| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Active trimming of microchip resistors to 0.002%
|
|
|
1978
|
18 |
4 |
p. 320-
1 p.
|
artikel
|
| 2 |
A degradation reliability model
|
|
|
1978
|
18 |
4 |
p. 310-
1 p.
|
artikel
|
| 3 |
A fault tolerant memory for duplex systems
|
|
|
1978
|
18 |
4 |
p. 314-315
2 p.
|
artikel
|
| 4 |
A mathematical approach to reliability evaluation for static generating capacity
|
|
|
1978
|
18 |
4 |
p. 314-
1 p.
|
artikel
|
| 5 |
An algorithm for multiple fault detection in combinational logic networks
|
|
|
1978
|
18 |
4 |
p. 315-
1 p.
|
artikel
|
| 6 |
Analysis of a dynamic redundant system
|
|
|
1978
|
18 |
4 |
p. 309-
1 p.
|
artikel
|
| 7 |
Analysis of volatile contaminants in microcircuits
|
|
|
1978
|
18 |
4 |
p. 317-
1 p.
|
artikel
|
| 8 |
An application of Kalman techniques to estimating availability
|
|
|
1978
|
18 |
4 |
p. 314-
1 p.
|
artikel
|
| 9 |
An evaluation of two model specification techniques for a lognormal distribution
|
|
|
1978
|
18 |
4 |
p. 312-
1 p.
|
artikel
|
| 10 |
A new approach to machine generation of random variables with any distribution
|
|
|
1978
|
18 |
4 |
p. 313-
1 p.
|
artikel
|
| 11 |
A new family of microelectronic packages for avionics
|
|
|
1978
|
18 |
4 |
p. 317-
1 p.
|
artikel
|
| 12 |
A new switching effect in M-I-M thin-film structures at atmospheric pressure
|
|
|
1978
|
18 |
4 |
p. 319-
1 p.
|
artikel
|
| 13 |
Anodic oxidation analysis of thin metallic films and thin-film epitaxy on GaAs
|
|
|
1978
|
18 |
4 |
p. 320-
1 p.
|
artikel
|
| 14 |
Approximate lower confidence limits for the Weibull reliability function
|
|
|
1978
|
18 |
4 |
p. 313-
1 p.
|
artikel
|
| 15 |
A statistical model for early detection of increasing failure rates
|
|
|
1978
|
18 |
4 |
p. 309-
1 p.
|
artikel
|
| 16 |
A thick-film digital potentiometer
|
|
|
1978
|
18 |
4 |
p. 319-
1 p.
|
artikel
|
| 17 |
Automated equipment for 100% inspection of photomasks
|
|
|
1978
|
18 |
4 |
p. 316-
1 p.
|
artikel
|
| 18 |
Automated photomask inspection
|
|
|
1978
|
18 |
4 |
p. 316-317
2 p.
|
artikel
|
| 19 |
Automated photomask inspection
|
|
|
1978
|
18 |
4 |
p. 316-
1 p.
|
artikel
|
| 20 |
Availability of 2-unit system with preventive maintenance and one repair facility
|
|
|
1978
|
18 |
4 |
p. 315-
1 p.
|
artikel
|
| 21 |
Bayesian lower bounds on reliability for the lognormal model
|
|
|
1978
|
18 |
4 |
p. 314-
1 p.
|
artikel
|
| 22 |
Bipolar PROM reliability
|
Hnatek, Eugene R.
|
|
1978
|
18 |
4 |
p. 325-332
8 p.
|
artikel
|
| 23 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1978
|
18 |
4 |
p. 293-295
3 p.
|
artikel
|
| 24 |
Centralized supervisory and control equipment using multimicroprocessor
|
|
|
1978
|
18 |
4 |
p. 315-
1 p.
|
artikel
|
| 25 |
Characterization of electron traps in aluminium-implanted SiO2
|
|
|
1978
|
18 |
4 |
p. 321-
1 p.
|
artikel
|
| 26 |
Common-cause outages in multiple circuit transmission lines
|
|
|
1978
|
18 |
4 |
p. 314-
1 p.
|
artikel
|
| 27 |
Comparison of age, block, and failure replacement policies
|
|
|
1978
|
18 |
4 |
p. 313-
1 p.
|
artikel
|
| 28 |
Complex system reliability with imperfect switching under preemptive-resume repair
|
|
|
1978
|
18 |
4 |
p. 309-
1 p.
|
artikel
|
| 29 |
Computer-graphic design for human performance
|
|
|
1978
|
18 |
4 |
p. 307-
1 p.
|
artikel
|
| 30 |
Computer support in Air Force Maintenance
|
|
|
1978
|
18 |
4 |
p. 311-312
2 p.
|
artikel
|
| 31 |
Correlation between Schottky electron and hole currents from a metal contact on chemically etched silicon
|
|
|
1978
|
18 |
4 |
p. 318-
1 p.
|
artikel
|
| 32 |
Cost and operational effectiveness of R & M improvements
|
|
|
1978
|
18 |
4 |
p. 310-
1 p.
|
artikel
|
| 33 |
Cost effective spares
|
|
|
1978
|
18 |
4 |
p. 314-
1 p.
|
artikel
|
| 34 |
Defining cost-effective system effectiveness and safety programs
|
|
|
1978
|
18 |
4 |
p. 311-
1 p.
|
artikel
|
| 35 |
Detection and diagnosis of software malfunctions
|
Soi, Inder M.
|
|
1978
|
18 |
4 |
p. 353-356
4 p.
|
artikel
|
| 36 |
Determining confidence bounds for highly reliable coherent systems
|
|
|
1978
|
18 |
4 |
p. 310-
1 p.
|
artikel
|
| 37 |
Digital communications systems—Reliability trends
|
|
|
1978
|
18 |
4 |
p. 309-310
2 p.
|
artikel
|
| 38 |
Digital transmission network maintenance aspects
|
|
|
1978
|
18 |
4 |
p. 309-
1 p.
|
artikel
|
| 39 |
Directed graph techniques for the analysis of fault trees
|
|
|
1978
|
18 |
4 |
p. 312-
1 p.
|
artikel
|
| 40 |
Driving optoelectronic devices: Some single-chip solutions
|
|
|
1978
|
18 |
4 |
p. 317-318
2 p.
|
artikel
|
| 41 |
Efficiency contours for estimators of reliability in a 2-parameter exponential failure model
|
|
|
1978
|
18 |
4 |
p. 314-
1 p.
|
artikel
|
| 42 |
Electrically insulative adhesives for hybrid microelectronic fabrication
|
|
|
1978
|
18 |
4 |
p. 320-
1 p.
|
artikel
|
| 43 |
Electronic properties of (100) surfaces of GaSb and InAs and their alloys with GaAs
|
|
|
1978
|
18 |
4 |
p. 318-
1 p.
|
artikel
|
| 44 |
Electrostatic damage in hybrid assemblies
|
|
|
1978
|
18 |
4 |
p. 319-
1 p.
|
artikel
|
| 45 |
Evaluation of a U.K. specification for the procurement of plastic encapsulated semiconductor devices for military use
|
Taylor, C.H.
|
|
1978
|
18 |
4 |
p. 367-377
11 p.
|
artikel
|
| 46 |
Evaluation of LSI/MSI reliability models
|
|
|
1978
|
18 |
4 |
p. 308-
1 p.
|
artikel
|
| 47 |
Failure rate as a design parameter: Possibilities and limitations
|
|
|
1978
|
18 |
4 |
p. 311-
1 p.
|
artikel
|
| 48 |
Fast current pulse m.o.s. deep-depletion technique for profiling thin epitaxial and ion-implanted layers
|
|
|
1978
|
18 |
4 |
p. 321-
1 p.
|
artikel
|
| 49 |
Fatigue failure of encapsulated gold-beam lead and TAB devices
|
|
|
1978
|
18 |
4 |
p. 308-
1 p.
|
artikel
|
| 50 |
Fault detection in combinational circuits using Boolean matrices
|
Rai, Suresh
|
|
1978
|
18 |
4 |
p. 323-324
2 p.
|
artikel
|
| 51 |
Functional testing of positive photoresist for manufacture of film integrated circuits
|
|
|
1978
|
18 |
4 |
p. 317-
1 p.
|
artikel
|
| 52 |
Gang lead bonding equipment, materials and technology
|
|
|
1978
|
18 |
4 |
p. 316-
1 p.
|
artikel
|
| 53 |
Generalized conditional frequency formula
|
Singh, C.
|
|
1978
|
18 |
4 |
p. 351-352
2 p.
|
artikel
|
| 54 |
Group reliability predictions
|
|
|
1978
|
18 |
4 |
p. 314-
1 p.
|
artikel
|
| 55 |
High-speed wiring test system for printed wiring board
|
|
|
1978
|
18 |
4 |
p. 308-
1 p.
|
artikel
|
| 56 |
How bit-slice families compare: Part 1. Evaluating processor elements
|
|
|
1978
|
18 |
4 |
p. 317-
1 p.
|
artikel
|
| 57 |
How to chop cost and increase reliability—Guided projectile style
|
|
|
1978
|
18 |
4 |
p. 310-
1 p.
|
artikel
|
| 58 |
Improving output through job performance evaluation
|
|
|
1978
|
18 |
4 |
p. 307-
1 p.
|
artikel
|
| 59 |
Interpretation of scanning electron microscope measurements of minority carrier diflusion lengths in semiconductors
|
|
|
1978
|
18 |
4 |
p. 318-
1 p.
|
artikel
|
| 60 |
Large-scale integration: Intercontinental aspects
|
|
|
1978
|
18 |
4 |
p. 315-
1 p.
|
artikel
|
| 61 |
Location of trapped charge in aluminum-implanted SiO2
|
|
|
1978
|
18 |
4 |
p. 321-
1 p.
|
artikel
|
| 62 |
Long term commercial warranty
|
|
|
1978
|
18 |
4 |
p. 310-
1 p.
|
artikel
|
| 63 |
Low-frequency conductance of thermally grown SiO2 films
|
|
|
1978
|
18 |
4 |
p. 319-
1 p.
|
artikel
|
| 64 |
Maintainability parameters using the consensus method
|
|
|
1978
|
18 |
4 |
p. 309-
1 p.
|
artikel
|
| 65 |
Man-machine reliability—A practical engineering tool
|
|
|
1978
|
18 |
4 |
p. 307-308
2 p.
|
artikel
|
| 66 |
Mechanism and control of post-trim drift of laser-trimmed thick-film resistors
|
|
|
1978
|
18 |
4 |
p. 320-
1 p.
|
artikel
|
| 67 |
Microcomputer's on-chip functions ease users' programming chores
|
|
|
1978
|
18 |
4 |
p. 318-
1 p.
|
artikel
|
| 68 |
Microprocessor bus standard could cure designers' woes
|
|
|
1978
|
18 |
4 |
p. 317-
1 p.
|
artikel
|
| 69 |
MLA reliability assurance—A continuing program
|
|
|
1978
|
18 |
4 |
p. 310-
1 p.
|
artikel
|
| 70 |
Models for reliability growth during burn-in: Theory and applications
|
|
|
1978
|
18 |
4 |
p. 311-
1 p.
|
artikel
|
| 71 |
New gallium arsenide oxidation technique for microwave technique for microwave integrated circuits
|
|
|
1978
|
18 |
4 |
p. 317-
1 p.
|
artikel
|
| 72 |
New topological formula and rapid algorithm for reliability analysis of complex networks
|
|
|
1978
|
18 |
4 |
p. 309-
1 p.
|
artikel
|
| 73 |
N-type doping of indium phosphide by implantation
|
|
|
1978
|
18 |
4 |
p. 320-
1 p.
|
artikel
|
| 74 |
On linear failure rates
|
|
|
1978
|
18 |
4 |
p. 314-
1 p.
|
artikel
|
| 75 |
Operating history and failure and degradation tendencies
|
|
|
1978
|
18 |
4 |
p. 315-
1 p.
|
artikel
|
| 76 |
Operational reliability of GSAT Earth Station
|
|
|
1978
|
18 |
4 |
p. 312-
1 p.
|
artikel
|
| 77 |
Optimal availability of maintainable systems
|
|
|
1978
|
18 |
4 |
p. 315-
1 p.
|
artikel
|
| 78 |
Optimal reliability allocation by branch-and-bound technique
|
|
|
1978
|
18 |
4 |
p. 313-
1 p.
|
artikel
|
| 79 |
Optimal reliability allocation under preventive maintenance schedule
|
|
|
1978
|
18 |
4 |
p. 312-
1 p.
|
artikel
|
| 80 |
Oriented expitaxial films of (NMP) (TCNQ)
|
|
|
1978
|
18 |
4 |
p. 318-
1 p.
|
artikel
|
| 81 |
Overview of photomask substrate flatness measurement techniques
|
|
|
1978
|
18 |
4 |
p. 316-
1 p.
|
artikel
|
| 82 |
Planning for complete supportability
|
|
|
1978
|
18 |
4 |
p. 311-
1 p.
|
artikel
|
| 83 |
Processing parameters for the diffusion redistribution of boron and phosphorus implanted in silicon
|
|
|
1978
|
18 |
4 |
p. 321-
1 p.
|
artikel
|
| 84 |
Products liability legal issues and technical answers
|
|
|
1978
|
18 |
4 |
p. 307-
1 p.
|
artikel
|
| 85 |
Programming costs—A critical review
|
|
|
1978
|
18 |
4 |
p. 315-316
2 p.
|
artikel
|
| 86 |
Pseudo random access memory system with CCD SR and MOS RAM on a chip
|
|
|
1978
|
18 |
4 |
p. 317-
1 p.
|
artikel
|
| 87 |
Publications, notices, calls for papers, etc.
|
|
|
1978
|
18 |
4 |
p. 297-302
6 p.
|
artikel
|
| 88 |
Quality control in products liability
|
Jacobs, Richard M.
|
|
1978
|
18 |
4 |
p. 347-350
4 p.
|
artikel
|
| 89 |
RAM minimizes risk, resources and schedules
|
|
|
1978
|
18 |
4 |
p. 309-
1 p.
|
artikel
|
| 90 |
Recent patents on microelectronics
|
|
|
1978
|
18 |
4 |
p. 303-306
4 p.
|
artikel
|
| 91 |
Reduced state enumeration—another algorithm for reliability evaluation
|
|
|
1978
|
18 |
4 |
p. 309-
1 p.
|
artikel
|
| 92 |
Reduction of current consumption in CMOS devices
|
|
|
1978
|
18 |
4 |
p. 317-
1 p.
|
artikel
|
| 93 |
Redundancy optimization through simplex pattern search
|
|
|
1978
|
18 |
4 |
p. 309-
1 p.
|
artikel
|
| 94 |
Reliability and availability of two general multi-unit systems
|
|
|
1978
|
18 |
4 |
p. 315-
1 p.
|
artikel
|
| 95 |
Reliability modeling and analysis of fault-tolerant memories
|
|
|
1978
|
18 |
4 |
p. 312-
1 p.
|
artikel
|
| 96 |
Reliability of two dissimilar devices degrading in a periodic alternating sequence—Application to opto-isolators
|
Jordan, A.S.
|
|
1978
|
18 |
4 |
p. 357-366
10 p.
|
artikel
|
| 97 |
Reliability prediction for a pressurized water reactor during the design process
|
|
|
1978
|
18 |
4 |
p. 311-
1 p.
|
artikel
|
| 98 |
Reliability theory of periodically renewed redundant systems
|
|
|
1978
|
18 |
4 |
p. 315-
1 p.
|
artikel
|
| 99 |
Risk reduction by design
|
|
|
1978
|
18 |
4 |
p. 312-
1 p.
|
artikel
|
| 100 |
Shear mode wire failures in plastic-encapsulated transistors
|
|
|
1978
|
18 |
4 |
p. 308-
1 p.
|
artikel
|
| 101 |
Software Quality Assurance for reliable software
|
|
|
1978
|
18 |
4 |
p. 312-
1 p.
|
artikel
|
| 102 |
Some considerations for projection printing with negative photoresist
|
|
|
1978
|
18 |
4 |
p. 316-
1 p.
|
artikel
|
| 103 |
Some inequalities for failure distributions
|
|
|
1978
|
18 |
4 |
p. 313-
1 p.
|
artikel
|
| 104 |
Sputter profiling through Ni/Fe interfaces by Auger electron spectroscopy
|
|
|
1978
|
18 |
4 |
p. 320-
1 p.
|
artikel
|
| 105 |
Statistical model for a failure mode and effects analysis and its application to computer fault-tracing
|
|
|
1978
|
18 |
4 |
p. 313-
1 p.
|
artikel
|
| 106 |
Step-and-repeat wafer imaging
|
|
|
1978
|
18 |
4 |
p. 316-
1 p.
|
artikel
|
| 107 |
Stochastic behaviour of a standby redundant system
|
|
|
1978
|
18 |
4 |
p. 313-
1 p.
|
artikel
|
| 108 |
Studies in cascade reliability—II
|
|
|
1978
|
18 |
4 |
p. 313-314
2 p.
|
artikel
|
| 109 |
Symbolic layout system speeds mask design for ICs
|
|
|
1978
|
18 |
4 |
p. 316-
1 p.
|
artikel
|
| 110 |
System reliability analysis: A tutorial
|
Locks, Mitchell O.
|
|
1978
|
18 |
4 |
p. 335-345
11 p.
|
artikel
|
| 111 |
Taming the all-equipment reliability test
|
|
|
1978
|
18 |
4 |
p. 313-
1 p.
|
artikel
|
| 112 |
Tantalum film capacitors with improved a.c. properties
|
|
|
1978
|
18 |
4 |
p. 319-320
2 p.
|
artikel
|
| 113 |
Test generation system for digital circuits
|
|
|
1978
|
18 |
4 |
p. 317-
1 p.
|
artikel
|
| 114 |
The characteristics of a modified planar-magnetron sputtering source
|
|
|
1978
|
18 |
4 |
p. 320-
1 p.
|
artikel
|
| 115 |
The development of metrics for software R & M
|
|
|
1978
|
18 |
4 |
p. 311-
1 p.
|
artikel
|
| 116 |
The effect of doping profile on the characteristics of buriedchannel charge-coupled devices
|
|
|
1978
|
18 |
4 |
p. 319-
1 p.
|
artikel
|
| 117 |
The energy levels and the defect signature of sulfurimplanted silicon by thermally stimulated measurements
|
|
|
1978
|
18 |
4 |
p. 321-
1 p.
|
artikel
|
| 118 |
The future of the microprocessor
|
|
|
1978
|
18 |
4 |
p. 316-
1 p.
|
artikel
|
| 119 |
The hermeticity hoax
|
|
|
1978
|
18 |
4 |
p. 308-
1 p.
|
artikel
|
| 120 |
Theory of diffusion constant-, lifetime- and surface recombination velocity-measurements with the scanning electron microscope
|
|
|
1978
|
18 |
4 |
p. 318-
1 p.
|
artikel
|
| 121 |
Thermal conductivity variation of silicon with temperature
|
Prakash, Chandra
|
|
1978
|
18 |
4 |
p. 333-
1 p.
|
artikel
|
| 122 |
Thermal design in a hybrid system with high packing density
|
|
|
1978
|
18 |
4 |
p. 319-
1 p.
|
artikel
|
| 123 |
The safe operation of power transistors
|
|
|
1978
|
18 |
4 |
p. 308-
1 p.
|
artikel
|
| 124 |
The swinging door: a first experience in product liability
|
|
|
1978
|
18 |
4 |
p. 311-
1 p.
|
artikel
|
| 125 |
Thin-film capacitors made from TaN films
|
|
|
1978
|
18 |
4 |
p. 319-
1 p.
|
artikel
|
| 126 |
TRC puts most of an rf receiver on single silicon LSI chip
|
|
|
1978
|
18 |
4 |
p. 317-
1 p.
|
artikel
|
| 127 |
Two-dimensional analysis of breakdown in epitaxial planar junctions
|
|
|
1978
|
18 |
4 |
p. 308-
1 p.
|
artikel
|
| 128 |
USAF experience with RIW
|
|
|
1978
|
18 |
4 |
p. 311-
1 p.
|
artikel
|
| 129 |
Vacuum-deposited thin films with specific thickness profiles
|
|
|
1978
|
18 |
4 |
p. 319-
1 p.
|
artikel
|
| 130 |
Why the design nod goes to resistors made as thin-film monolithic networks
|
|
|
1978
|
18 |
4 |
p. 320-
1 p.
|
artikel
|
| 131 |
X-ray lithography system achieves ultrafine resolution
|
|
|
1978
|
18 |
4 |
p. 317-
1 p.
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X-ray photoelectron spectroscopy of SiO2-Si interfacial regions: Ultrathin oxide films
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