p. |
artikel |
33 |
Charge build-up in MOS system under ionizing radiation
|
|
|
1981 |
21 |
4 |
p. 621- 1 p. |
artikel |
34 |
Check sum computer memory fault detection
|
|
|
1981 |
21 |
4 |
p. 618- 1 p. |
artikel |
35 |
Chip corrosion in plastic packages
|
|
|
1981 |
21 |
4 |
p. 611- 1 p. |
artikel |
36 |
CMOS comes of age
|
|
|
1981 |
21 |
4 |
p. 621- 1 p. |
artikel |
37 |
CMOS uncommitted logic arrays are part-digital, part-analog
|
|
|
1981 |
21 |
4 |
p. 621- 1 p. |
artikel |
38 |
Comments on “Some considerations in the formulation of IC yield statistics”
|
|
|
1981 |
21 |
4 |
p. 610- 1 p. |
artikel |
39 |
Complex two-unit system with preventive maintenance
|
Subramanian, R |
|
1981 |
21 |
4 |
p. 559-567 9 p. |
artikel |
40 |
Components screening: is it useful? Evaluation of a manufacturing experience
|
|
|
1981 |
21 |
4 |
p. 611- 1 p. |
artikel |
41 |
Current and resistivity dependence of electromigration from a statistical analysis of metallization failure data
|
|
|
1981 |
21 |
4 |
p. 610- 1 p. |
artikel |
42 |
Dependability evaluation of computer system with stochastic PETRI nets
|
|
|
1981 |
21 |
4 |
p. 619- 1 p. |
artikel |
43 |
Designing for reliability
|
|
|
1981 |
21 |
4 |
p. 613- 1 p. |
artikel |
44 |
Do flame retardants affect the reliability of molded plastic packages?
|
Feinstein, L.G |
|
1981 |
21 |
4 |
p. 533-541 9 p. |
artikel |
45 |
Economic importance and effects of microelectronics
|
|
|
1981 |
21 |
4 |
p. 620- 1 p. |
artikel |
46 |
Efficient functional testing of RAMS
|
|
|
1981 |
21 |
4 |
p. 616- 1 p. |
artikel |
47 |
Electrical characteristics of laser-contacted diodes
|
|
|
1981 |
21 |
4 |
p. 610- 1 p. |
artikel |
48 |
Electromigration and ohmic contact properties of the magnetron-sputtered Al2%Si alloy films
|
|
|
1981 |
21 |
4 |
p. 622- 1 p. |
artikel |
49 |
Electronics reliability: a state-of-the-art survey
|
|
|
1981 |
21 |
4 |
p. 609- 1 p. |
artikel |
50 |
Enumeration of all simple paths in a communication network
|
|
|
1981 |
21 |
4 |
p. 615- 1 p. |
artikel |
51 |
Estimation of the reliability of computer components from field renewal data
|
|
|
1981 |
21 |
4 |
p. 616- 1 p. |
artikel |
52 |
Evaluation of state probability of repairable systems when maintenance policies are independent of the state of the system
|
|
|
1981 |
21 |
4 |
p. 617-618 2 p. |
artikel |
53 |
Evaporated thin film RC filters
|
Gupta, V.P |
|
1981 |
21 |
4 |
p. 529-532 4 p. |
artikel |
54 |
Failure data collecting of DX 100 and DX 200 telephone exchanges
|
|
|
1981 |
21 |
4 |
p. 619-620 2 p. |
artikel |
55 |
Fast 16-K static RAM tolerates faults
|
|
|
1981 |
21 |
4 |
p. 621- 1 p. |
artikel |
56 |
Fault trees and discrete probability spaces
|
|
|
1981 |
21 |
4 |
p. 615- 1 p. |
artikel |
57 |
Forecasting the reliability of memory equipped with an error correcting code: the effect of Alpha particles
|
|
|
1981 |
21 |
4 |
p. 616-617 2 p. |
artikel |
58 |
High threshold voltages in small geometry MOS transistors due to edge contamination
|
|
|
1981 |
21 |
4 |
p. 610- 1 p. |
artikel |
59 |
Human performance reliability modelling for time-continuous type tasks
|
|
|
1981 |
21 |
4 |
p. 609- 1 p. |
artikel |
60 |
Implantation ionique dans le GaAs
|
|
|
1981 |
21 |
4 |
p. 622- 1 p. |
artikel |
61 |
Investing in new technologies—a personal perspective
|
|
|
1981 |
21 |
4 |
p. 620- 1 p. |
artikel |
62 |
La maintenance du logiciel. Un essai de modelisation
|
|
|
1981 |
21 |
4 |
p. 612- 1 p. |
artikel |
63 |
Learning processes and growth curves in the field of integrated circuits
|
|
|
1981 |
21 |
4 |
p. 612- 1 p. |
artikel |
64 |
Life cycle cost: A survey
|
Dhillon, Balbir S |
|
1981 |
21 |
4 |
p. 495-511 17 p. |
artikel |
65 |
LSI reliability prediction based on time
|
|
|
1981 |
21 |
4 |
p. 611- 1 p. |
artikel |
66 |
Methods and failure rates of integrated circuits
|
|
|
1981 |
21 |
4 |
p. 611- 1 p. |
artikel |
67 |
Microelectronics and the adversarial approach to industrial relations
|
|
|
1981 |
21 |
4 |
p. 620- 1 p. |
artikel |
68 |
Microelectronics in radio engineering
|
|
|
1981 |
21 |
4 |
p. 620- 1 p. |
artikel |
69 |
Microtechnology in health care
|
|
|
1981 |
21 |
4 |
p. 620- 1 p. |
artikel |
70 |
Minority carrier injection and storage into a heavily doped emitter. Approximate solution for auger recombination
|
|
|
1981 |
21 |
4 |
p. 621-622 2 p. |
artikel |
71 |
Modelling, estimation and significance testing of reliability growth or burn-in
|
|
|
1981 |
21 |
4 |
p. 619- 1 p. |
artikel |
72 |
Modelling the repairability function by the first passage time distribution of brownian motion
|
|
|
1981 |
21 |
4 |
p. 614- 1 p. |
artikel |
73 |
Multistate device redundant systems with common-cause failures and one standby unit
|
|
|
1981 |
21 |
4 |
p. 613- 1 p. |
artikel |
74 |
New resin molded tantalum capacitors designed for severe environment
|
|
|
1981 |
21 |
4 |
p. 609-610 2 p. |
artikel |
75 |
New results in reliability analysis
|
|
|
1981 |
21 |
4 |
p. 618- 1 p. |
artikel |
76 |
Observation of electron traps in electrochemically deposited CdTe films
|
|
|
1981 |
21 |
4 |
p. 622- 1 p. |
artikel |
77 |
On formulation of a reliable cost allocation strategy in centralized computer networks
|
|
|
1981 |
21 |
4 |
p. 615- 1 p. |
artikel |
78 |
On human reliability—bibliography
|
|
|
1981 |
21 |
4 |
p. 609- 1 p. |
artikel |
79 |
On profit evaluation in a two-unit maintained redundant system
|
Gupta, M.C |
|
1981 |
21 |
4 |
p. 605-608 4 p. |
artikel |
80 |
On program testing issues in software reliability—a survey
|
|
|
1981 |
21 |
4 |
p. 617- 1 p. |
artikel |
81 |
On reliable software development for microprocessors
|
|
|
1981 |
21 |
4 |
p. 616- 1 p. |
artikel |
82 |
On the methods of obtaining interval reliability of redundant systems
|
|
|
1981 |
21 |
4 |
p. 617- 1 p. |
artikel |
83 |
On the term “activation energy” in accelerated lifetime tests of plastic encapsulated semiconductor components
|
|
|
1981 |
21 |
4 |
p. 610- 1 p. |
artikel |
84 |
Operational repairable equipments and the DUANE model
|
|
|
1981 |
21 |
4 |
p. 613- 1 p. |
artikel |
85 |
Optimum policy of one-unit system with two types of maintenance and minimal repair
|
|
|
1981 |
21 |
4 |
p. 614- 1 p. |
artikel |
86 |
Optimum repair limit policies with a cost constraint
|
Kaio, Naoto |
|
1981 |
21 |
4 |
p. 597-599 3 p. |
artikel |
87 |
Parametric methods in the analysis of survival data
|
|
|
1981 |
21 |
4 |
p. 612-613 2 p. |
artikel |
88 |
PBX's self test and security
|
|
|
1981 |
21 |
4 |
p. 617- 1 p. |
artikel |
89 |
Performance index to quantify reliability using fuzzy subset theory
|
Misra, K.B |
|
1981 |
21 |
4 |
p. 543-549 7 p. |
artikel |
90 |
Plastic encapsulated semiconductor devices — Bibliography V
|
|
|
1981 |
21 |
4 |
p. 487-490 4 p. |
artikel |
91 |
Plastics in microcircuit fabrication bibliography III
|
|
|
1981 |
21 |
4 |
p. 491-494 4 p. |
artikel |
92 |
Principles of screening and cost effective product assurance
|
|
|
1981 |
21 |
4 |
p. 609- 1 p. |
artikel |
93 |
Probability distribution functions for sampling schemes
|
Singmin, A |
|
1981 |
21 |
4 |
p. 553-557 5 p. |
artikel |
94 |
Programmed and default exception handling in hierarchical modular software systems
|
|
|
1981 |
21 |
4 |
p. 616- 1 p. |
artikel |
95 |
Program structures for reliable programming
|
|
|
1981 |
21 |
4 |
p. 617- 1 p. |
artikel |
96 |
Publications, notices, calls for papers, etc.
|
|
|
1981 |
21 |
4 |
p. 483-486 4 p. |
artikel |
97 |
Quality assurance requirements for computer software in telecommunications systems
|
|
|
1981 |
21 |
4 |
p. 616- 1 p. |
artikel |
98 |
Quality evaluation method on 1728 element linear image sensors for space application
|
|
|
1981 |
21 |
4 |
p. 618- 1 p. |
artikel |
99 |
Quality improvement program addressed to MOS microprocessors
|
|
|
1981 |
21 |
4 |
p. 611- 1 p. |
artikel |
100 |
Reliability approach of software
|
|
|
1981 |
21 |
4 |
p. 614- 1 p. |
artikel |
101 |
Reliability assurance and the growing complexity of electronic devices
|
|
|
1981 |
21 |
4 |
p. 609- 1 p. |
artikel |
102 |
Reliability block diagrams and “Petri” nets
|
|
|
1981 |
21 |
4 |
p. 614- 1 p. |
artikel |
103 |
Reliability considerations for new satellite systems
|
|
|
1981 |
21 |
4 |
p. 617- 1 p. |
artikel |
104 |
Reliability design of a standby system by a large-scale multiobjective optimization method
|
|
|
1981 |
21 |
4 |
p. 616- 1 p. |
artikel |
105 |
Reliability evaluation of a two-unit unrepairable system
|
|
|
1981 |
21 |
4 |
p. 615- 1 p. |
artikel |
106 |
Reliability evaluation of computer programs
|
|
|
1981 |
21 |
4 |
p. 613- 1 p. |
artikel |
107 |
Reliability growth: a survey
|
|
|
1981 |
21 |
4 |
p. 609- 1 p. |
artikel |
108 |
Reliability models for switches for duplicated computer modules
|
|
|
1981 |
21 |
4 |
p. 614- 1 p. |
artikel |
109 |
Reliability of several metallization systems used on bipolar transistors for microwaves
|
|
|
1981 |
21 |
4 |
p. 611- 1 p. |
artikel |
110 |
Reliability study of SPOT platform
|
|
|
1981 |
21 |
4 |
p. 618- 1 p. |
artikel |
111 |
Replacement models with inspection and preventive maintenance
|
|
|
1981 |
21 |
4 |
p. 614- 1 p. |
artikel |
112 |
Screening of electronic components: a practical application
|
|
|
1981 |
21 |
4 |
p. 611- 1 p. |
artikel |
113 |
s-Expected number of repairs and frequency of failures of a n-unit system with a single repair facility
|
Gopalan, M.N |
|
1981 |
21 |
4 |
p. 581-584 4 p. |
artikel |
114 |
Signature analysis for board testing
|
|
|
1981 |
21 |
4 |
p. 612- 1 p. |
artikel |
115 |
Simulation of the system availability—a renewal theory approach
|
|
|
1981 |
21 |
4 |
p. 617- 1 p. |
artikel |
116 |
Software error rate evaluation
|
Islam, Md.M |
|
1981 |
21 |
4 |
p. 551- 1 p. |
artikel |
117 |
Solderability degradation of tin coated copper leads—solderability measurement by meniscograph
|
|
|
1981 |
21 |
4 |
p. 612- 1 p. |
artikel |
118 |
Statistical fluctuations of dopant impurities in ion-implanted bipolar transistor structures and the minimum device dimensions for VLSI system reliability
|
|
|
1981 |
21 |
4 |
p. 622- 1 p. |
artikel |
119 |
Stochastic behaviour of a 1-server n-unit system subject to general repair distribution
|
Gopalan, M.N |
|
1981 |
21 |
4 |
p. 585-588 4 p. |
artikel |
120 |
Stochastic behaviour of a two-unit paralleled system
|
|
|
1981 |
21 |
4 |
p. 614- 1 p. |
artikel |
121 |
Stress-strength reliability models
|
|
|
1981 |
21 |
4 |
p. 612- 1 p. |
artikel |
122 |
Suitability of the lognormal distribution for repair times
|
|
|
1981 |
21 |
4 |
p. 619- 1 p. |
artikel |
123 |
Synthesis and automatic resolution of fault-trees (program SERENAD)
|
|
|
1981 |
21 |
4 |
p. 618- 1 p. |
artikel |
124 |
Temperature acceleration of CMOS IC operating life
|
|
|
1981 |
21 |
4 |
p. 612- 1 p. |
artikel |
125 |
Test and reliability evaluation of microprocessors
|
|
|
1981 |
21 |
4 |
p. 614- 1 p. |
artikel |
126 |
Test optimization for static RAM memories
|
|
|
1981 |
21 |
4 |
p. 614- 1 p. |
artikel |
127 |
The application of CAD/CAM in a mechanical engineering company
|
|
|
1981 |
21 |
4 |
p. 620- 1 p. |
artikel |
128 |
The application of microelectronics to automation and control of Metro production
|
|
|
1981 |
21 |
4 |
p. 620- 1 p. |
artikel |
129 |
The diffusion of hot electrons across a semiconductor base
|
|
|
1981 |
21 |
4 |
p. 621- 1 p. |
artikel |
130 |
The Dol's role in the development of new technology
|
|
|
1981 |
21 |
4 |
p. 620- 1 p. |
artikel |
131 |
The explosion of resin moulded power integrated circuits and the corresponding countermeasures
|
|
|
1981 |
21 |
4 |
p. 612- 1 p. |
artikel |
132 |
Thermal stress analysis of composite encapsulants with a spherical adhesive interface
|
|
|
1981 |
21 |
4 |
p. 621- 1 p. |
artikel |
133 |
The SALP computer code series
|
|
|
1981 |
21 |
4 |
p. 618- 1 p. |
artikel |
134 |
The software integrity of a computer system installed in a Royal Naval frigate
|
|
|
1981 |
21 |
4 |
p. 618- 1 p. |
artikel |
135 |
The temperature dependence of component failure rate
|
|
|
1981 |
21 |
4 |
p. 610- 1 p. |
artikel |
136 |
Thin film metallization studies and device lifetime prediction using AlSi and AlCuSi conductor test bars
|
Danso, Kwaku A |
|
1981 |
21 |
4 |
p. 513-527 15 p. |
artikel |
137 |
Times between failures: spacing or interarrival times?
|
|
|
1981 |
21 |
4 |
p. 615-616 2 p. |
artikel |
138 |
Tracking performance of film resistors: definitions and theory
|
|
|
1981 |
21 |
4 |
p. 622- 1 p. |
artikel |
139 |
Trends in the design of equipment for communication systems
|
|
|
1981 |
21 |
4 |
p. 620- 1 p. |
artikel |
140 |
Trends to test automation and documentation of PAPE software
|
|
|
1981 |
21 |
4 |
p. 614- 1 p. |
artikel |
141 |
Ultimate limits of MOS device dimensions and their effects on reliability
|
|
|
1981 |
21 |
4 |
p. 610-611 2 p. |
artikel |
142 |
2-Unit standby system with proviso for rest and maximum rest
|
Murari, K |
|
1981 |
21 |
4 |
p. 573-579 7 p. |
artikel |
143 |
VLSI tester is highly modular
|
|
|
1981 |
21 |
4 |
p. 621- 1 p. |
artikel |
144 |
Weibull distribution used to set up inspection card for an asymmetrical sample
|
|
|
1981 |
21 |
4 |
p. 615- 1 p. |
artikel |