| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
A cost model for skip-lot non-destructive sampling
|
|
|
1980
|
20 |
5 |
p. 754-
1 p.
|
article
|
| 2 |
A device analysis system based on laser scanning techniques
|
Nagase, Masashi
|
|
1980
|
20 |
5 |
p. 717-735
19 p.
|
article
|
| 3 |
Advances in reduced pressure silicon epitaxy
|
|
|
1980
|
20 |
5 |
p. 762-
1 p.
|
article
|
| 4 |
A method for the rheological characterization of thick-film pastes
|
|
|
1980
|
20 |
5 |
p. 764-
1 p.
|
article
|
| 5 |
A multistate system with several failure modes and cold standby units
|
Yamashiro, Mitsuo
|
|
1980
|
20 |
5 |
p. 673-677
5 p.
|
article
|
| 6 |
Analysis of a degraded multistate system with general repair-time distributions
|
Yamashiro, Mitsuo
|
|
1980
|
20 |
5 |
p. 647-650
4 p.
|
article
|
| 7 |
An approach to computer aided design of multilayer hybrids
|
|
|
1980
|
20 |
5 |
p. 763-
1 p.
|
article
|
| 8 |
A new technique for the determination of the charge centroid in MNOS structures
|
|
|
1980
|
20 |
5 |
p. 762-
1 p.
|
article
|
| 9 |
Application of thermodiffusion for the purification of solids
|
|
|
1980
|
20 |
5 |
p. 763-
1 p.
|
article
|
| 10 |
A practical air-fireable base metal resistor system
|
|
|
1980
|
20 |
5 |
p. 764-
1 p.
|
article
|
| 11 |
A real life MTBF growth program for a deployed radar
|
|
|
1980
|
20 |
5 |
p. 757-
1 p.
|
article
|
| 12 |
A reliability model for error correcting memory systems
|
|
|
1980
|
20 |
5 |
p. 753-754
2 p.
|
article
|
| 13 |
A review of two dimensional long channel mosfet modeling
|
Kumar, Umesh
|
|
1980
|
20 |
5 |
p. 585-587
3 p.
|
article
|
| 14 |
A time series control chart for a nuclear reactor
|
|
|
1980
|
20 |
5 |
p. 755-
1 p.
|
article
|
| 15 |
A transmission-line analog simulating thin-film distributed-RC elements
|
|
|
1980
|
20 |
5 |
p. 763-
1 p.
|
article
|
| 16 |
Availability analysis of systems with two types of repair facilities
|
Dhillon, Balbir S
|
|
1980
|
20 |
5 |
p. 679-686
8 p.
|
article
|
| 17 |
Bibliography of literature on medical equipment reliability
|
Dhillon, Balbir S
|
|
1980
|
20 |
5 |
p. 737-742
6 p.
|
article
|
| 18 |
Boundary conditions at p-n junctions
|
|
|
1980
|
20 |
5 |
p. 763-
1 p.
|
article
|
| 19 |
Bubble memory family extends to megabit size
|
|
|
1980
|
20 |
5 |
p. 761-
1 p.
|
article
|
| 20 |
Bumped tape automated bonding (BTAB) practical application guidelines
|
|
|
1980
|
20 |
5 |
p. 760-
1 p.
|
article
|
| 21 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1980
|
20 |
5 |
p. 553-555
3 p.
|
article
|
| 22 |
CERT technology applied to an airborne radar
|
|
|
1980
|
20 |
5 |
p. 758-
1 p.
|
article
|
| 23 |
Characterisation of linearly graded p-n junction
|
|
|
1980
|
20 |
5 |
p. 762-
1 p.
|
article
|
| 24 |
Characterization of thermal compression wire bonds to thick-film conductors on procelain substrates
|
|
|
1980
|
20 |
5 |
p. 764-
1 p.
|
article
|
| 25 |
C-MOS picks up ground
|
|
|
1980
|
20 |
5 |
p. 759-
1 p.
|
article
|
| 26 |
Compliance test plans for availability
|
|
|
1980
|
20 |
5 |
p. 756-
1 p.
|
article
|
| 27 |
Conductance noise investigations on symmetrical planar resistors with finite contacts
|
|
|
1980
|
20 |
5 |
p. 763-
1 p.
|
article
|
| 28 |
Conference report
|
Jacobs, Richard M
|
|
1980
|
20 |
5 |
p. 565-570
6 p.
|
article
|
| 29 |
Consonance sets for 2-parameter Weibull and exponential distributions
|
|
|
1980
|
20 |
5 |
p. 754-
1 p.
|
article
|
| 30 |
Contact resistance in metal-semiconductor systems
|
|
|
1980
|
20 |
5 |
p. 762-
1 p.
|
article
|
| 31 |
Control charts for Weibull processes with standards given
|
|
|
1980
|
20 |
5 |
p. 754-
1 p.
|
article
|
| 32 |
Custom designed LSI for intrumentation
|
|
|
1980
|
20 |
5 |
p. 760-
1 p.
|
article
|
| 33 |
CW laser annealing of boron and arsenic-implanted silicon; electrical properties, crystalline structure and limitations
|
|
|
1980
|
20 |
5 |
p. 765-
1 p.
|
article
|
| 34 |
Deterrence and strict liability for defective products in the United Kingdom
|
|
|
1980
|
20 |
5 |
p. 753-
1 p.
|
article
|
| 35 |
Development of in-flight steady-state failure rates
|
|
|
1980
|
20 |
5 |
p. 757-
1 p.
|
article
|
| 36 |
Drawing the lines for v.l.s.i.
|
|
|
1980
|
20 |
5 |
p. 760-
1 p.
|
article
|
| 37 |
Electrical properties of anodic aluminium oxide films
|
|
|
1980
|
20 |
5 |
p. 763-
1 p.
|
article
|
| 38 |
Electric equivalent models of glass thick films
|
|
|
1980
|
20 |
5 |
p. 764-
1 p.
|
article
|
| 39 |
Enhancing reliability calculations through desk-top computers
|
|
|
1980
|
20 |
5 |
p. 755-
1 p.
|
article
|
| 40 |
Fine-line lithography nears its day
|
|
|
1980
|
20 |
5 |
p. 759-
1 p.
|
article
|
| 41 |
Geometry effects of small MOSFET devices
|
|
|
1980
|
20 |
5 |
p. 759-
1 p.
|
article
|
| 42 |
Gold traps in (100) silicon-silicon dioxide interfaces
|
|
|
1980
|
20 |
5 |
p. 762-
1 p.
|
article
|
| 43 |
Heat exchange optimization technique for high-power hybrid IC's
|
|
|
1980
|
20 |
5 |
p. 764-
1 p.
|
article
|
| 44 |
IC combines optical sensor, trigger
|
|
|
1980
|
20 |
5 |
p. 760-
1 p.
|
article
|
| 45 |
Improved R, M, and LCC for switching power supplies
|
|
|
1980
|
20 |
5 |
p. 756-
1 p.
|
article
|
| 46 |
Inspection policy for two-unit parallel redundant system
|
Adachi, Kouichi
|
|
1980
|
20 |
5 |
p. 603-612
10 p.
|
article
|
| 47 |
Investigations into the most favourable application of projection lithography
|
|
|
1980
|
20 |
5 |
p. 759-
1 p.
|
article
|
| 48 |
J-K flip-flop for C-MOS integrated circuits
|
|
|
1980
|
20 |
5 |
p. 759-
1 p.
|
article
|
| 49 |
Justifying vibration monitors in nuclear plants
|
|
|
1980
|
20 |
5 |
p. 756-
1 p.
|
article
|
| 50 |
k-Sample maximum likelihood ratio test for change of Weibull shape parameter
|
|
|
1980
|
20 |
5 |
p. 755-
1 p.
|
article
|
| 51 |
Laser annealing to round the edges of silicon structures
|
|
|
1980
|
20 |
5 |
p. 765-
1 p.
|
article
|
| 52 |
Likelihood inference for life test data
|
|
|
1980
|
20 |
5 |
p. 755-756
2 p.
|
article
|
| 53 |
Limit values and properties of bipolar and MOS transistors for highest integrated (VLSI) switching circuits
|
|
|
1980
|
20 |
5 |
p. 760-
1 p.
|
article
|
| 54 |
LSI ready to make a mark on packet-switching networks
|
|
|
1980
|
20 |
5 |
p. 759-
1 p.
|
article
|
| 55 |
Melt and solution growth of bulk single crystals of quaternary III–V alloys
|
|
|
1980
|
20 |
5 |
p. 763-
1 p.
|
article
|
| 56 |
Microcomputer can stand alone or join forces with other chips
|
|
|
1980
|
20 |
5 |
p. 758-
1 p.
|
article
|
| 57 |
Microcomputer grants wishes
|
|
|
1980
|
20 |
5 |
p. 758-
1 p.
|
article
|
| 58 |
Microprocessor architecture
|
|
|
1980
|
20 |
5 |
p. 761-
1 p.
|
article
|
| 59 |
Microprocessor implementation of the Kalman filter
|
|
|
1980
|
20 |
5 |
p. 761-
1 p.
|
article
|
| 60 |
Microprocessors: from characterisation to production
|
|
|
1980
|
20 |
5 |
p. 761-
1 p.
|
article
|
| 61 |
Microprocessor trends
|
|
|
1980
|
20 |
5 |
p. 761-
1 p.
|
article
|
| 62 |
Microprogrammable digital filter implementation using bipolar microprocessors
|
|
|
1980
|
20 |
5 |
p. 761-
1 p.
|
article
|
| 63 |
MIL-STD-1679 (NAVY)
|
|
|
1980
|
20 |
5 |
p. 757-
1 p.
|
article
|
| 64 |
Minimize downstream costs through applied maintainability
|
|
|
1980
|
20 |
5 |
p. 754-755
2 p.
|
article
|
| 65 |
Modelling of integrated MOS gates and determination of the network analysis parameters from the layout
|
|
|
1980
|
20 |
5 |
p. 759-
1 p.
|
article
|
| 66 |
Modelling the repairability function by the first passage time distribution of Brownian motion
|
Sherif, Y.S
|
|
1980
|
20 |
5 |
p. 687-691
5 p.
|
article
|
| 67 |
MOS sampled-data technique shrinks a-d converter chip
|
|
|
1980
|
20 |
5 |
p. 761-
1 p.
|
article
|
| 68 |
Mutual feedback synchronisation by unequal tests
|
Dickens, F.B
|
|
1980
|
20 |
5 |
p. 599-601
3 p.
|
article
|
| 69 |
New Multiwire meets the challenge of interconnecting chipcarriers
|
|
|
1980
|
20 |
5 |
p. 759-
1 p.
|
article
|
| 70 |
No-growth growth curves
|
|
|
1980
|
20 |
5 |
p. 758-
1 p.
|
article
|
| 71 |
On formulation of a reliable cost allocation strategy in centralized computer networks
|
Soi, Inder M
|
|
1980
|
20 |
5 |
p. 665-671
7 p.
|
article
|
| 72 |
On repairable component fault tree evaluation
|
|
|
1980
|
20 |
5 |
p. 756-
1 p.
|
article
|
| 73 |
On the design of improved failure detection experiments in synchronous sequential machines based on terminal measurements
|
|
|
1980
|
20 |
5 |
p. 754-
1 p.
|
article
|
| 74 |
On the self diffusion entropy in silicon
|
|
|
1980
|
20 |
5 |
p. 762-
1 p.
|
article
|
| 75 |
On the term “activation energy” in accelerated lifetime tests of plastic encapsulated semiconductor components
|
Moeller, A
|
|
1980
|
20 |
5 |
p. 651-664
14 p.
|
article
|
| 76 |
Packing a signal processor onto a single digital board
|
|
|
1980
|
20 |
5 |
p. 759-
1 p.
|
article
|
| 77 |
Part 2: LSI circuit simplifies packet-network connection
|
|
|
1980
|
20 |
5 |
p. 759-
1 p.
|
article
|
| 78 |
Potential distribution and multi-terminal DC resistance computations for LSI technology
|
|
|
1980
|
20 |
5 |
p. 760-761
2 p.
|
article
|
| 79 |
Principe d'un analyseur de spectre optique utilisant les couches minces pulverisées
|
|
|
1980
|
20 |
5 |
p. 764-
1 p.
|
article
|
| 80 |
Principles for the microelectronic realisation of frequency-selective circuits
|
|
|
1980
|
20 |
5 |
p. 759-
1 p.
|
article
|
| 81 |
Principles of screening and cost effective product assurance
|
Ryerson, C.M
|
|
1980
|
20 |
5 |
p. 693-715
23 p.
|
article
|
| 82 |
Procurement costs dictate specification tailoring
|
|
|
1980
|
20 |
5 |
p. 755-
1 p.
|
article
|
| 83 |
Productivity increase in a planar plasma deposition system
|
|
|
1980
|
20 |
5 |
p. 759-
1 p.
|
article
|
| 84 |
Properties of the capacitance transient induced in GaAs MOS structures
|
|
|
1980
|
20 |
5 |
p. 761-
1 p.
|
article
|
| 85 |
Provisioning data quality control criteria—a Delphi survey
|
|
|
1980
|
20 |
5 |
p. 754-
1 p.
|
article
|
| 86 |
Publications, notices, calls for papers, etc.
|
|
|
1980
|
20 |
5 |
p. 557-564
8 p.
|
article
|
| 87 |
Radial distortion in cambered wafers
|
|
|
1980
|
20 |
5 |
p. 759-
1 p.
|
article
|
| 88 |
Rational risk assessment for defense system safety
|
|
|
1980
|
20 |
5 |
p. 758-
1 p.
|
article
|
| 89 |
Recent advances in electron beam systems for mask making
|
|
|
1980
|
20 |
5 |
p. 760-
1 p.
|
article
|
| 90 |
Reliability block diagrams and “Petri” nets
|
Joller, J.M
|
|
1980
|
20 |
5 |
p. 613-624
12 p.
|
article
|
| 91 |
Reliability evaluation of a network with delay
|
|
|
1980
|
20 |
5 |
p. 753-
1 p.
|
article
|
| 92 |
Reliability evaluation of a two-unit unrepairable system
|
Yamada, Shigeru
|
|
1980
|
20 |
5 |
p. 589-597
9 p.
|
article
|
| 93 |
Reliability growth: A survey
|
Dhillon, Balbir S
|
|
1980
|
20 |
5 |
p. 743-754
12 p.
|
article
|
| 94 |
Reliability models for switches for duplicated computer modules
|
Schneeweiss, Winfrid G
|
|
1980
|
20 |
5 |
p. 571-579
9 p.
|
article
|
| 95 |
Reliability of clip-on terminals soldered to TaTa2NNiCrPdAu thin films
|
|
|
1980
|
20 |
5 |
p. 763-
1 p.
|
article
|
| 96 |
Reliability optimization by generalized Lagrangian-function and reduced-gradient methods
|
|
|
1980
|
20 |
5 |
p. 754-
1 p.
|
article
|
| 97 |
Reliability optimization with multiple properties and integer variables
|
|
|
1980
|
20 |
5 |
p. 755-
1 p.
|
article
|
| 98 |
RELSIM—a systems reliability simulation code
|
|
|
1980
|
20 |
5 |
p. 757-
1 p.
|
article
|
| 99 |
Review and analysis of laser annealing
|
|
|
1980
|
20 |
5 |
p. 765-
1 p.
|
article
|
| 100 |
Simulating multi-skill maintenance: a case study
|
|
|
1980
|
20 |
5 |
p. 757-
1 p.
|
article
|
| 101 |
Single IC emits multiple signals
|
|
|
1980
|
20 |
5 |
p. 760-
1 p.
|
article
|
| 102 |
SiSiO2 interface state spectroscopy using MOS tunneling structures
|
|
|
1980
|
20 |
5 |
p. 762-
1 p.
|
article
|
| 103 |
Some properties of logic-trees containing mutually-exclusive primary-events
|
|
|
1980
|
20 |
5 |
p. 754-
1 p.
|
article
|
| 104 |
Spacial resolution of SEM-EBIC images
|
|
|
1980
|
20 |
5 |
p. 762-
1 p.
|
article
|
| 105 |
Spare/repair parts provisioning recommendations
|
|
|
1980
|
20 |
5 |
p. 757-
1 p.
|
article
|
| 106 |
Stability of lateral pnp transistors during accelerated aging
|
|
|
1980
|
20 |
5 |
p. 753-
1 p.
|
article
|
| 107 |
Statistical fluctuations of dopant impurities in ion-implanted bipolar transistor structures and the minimum device dimensions for vlsi system reliability
|
Prucnal, P.R
|
|
1980
|
20 |
5 |
p. 633-646
14 p.
|
article
|
| 108 |
Statistical functions to represent various types of hazard rates
|
Dhillon, Balbir S
|
|
1980
|
20 |
5 |
p. 581-584
4 p.
|
article
|
| 109 |
Survey of computer-aided electrical analysis of integrated circuit interconnections
|
|
|
1980
|
20 |
5 |
p. 759-
1 p.
|
article
|
| 110 |
System maintainability verification—the paired time comparison (PTC) method
|
|
|
1980
|
20 |
5 |
p. 756-
1 p.
|
article
|
| 111 |
TCE oxidation for the elimination of oxidation-induced stacking faults in silicon
|
|
|
1980
|
20 |
5 |
p. 762-
1 p.
|
article
|
| 112 |
Temperature dependence of open-circuit photovoltage of a back-surface field semiconductor junction
|
|
|
1980
|
20 |
5 |
p. 761-
1 p.
|
article
|
| 113 |
The determination of transit system dependability
|
|
|
1980
|
20 |
5 |
p. 754-
1 p.
|
article
|
| 114 |
The effect of endless burn-in on reliability growth projections
|
|
|
1980
|
20 |
5 |
p. 756-757
2 p.
|
article
|
| 115 |
The effect of statistical and systematic failures on the process yield of integrated circuits
|
|
|
1980
|
20 |
5 |
p. 753-
1 p.
|
article
|
| 116 |
The electroforming of thin films of polypropylene
|
|
|
1980
|
20 |
5 |
p. 763-
1 p.
|
article
|
| 117 |
The explosion of resin moulded power integrated circuits and the corresponding countermeasures
|
Isagawa, Masaaki
|
|
1980
|
20 |
5 |
p. 625-631
7 p.
|
article
|
| 118 |
The fallacious reliability demonstration test
|
|
|
1980
|
20 |
5 |
p. 757-758
2 p.
|
article
|
| 119 |
The resistivity of thin gold films
|
|
|
1980
|
20 |
5 |
p. 764-
1 p.
|
article
|
| 120 |
Thermal design criteria for an optimized cryopump
|
|
|
1980
|
20 |
5 |
p. 764-
1 p.
|
article
|
| 121 |
Thermal history of substrates during sputtering and sputter etching
|
|
|
1980
|
20 |
5 |
p. 764-
1 p.
|
article
|
| 122 |
The role of direct step-on-the-wafer in microlithography strategy for the 80's
|
|
|
1980
|
20 |
5 |
p. 759-
1 p.
|
article
|
| 123 |
Titanium in silicon as a deep level impurity
|
|
|
1980
|
20 |
5 |
p. 762-
1 p.
|
article
|
| 124 |
Treatment of uncertainty in life cycle costing
|
|
|
1980
|
20 |
5 |
p. 758-
1 p.
|
article
|
| 125 |
Trends in ion implantation in gallium arsenide
|
|
|
1980
|
20 |
5 |
p. 765-
1 p.
|
article
|
| 126 |
Use of microprocessors in large digital exchanges
|
|
|
1980
|
20 |
5 |
p. 761-
1 p.
|
article
|
| 127 |
VLSI tester rushes along at 100 MHz
|
|
|
1980
|
20 |
5 |
p. 759-
1 p.
|
article
|
| 128 |
5-volt-only, nonvolatile RAM owes it all to polysilicon
|
|
|
1980
|
20 |
5 |
p. 761-
1 p.
|
article
|
| 129 |
Wafer homogeneity tester using variable frequency IR absorption scanning
|
|
|
1980
|
20 |
5 |
p. 760-
1 p.
|
article
|
| 130 |
Wafer stepper steps up yield and resolution in IC lithography
|
|
|
1980
|
20 |
5 |
p. 760-
1 p.
|
article
|
| 131 |
X-ray lithography
|
|
|
1980
|
20 |
5 |
p. 760-
1 p.
|
article
|
| 132 |
X-ray lithography for one micron LSI
|
|
|
1980
|
20 |
5 |
p. 760-
1 p.
|
article
|
Journal description