| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
A bayesian approach to test modelling
|
|
|
1981
|
21 |
4 |
p. 620-
1 p.
|
article
|
| 2 |
A Bayesian estimate of availability
|
|
|
1981
|
21 |
4 |
p. 618-
1 p.
|
article
|
| 3 |
A bayesian modelling of failure rate
|
|
|
1981
|
21 |
4 |
p. 619-
1 p.
|
article
|
| 4 |
A bibliography on silicon nitride films
|
|
|
1981
|
21 |
4 |
p. 622-
1 p.
|
article
|
| 5 |
About use of ICS for submerged cables: can we reject all infant failures?
|
|
|
1981
|
21 |
4 |
p. 611-612
2 p.
|
article
|
| 6 |
A device analysis system based on laser scanning techniques
|
|
|
1981
|
21 |
4 |
p. 622-
1 p.
|
article
|
| 7 |
AFDT1, maintenance software
|
|
|
1981
|
21 |
4 |
p. 619-
1 p.
|
article
|
| 8 |
A first study on reliability of high radiance burrus diodes
|
|
|
1981
|
21 |
4 |
p. 610-
1 p.
|
article
|
| 9 |
A k-out-of-N:G three-state unit redundant system with common-cause failures and replacements
|
Chung, Who Kee
|
|
1981
|
21 |
4 |
p. 589-591
3 p.
|
article
|
| 10 |
A life cycle cost computation program
|
|
|
1981
|
21 |
4 |
p. 618-619
2 p.
|
article
|
| 11 |
A microelectronics technical dictionary
|
Anjard, Ronald P
|
|
1981
|
21 |
4 |
p. 601-604
4 p.
|
article
|
| 12 |
A modular method for LSI circuits testing
|
|
|
1981
|
21 |
4 |
p. 621-
1 p.
|
article
|
| 13 |
A multistate system with several failure modes and cold standby units
|
|
|
1981
|
21 |
4 |
p. 613-
1 p.
|
article
|
| 14 |
Analysis and optimization of recovery procedures in a distributed data base
|
|
|
1981
|
21 |
4 |
p. 615-
1 p.
|
article
|
| 15 |
Analysis of a degraded multistate system with general repair-time distributions
|
|
|
1981
|
21 |
4 |
p. 615-
1 p.
|
article
|
| 16 |
Analysis of a two-unit parallel redundant system with phase type failure and general repair
|
Ravichandran, N
|
|
1981
|
21 |
4 |
p. 569-572
4 p.
|
article
|
| 17 |
An approach to optimization of spare parts cost in a multilevel maintenance system by introducing repairable modules into maintenance policy
|
|
|
1981
|
21 |
4 |
p. 615-
1 p.
|
article
|
| 18 |
An availability calculation for k-out-of-N redundant system with common-cause failures and replacement
|
|
|
1981
|
21 |
4 |
p. 613-
1 p.
|
article
|
| 19 |
An availability evaluation for computer communication networks
|
|
|
1981
|
21 |
4 |
p. 616-
1 p.
|
article
|
| 20 |
A new dielectric isolation method using porous silicon
|
|
|
1981
|
21 |
4 |
p. 621-
1 p.
|
article
|
| 21 |
An interview with Klaus D. Bowers: very-large-scale integration; very-large-scale benefits
|
|
|
1981
|
21 |
4 |
p. 620-
1 p.
|
article
|
| 22 |
Application of Markov chains to the model—building and evaluation of complex satellite telecommunications systems
|
|
|
1981
|
21 |
4 |
p. 613-
1 p.
|
article
|
| 23 |
Applying new technology in a traditional industry—coal mining
|
|
|
1981
|
21 |
4 |
p. 620-
1 p.
|
article
|
| 24 |
A redundant system with non-instantaneous switchover and “preparation time” for the repair facility
|
Subramanian, R
|
|
1981
|
21 |
4 |
p. 593-596
4 p.
|
article
|
| 25 |
A review of two dimensional long channel MOSFET modeling
|
|
|
1981
|
21 |
4 |
p. 621-
1 p.
|
article
|
| 26 |
Assessing component reliability and maintenance schedules for attaining tolerable risks of system-malfunction
|
|
|
1981
|
21 |
4 |
p. 614-
1 p.
|
article
|
| 27 |
A two-dimensional placement algorithm for the layout of electronic circuits
|
|
|
1981
|
21 |
4 |
p. 621-
1 p.
|
article
|
| 28 |
A two-unit parallel redundant system with bivariate exponential lifetimes
|
|
|
1981
|
21 |
4 |
p. 614-
1 p.
|
article
|
| 29 |
Availability analysis of systems with two types of repair facilities
|
|
|
1981
|
21 |
4 |
p. 613-
1 p.
|
article
|
| 30 |
Availability analysis of two-unit warm standby system with inspection time
|
|
|
1981
|
21 |
4 |
p. 615-
1 p.
|
article
|
| 31 |
Bibliography of literature on medical equipment reliability
|
|
|
1981
|
21 |
4 |
p. 615-
1 p.
|
article
|
| 32 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1981
|
21 |
4 |
p. 479-481
3 p.
|
article
|
| 33 |
Charge build-up in MOS system under ionizing radiation
|
|
|
1981
|
21 |
4 |
p. 621-
1 p.
|
article
|
| 34 |
Check sum computer memory fault detection
|
|
|
1981
|
21 |
4 |
p. 618-
1 p.
|
article
|
| 35 |
Chip corrosion in plastic packages
|
|
|
1981
|
21 |
4 |
p. 611-
1 p.
|
article
|
| 36 |
CMOS comes of age
|
|
|
1981
|
21 |
4 |
p. 621-
1 p.
|
article
|
| 37 |
CMOS uncommitted logic arrays are part-digital, part-analog
|
|
|
1981
|
21 |
4 |
p. 621-
1 p.
|
article
|
| 38 |
Comments on “Some considerations in the formulation of IC yield statistics”
|
|
|
1981
|
21 |
4 |
p. 610-
1 p.
|
article
|
| 39 |
Complex two-unit system with preventive maintenance
|
Subramanian, R
|
|
1981
|
21 |
4 |
p. 559-567
9 p.
|
article
|
| 40 |
Components screening: is it useful? Evaluation of a manufacturing experience
|
|
|
1981
|
21 |
4 |
p. 611-
1 p.
|
article
|
| 41 |
Current and resistivity dependence of electromigration from a statistical analysis of metallization failure data
|
|
|
1981
|
21 |
4 |
p. 610-
1 p.
|
article
|
| 42 |
Dependability evaluation of computer system with stochastic PETRI nets
|
|
|
1981
|
21 |
4 |
p. 619-
1 p.
|
article
|
| 43 |
Designing for reliability
|
|
|
1981
|
21 |
4 |
p. 613-
1 p.
|
article
|
| 44 |
Do flame retardants affect the reliability of molded plastic packages?
|
Feinstein, L.G
|
|
1981
|
21 |
4 |
p. 533-541
9 p.
|
article
|
| 45 |
Economic importance and effects of microelectronics
|
|
|
1981
|
21 |
4 |
p. 620-
1 p.
|
article
|
| 46 |
Efficient functional testing of RAMS
|
|
|
1981
|
21 |
4 |
p. 616-
1 p.
|
article
|
| 47 |
Electrical characteristics of laser-contacted diodes
|
|
|
1981
|
21 |
4 |
p. 610-
1 p.
|
article
|
| 48 |
Electromigration and ohmic contact properties of the magnetron-sputtered Al2%Si alloy films
|
|
|
1981
|
21 |
4 |
p. 622-
1 p.
|
article
|
| 49 |
Electronics reliability: a state-of-the-art survey
|
|
|
1981
|
21 |
4 |
p. 609-
1 p.
|
article
|
| 50 |
Enumeration of all simple paths in a communication network
|
|
|
1981
|
21 |
4 |
p. 615-
1 p.
|
article
|
| 51 |
Estimation of the reliability of computer components from field renewal data
|
|
|
1981
|
21 |
4 |
p. 616-
1 p.
|
article
|
| 52 |
Evaluation of state probability of repairable systems when maintenance policies are independent of the state of the system
|
|
|
1981
|
21 |
4 |
p. 617-618
2 p.
|
article
|
| 53 |
Evaporated thin film RC filters
|
Gupta, V.P
|
|
1981
|
21 |
4 |
p. 529-532
4 p.
|
article
|
| 54 |
Failure data collecting of DX 100 and DX 200 telephone exchanges
|
|
|
1981
|
21 |
4 |
p. 619-620
2 p.
|
article
|
| 55 |
Fast 16-K static RAM tolerates faults
|
|
|
1981
|
21 |
4 |
p. 621-
1 p.
|
article
|
| 56 |
Fault trees and discrete probability spaces
|
|
|
1981
|
21 |
4 |
p. 615-
1 p.
|
article
|
| 57 |
Forecasting the reliability of memory equipped with an error correcting code: the effect of Alpha particles
|
|
|
1981
|
21 |
4 |
p. 616-617
2 p.
|
article
|
| 58 |
High threshold voltages in small geometry MOS transistors due to edge contamination
|
|
|
1981
|
21 |
4 |
p. 610-
1 p.
|
article
|
| 59 |
Human performance reliability modelling for time-continuous type tasks
|
|
|
1981
|
21 |
4 |
p. 609-
1 p.
|
article
|
| 60 |
Implantation ionique dans le GaAs
|
|
|
1981
|
21 |
4 |
p. 622-
1 p.
|
article
|
| 61 |
Investing in new technologies—a personal perspective
|
|
|
1981
|
21 |
4 |
p. 620-
1 p.
|
article
|
| 62 |
La maintenance du logiciel. Un essai de modelisation
|
|
|
1981
|
21 |
4 |
p. 612-
1 p.
|
article
|
| 63 |
Learning processes and growth curves in the field of integrated circuits
|
|
|
1981
|
21 |
4 |
p. 612-
1 p.
|
article
|
| 64 |
Life cycle cost: A survey
|
Dhillon, Balbir S
|
|
1981
|
21 |
4 |
p. 495-511
17 p.
|
article
|
| 65 |
LSI reliability prediction based on time
|
|
|
1981
|
21 |
4 |
p. 611-
1 p.
|
article
|
| 66 |
Methods and failure rates of integrated circuits
|
|
|
1981
|
21 |
4 |
p. 611-
1 p.
|
article
|
| 67 |
Microelectronics and the adversarial approach to industrial relations
|
|
|
1981
|
21 |
4 |
p. 620-
1 p.
|
article
|
| 68 |
Microelectronics in radio engineering
|
|
|
1981
|
21 |
4 |
p. 620-
1 p.
|
article
|
| 69 |
Microtechnology in health care
|
|
|
1981
|
21 |
4 |
p. 620-
1 p.
|
article
|
| 70 |
Minority carrier injection and storage into a heavily doped emitter. Approximate solution for auger recombination
|
|
|
1981
|
21 |
4 |
p. 621-622
2 p.
|
article
|
| 71 |
Modelling, estimation and significance testing of reliability growth or burn-in
|
|
|
1981
|
21 |
4 |
p. 619-
1 p.
|
article
|
| 72 |
Modelling the repairability function by the first passage time distribution of brownian motion
|
|
|
1981
|
21 |
4 |
p. 614-
1 p.
|
article
|
| 73 |
Multistate device redundant systems with common-cause failures and one standby unit
|
|
|
1981
|
21 |
4 |
p. 613-
1 p.
|
article
|
| 74 |
New resin molded tantalum capacitors designed for severe environment
|
|
|
1981
|
21 |
4 |
p. 609-610
2 p.
|
article
|
| 75 |
New results in reliability analysis
|
|
|
1981
|
21 |
4 |
p. 618-
1 p.
|
article
|
| 76 |
Observation of electron traps in electrochemically deposited CdTe films
|
|
|
1981
|
21 |
4 |
p. 622-
1 p.
|
article
|
| 77 |
On formulation of a reliable cost allocation strategy in centralized computer networks
|
|
|
1981
|
21 |
4 |
p. 615-
1 p.
|
article
|
| 78 |
On human reliability—bibliography
|
|
|
1981
|
21 |
4 |
p. 609-
1 p.
|
article
|
| 79 |
On profit evaluation in a two-unit maintained redundant system
|
Gupta, M.C
|
|
1981
|
21 |
4 |
p. 605-608
4 p.
|
article
|
| 80 |
On program testing issues in software reliability—a survey
|
|
|
1981
|
21 |
4 |
p. 617-
1 p.
|
article
|
| 81 |
On reliable software development for microprocessors
|
|
|
1981
|
21 |
4 |
p. 616-
1 p.
|
article
|
| 82 |
On the methods of obtaining interval reliability of redundant systems
|
|
|
1981
|
21 |
4 |
p. 617-
1 p.
|
article
|
| 83 |
On the term “activation energy” in accelerated lifetime tests of plastic encapsulated semiconductor components
|
|
|
1981
|
21 |
4 |
p. 610-
1 p.
|
article
|
| 84 |
Operational repairable equipments and the DUANE model
|
|
|
1981
|
21 |
4 |
p. 613-
1 p.
|
article
|
| 85 |
Optimum policy of one-unit system with two types of maintenance and minimal repair
|
|
|
1981
|
21 |
4 |
p. 614-
1 p.
|
article
|
| 86 |
Optimum repair limit policies with a cost constraint
|
Kaio, Naoto
|
|
1981
|
21 |
4 |
p. 597-599
3 p.
|
article
|
| 87 |
Parametric methods in the analysis of survival data
|
|
|
1981
|
21 |
4 |
p. 612-613
2 p.
|
article
|
| 88 |
PBX's self test and security
|
|
|
1981
|
21 |
4 |
p. 617-
1 p.
|
article
|
| 89 |
Performance index to quantify reliability using fuzzy subset theory
|
Misra, K.B
|
|
1981
|
21 |
4 |
p. 543-549
7 p.
|
article
|
| 90 |
Plastic encapsulated semiconductor devices — Bibliography V
|
|
|
1981
|
21 |
4 |
p. 487-490
4 p.
|
article
|
| 91 |
Plastics in microcircuit fabrication bibliography III
|
|
|
1981
|
21 |
4 |
p. 491-494
4 p.
|
article
|
| 92 |
Principles of screening and cost effective product assurance
|
|
|
1981
|
21 |
4 |
p. 609-
1 p.
|
article
|
| 93 |
Probability distribution functions for sampling schemes
|
Singmin, A
|
|
1981
|
21 |
4 |
p. 553-557
5 p.
|
article
|
| 94 |
Programmed and default exception handling in hierarchical modular software systems
|
|
|
1981
|
21 |
4 |
p. 616-
1 p.
|
article
|
| 95 |
Program structures for reliable programming
|
|
|
1981
|
21 |
4 |
p. 617-
1 p.
|
article
|
| 96 |
Publications, notices, calls for papers, etc.
|
|
|
1981
|
21 |
4 |
p. 483-486
4 p.
|
article
|
| 97 |
Quality assurance requirements for computer software in telecommunications systems
|
|
|
1981
|
21 |
4 |
p. 616-
1 p.
|
article
|
| 98 |
Quality evaluation method on 1728 element linear image sensors for space application
|
|
|
1981
|
21 |
4 |
p. 618-
1 p.
|
article
|
| 99 |
Quality improvement program addressed to MOS microprocessors
|
|
|
1981
|
21 |
4 |
p. 611-
1 p.
|
article
|
| 100 |
Reliability approach of software
|
|
|
1981
|
21 |
4 |
p. 614-
1 p.
|
article
|
| 101 |
Reliability assurance and the growing complexity of electronic devices
|
|
|
1981
|
21 |
4 |
p. 609-
1 p.
|
article
|
| 102 |
Reliability block diagrams and “Petri” nets
|
|
|
1981
|
21 |
4 |
p. 614-
1 p.
|
article
|
| 103 |
Reliability considerations for new satellite systems
|
|
|
1981
|
21 |
4 |
p. 617-
1 p.
|
article
|
| 104 |
Reliability design of a standby system by a large-scale multiobjective optimization method
|
|
|
1981
|
21 |
4 |
p. 616-
1 p.
|
article
|
| 105 |
Reliability evaluation of a two-unit unrepairable system
|
|
|
1981
|
21 |
4 |
p. 615-
1 p.
|
article
|
| 106 |
Reliability evaluation of computer programs
|
|
|
1981
|
21 |
4 |
p. 613-
1 p.
|
article
|
| 107 |
Reliability growth: a survey
|
|
|
1981
|
21 |
4 |
p. 609-
1 p.
|
article
|
| 108 |
Reliability models for switches for duplicated computer modules
|
|
|
1981
|
21 |
4 |
p. 614-
1 p.
|
article
|
| 109 |
Reliability of several metallization systems used on bipolar transistors for microwaves
|
|
|
1981
|
21 |
4 |
p. 611-
1 p.
|
article
|
| 110 |
Reliability study of SPOT platform
|
|
|
1981
|
21 |
4 |
p. 618-
1 p.
|
article
|
| 111 |
Replacement models with inspection and preventive maintenance
|
|
|
1981
|
21 |
4 |
p. 614-
1 p.
|
article
|
| 112 |
Screening of electronic components: a practical application
|
|
|
1981
|
21 |
4 |
p. 611-
1 p.
|
article
|
| 113 |
s-Expected number of repairs and frequency of failures of a n-unit system with a single repair facility
|
Gopalan, M.N
|
|
1981
|
21 |
4 |
p. 581-584
4 p.
|
article
|
| 114 |
Signature analysis for board testing
|
|
|
1981
|
21 |
4 |
p. 612-
1 p.
|
article
|
| 115 |
Simulation of the system availability—a renewal theory approach
|
|
|
1981
|
21 |
4 |
p. 617-
1 p.
|
article
|
| 116 |
Software error rate evaluation
|
Islam, Md.M
|
|
1981
|
21 |
4 |
p. 551-
1 p.
|
article
|
| 117 |
Solderability degradation of tin coated copper leads—solderability measurement by meniscograph
|
|
|
1981
|
21 |
4 |
p. 612-
1 p.
|
article
|
| 118 |
Statistical fluctuations of dopant impurities in ion-implanted bipolar transistor structures and the minimum device dimensions for VLSI system reliability
|
|
|
1981
|
21 |
4 |
p. 622-
1 p.
|
article
|
| 119 |
Stochastic behaviour of a 1-server n-unit system subject to general repair distribution
|
Gopalan, M.N
|
|
1981
|
21 |
4 |
p. 585-588
4 p.
|
article
|
| 120 |
Stochastic behaviour of a two-unit paralleled system
|
|
|
1981
|
21 |
4 |
p. 614-
1 p.
|
article
|
| 121 |
Stress-strength reliability models
|
|
|
1981
|
21 |
4 |
p. 612-
1 p.
|
article
|
| 122 |
Suitability of the lognormal distribution for repair times
|
|
|
1981
|
21 |
4 |
p. 619-
1 p.
|
article
|
| 123 |
Synthesis and automatic resolution of fault-trees (program SERENAD)
|
|
|
1981
|
21 |
4 |
p. 618-
1 p.
|
article
|
| 124 |
Temperature acceleration of CMOS IC operating life
|
|
|
1981
|
21 |
4 |
p. 612-
1 p.
|
article
|
| 125 |
Test and reliability evaluation of microprocessors
|
|
|
1981
|
21 |
4 |
p. 614-
1 p.
|
article
|
| 126 |
Test optimization for static RAM memories
|
|
|
1981
|
21 |
4 |
p. 614-
1 p.
|
article
|
| 127 |
The application of CAD/CAM in a mechanical engineering company
|
|
|
1981
|
21 |
4 |
p. 620-
1 p.
|
article
|
| 128 |
The application of microelectronics to automation and control of Metro production
|
|
|
1981
|
21 |
4 |
p. 620-
1 p.
|
article
|
| 129 |
The diffusion of hot electrons across a semiconductor base
|
|
|
1981
|
21 |
4 |
p. 621-
1 p.
|
article
|
| 130 |
The Dol's role in the development of new technology
|
|
|
1981
|
21 |
4 |
p. 620-
1 p.
|
article
|
| 131 |
The explosion of resin moulded power integrated circuits and the corresponding countermeasures
|
|
|
1981
|
21 |
4 |
p. 612-
1 p.
|
article
|
| 132 |
Thermal stress analysis of composite encapsulants with a spherical adhesive interface
|
|
|
1981
|
21 |
4 |
p. 621-
1 p.
|
article
|
| 133 |
The SALP computer code series
|
|
|
1981
|
21 |
4 |
p. 618-
1 p.
|
article
|
| 134 |
The software integrity of a computer system installed in a Royal Naval frigate
|
|
|
1981
|
21 |
4 |
p. 618-
1 p.
|
article
|
| 135 |
The temperature dependence of component failure rate
|
|
|
1981
|
21 |
4 |
p. 610-
1 p.
|
article
|
| 136 |
Thin film metallization studies and device lifetime prediction using AlSi and AlCuSi conductor test bars
|
Danso, Kwaku A
|
|
1981
|
21 |
4 |
p. 513-527
15 p.
|
article
|
| 137 |
Times between failures: spacing or interarrival times?
|
|
|
1981
|
21 |
4 |
p. 615-616
2 p.
|
article
|
| 138 |
Tracking performance of film resistors: definitions and theory
|
|
|
1981
|
21 |
4 |
p. 622-
1 p.
|
article
|
| 139 |
Trends in the design of equipment for communication systems
|
|
|
1981
|
21 |
4 |
p. 620-
1 p.
|
article
|
| 140 |
Trends to test automation and documentation of PAPE software
|
|
|
1981
|
21 |
4 |
p. 614-
1 p.
|
article
|
| 141 |
Ultimate limits of MOS device dimensions and their effects on reliability
|
|
|
1981
|
21 |
4 |
p. 610-611
2 p.
|
article
|
| 142 |
2-Unit standby system with proviso for rest and maximum rest
|
Murari, K
|
|
1981
|
21 |
4 |
p. 573-579
7 p.
|
article
|
| 143 |
VLSI tester is highly modular
|
|
|
1981
|
21 |
4 |
p. 621-
1 p.
|
article
|
| 144 |
Weibull distribution used to set up inspection card for an asymmetrical sample
|
|
|
1981
|
21 |
4 |
p. 615-
1 p.
|
article
|
Journal description