| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A basic distributed microcomputer control system
|
|
|
1978
|
17 |
3 |
p. 357-
1 p.
|
artikel
|
| 2 |
Absolute dosimetry of ion implanted impurities using a calorimetric method
|
|
|
1978
|
17 |
3 |
p. 364-
1 p.
|
artikel
|
| 3 |
A case history: procurement of quality plastic encapsulated semiconductors
|
|
|
1978
|
17 |
3 |
p. 351-
1 p.
|
artikel
|
| 4 |
Accurate two-port models for distributed-RC notch filters
|
Kumar, Umesh
|
|
1978
|
17 |
3 |
p. 393-397
5 p.
|
artikel
|
| 5 |
A cold standby redundant system with delayed switchover and preventive maintenance
|
|
|
1978
|
17 |
3 |
p. 352-
1 p.
|
artikel
|
| 6 |
A heuristic method for determining optimal reliability allocation
|
|
|
1978
|
17 |
3 |
p. 353-
1 p.
|
artikel
|
| 7 |
A kinetic study of the incorporation of impurities during the epitaxial growth of silicon
|
|
|
1978
|
17 |
3 |
p. 358-
1 p.
|
artikel
|
| 8 |
A magnetic bubble condensed time-slot interchanging gate
|
|
|
1978
|
17 |
3 |
p. 357-
1 p.
|
artikel
|
| 9 |
A microelectronic active band-pass filter
|
|
|
1978
|
17 |
3 |
p. 357-
1 p.
|
artikel
|
| 10 |
Analysis of the merged charge memory (MCM) cell
|
|
|
1978
|
17 |
3 |
p. 355-
1 p.
|
artikel
|
| 11 |
An application of optimal control theory to repairman problem with machine interference
|
|
|
1978
|
17 |
3 |
p. 354-
1 p.
|
artikel
|
| 12 |
An electron beam gun with a multi-crucible for evaporation in UHV and its characteristics
|
|
|
1978
|
17 |
3 |
p. 364-
1 p.
|
artikel
|
| 13 |
A new generation of large hybrid modules—SLM
|
|
|
1978
|
17 |
3 |
p. 362-
1 p.
|
artikel
|
| 14 |
A new method for recognition of defects in electronic devices
|
|
|
1978
|
17 |
3 |
p. 354-
1 p.
|
artikel
|
| 15 |
A new short channel MOSFET structure (UMOST)
|
|
|
1978
|
17 |
3 |
p. 356-
1 p.
|
artikel
|
| 16 |
An investigation of software reliability models
|
|
|
1978
|
17 |
3 |
p. 354-
1 p.
|
artikel
|
| 17 |
An optical scanning system for semiconductor junction examination
|
Singmin, A.
|
|
1978
|
17 |
3 |
p. 399-402
4 p.
|
artikel
|
| 18 |
A novel FET frequency discriminator
|
|
|
1978
|
17 |
3 |
p. 357-
1 p.
|
artikel
|
| 19 |
Arsenic-doped polycrystalline silicon film for bipolar integrated circuits
|
|
|
1978
|
17 |
3 |
p. 358-
1 p.
|
artikel
|
| 20 |
Assessment of silicone encapsulants for hybrid integrated circuits (HIC)
|
|
|
1978
|
17 |
3 |
p. 362-
1 p.
|
artikel
|
| 21 |
A system for an automatic detection of defects of semiconductor masks and printed circuit boards
|
|
|
1978
|
17 |
3 |
p. 352-
1 p.
|
artikel
|
| 22 |
Automatic electronic component failure-rate prediction with MIL-HDBK-217B
|
|
|
1978
|
17 |
3 |
p. 351-
1 p.
|
artikel
|
| 23 |
Big bubble chips point the way to low-cost memories
|
|
|
1978
|
17 |
3 |
p. 356-
1 p.
|
artikel
|
| 24 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1978
|
17 |
3 |
p. 333-335
3 p.
|
artikel
|
| 25 |
C-MOS converters resolve 12 bits
|
|
|
1978
|
17 |
3 |
p. 356-
1 p.
|
artikel
|
| 26 |
C-MOS gets a rise out of LSI
|
|
|
1978
|
17 |
3 |
p. 358-
1 p.
|
artikel
|
| 27 |
Combining diagnosis and emulation yields fast fault-finding
|
|
|
1978
|
17 |
3 |
p. 352-
1 p.
|
artikel
|
| 28 |
Conduction phenomena in Nb-Nb2O5-Au thin film structures fabricated by various techniques
|
|
|
1978
|
17 |
3 |
p. 363-
1 p.
|
artikel
|
| 29 |
Conduction studies in silicon nitride; dark currents and photocurrents
|
|
|
1978
|
17 |
3 |
p. 361-
1 p.
|
artikel
|
| 30 |
Conference report
|
Jacobs, Richard M
|
|
1978
|
17 |
3 |
p. 343-350
8 p.
|
artikel
|
| 31 |
Cost-optimised burn-in duration for repairable electronic systems
|
|
|
1978
|
17 |
3 |
p. 353-
1 p.
|
artikel
|
| 32 |
Crossover chips for hybrid-integrated film circuits
|
|
|
1978
|
17 |
3 |
p. 363-
1 p.
|
artikel
|
| 33 |
Design and investigation of PCB receptacles for direct plugging of thin-film hybrid circuits
|
|
|
1978
|
17 |
3 |
p. 362-
1 p.
|
artikel
|
| 34 |
Design method for thick film resistors
|
|
|
1978
|
17 |
3 |
p. 362-
1 p.
|
artikel
|
| 35 |
Design of self-checking and fault tolerant microprogrammed controllers
|
|
|
1978
|
17 |
3 |
p. 352-
1 p.
|
artikel
|
| 36 |
Determination of the mass-anistropy exciton splitting in silicon
|
|
|
1978
|
17 |
3 |
p. 359-
1 p.
|
artikel
|
| 37 |
Determining component reliability and redundancy for optimum system reliability
|
|
|
1978
|
17 |
3 |
p. 353-
1 p.
|
artikel
|
| 38 |
Dielectric anomaly in amorphous Si 100−x Au x system
|
|
|
1978
|
17 |
3 |
p. 360-
1 p.
|
artikel
|
| 39 |
Drift of the breakdown voltage in p-n junctions in silicon (walk-out)
|
|
|
1978
|
17 |
3 |
p. 352-
1 p.
|
artikel
|
| 40 |
Dynamic testing of control systems
|
|
|
1978
|
17 |
3 |
p. 356-357
2 p.
|
artikel
|
| 41 |
EBIC—a valuable tool for semiconductor evaluation and failure analysis
|
|
|
1978
|
17 |
3 |
p. 352-
1 p.
|
artikel
|
| 42 |
Effect of heat treatment on electron traps in n-type GaAs
|
|
|
1978
|
17 |
3 |
p. 360-
1 p.
|
artikel
|
| 43 |
Effect of human error on the availability of periodically inspected redundant systems
|
|
|
1978
|
17 |
3 |
p. 351-
1 p.
|
artikel
|
| 44 |
Effects of burn-in and temperature cycling on the corrosion resistance of plastic encapsulated integrated circuits
|
|
|
1978
|
17 |
3 |
p. 351-
1 p.
|
artikel
|
| 45 |
Efficient construction of minimal cut sets from fault trees
|
|
|
1978
|
17 |
3 |
p. 354-
1 p.
|
artikel
|
| 46 |
Electrical properties of thin films—dielectrics. Deposition methods of dielectric films and their electrical properties
|
|
|
1978
|
17 |
3 |
p. 363-
1 p.
|
artikel
|
| 47 |
Electroforming, switching and memory effects in oxide thin films
|
|
|
1978
|
17 |
3 |
p. 361-362
2 p.
|
artikel
|
| 48 |
Electrolytic oxidation of semiconductor surfaces
|
|
|
1978
|
17 |
3 |
p. 361-
1 p.
|
artikel
|
| 49 |
Electron beam scans 2-μm patterns directly on Japanese wafer
|
|
|
1978
|
17 |
3 |
p. 363-364
2 p.
|
artikel
|
| 50 |
Electronic behaviours of the gap states in amorphous semiconductors
|
|
|
1978
|
17 |
3 |
p. 360-
1 p.
|
artikel
|
| 51 |
Etude des processus de depot du silicium en phase gazeuse
|
|
|
1978
|
17 |
3 |
p. 361-
1 p.
|
artikel
|
| 52 |
Even-parity acceptor excited states in Si from bound exciton two hole transitions
|
|
|
1978
|
17 |
3 |
p. 359-360
2 p.
|
artikel
|
| 53 |
Evolution of surface-states density of Si/Wet thermal SiO2 interface during bias-temperature treatment
|
|
|
1978
|
17 |
3 |
p. 358-
1 p.
|
artikel
|
| 54 |
Experimental studies of switching in metal semi-insulating n-p silicon devices
|
|
|
1978
|
17 |
3 |
p. 359-
1 p.
|
artikel
|
| 55 |
Failure analysis techniques applied in resolving hybrid microcircuit reliability problems
|
|
|
1978
|
17 |
3 |
p. 363-
1 p.
|
artikel
|
| 56 |
Ferromagnetic interaction between spins in amorphous Si-Ge films
|
|
|
1978
|
17 |
3 |
p. 360-
1 p.
|
artikel
|
| 57 |
Flex-mount polishing of silicon wafers
|
|
|
1978
|
17 |
3 |
p. 356-
1 p.
|
artikel
|
| 58 |
1/f noise measurements in ion-implanted silicon resistors as a function of the substrate reverse bias voltage
|
|
|
1978
|
17 |
3 |
p. 364-
1 p.
|
artikel
|
| 59 |
1/f noise voltage in a thin film structure
|
|
|
1978
|
17 |
3 |
p. 363-
1 p.
|
artikel
|
| 60 |
Functional decomposition on multi-microprocessor systems
|
|
|
1978
|
17 |
3 |
p. 357-
1 p.
|
artikel
|
| 61 |
Functional modelling of floating substrate MOS structures
|
|
|
1978
|
17 |
3 |
p. 355-
1 p.
|
artikel
|
| 62 |
G-R noise and microscopic defects in irradiated junction field effect transistors
|
|
|
1978
|
17 |
3 |
p. 359-
1 p.
|
artikel
|
| 63 |
Humidity threshold variations for dendrite growth on hybrid substrates
|
|
|
1978
|
17 |
3 |
p. 362-
1 p.
|
artikel
|
| 64 |
Hybrid interconnection of I.C.'s by means of patterns on flexible tape
|
|
|
1978
|
17 |
3 |
p. 363-
1 p.
|
artikel
|
| 65 |
Hydrogen sensitive MOS structures
|
|
|
1978
|
17 |
3 |
p. 351-
1 p.
|
artikel
|
| 66 |
IEDM heralds breakthroughs in LSI fabrication, power discretes
|
|
|
1978
|
17 |
3 |
p. 355-
1 p.
|
artikel
|
| 67 |
Impurity bands in semiconductors in arbitrary magnetic fields
|
|
|
1978
|
17 |
3 |
p. 361-
1 p.
|
artikel
|
| 68 |
Indication of the presence of acceptor states around the Fermi level of amorphous silicon
|
|
|
1978
|
17 |
3 |
p. 361-
1 p.
|
artikel
|
| 69 |
Integrated circuit testing
|
|
|
1978
|
17 |
3 |
p. 352-
1 p.
|
artikel
|
| 70 |
Integrated injection logic using non-optimized processes
|
|
|
1978
|
17 |
3 |
p. 355-356
2 p.
|
artikel
|
| 71 |
Interval reliability and optimum preventive maintenance policy
|
|
|
1978
|
17 |
3 |
p. 354-
1 p.
|
artikel
|
| 72 |
Logic-simulator programs set pace of computer-aided design
|
|
|
1978
|
17 |
3 |
p. 358-
1 p.
|
artikel
|
| 73 |
Mackintosh Yearbook of West European electronics data 1978
|
G.W.A.D.,
|
|
1978
|
17 |
3 |
p. 366-
1 p.
|
artikel
|
| 74 |
Markov processes for reliability analyses of large systems
|
|
|
1978
|
17 |
3 |
p. 352-
1 p.
|
artikel
|
| 75 |
Measurement and interpretation of phosphorus concentration in phosphosilicate glass passivation layers
|
|
|
1978
|
17 |
3 |
p. 359-
1 p.
|
artikel
|
| 76 |
Memory-oriented designs maximise throughout
|
|
|
1978
|
17 |
3 |
p. 358-
1 p.
|
artikel
|
| 77 |
Metastable impurity bands: conduction in Si 1−x Co x and Si 1−x Ni x alloy films
|
|
|
1978
|
17 |
3 |
p. 361-
1 p.
|
artikel
|
| 78 |
Microprocessor device reliability
|
Hnatek, Eugene R.
|
|
1978
|
17 |
3 |
p. 379-385
7 p.
|
artikel
|
| 79 |
Minimum cost systems with specified reliability
|
|
|
1978
|
17 |
3 |
p. 353-
1 p.
|
artikel
|
| 80 |
New materials for low cost thick film circuits
|
|
|
1978
|
17 |
3 |
p. 362-
1 p.
|
artikel
|
| 81 |
New MOS processes set speed, density records
|
|
|
1978
|
17 |
3 |
p. 358-
1 p.
|
artikel
|
| 82 |
Non-equilibrium response of MOS devices to a linear voltage ramp—1. Bulk discrete traps
|
|
|
1978
|
17 |
3 |
p. 360-
1 p.
|
artikel
|
| 83 |
NT2000 coin telephone using microprocessor techniques
|
|
|
1978
|
17 |
3 |
p. 357-
1 p.
|
artikel
|
| 84 |
Nucleation of electron-hole drops in Si
|
|
|
1978
|
17 |
3 |
p. 360-
1 p.
|
artikel
|
| 85 |
Numerical solution of the one-dimensional phenomenological transport equation set in semiconductors
|
|
|
1978
|
17 |
3 |
p. 358-
1 p.
|
artikel
|
| 86 |
OHMIC contacts to low-resistivity ZnS: preparation, noise properties and nature of contact resistance
|
|
|
1978
|
17 |
3 |
p. 359-
1 p.
|
artikel
|
| 87 |
On the nature of photoelectric fatigue in semiconductors
|
|
|
1978
|
17 |
3 |
p. 361-
1 p.
|
artikel
|
| 88 |
On the performance of CCD channel filters for telephone systems
|
|
|
1978
|
17 |
3 |
p. 357-
1 p.
|
artikel
|
| 89 |
Optical emission end-point detecting for monitoring oxygen plasma photoresist stripping
|
|
|
1978
|
17 |
3 |
p. 356-
1 p.
|
artikel
|
| 90 |
Optimal design of a series-parallel system with time-dependent reliability
|
|
|
1978
|
17 |
3 |
p. 354-
1 p.
|
artikel
|
| 91 |
Optimization techniques for system reliability with redundancy—a review
|
|
|
1978
|
17 |
3 |
p. 353-
1 p.
|
artikel
|
| 92 |
Optimum demonstration tests with grouped inspection data from an exponential distribution
|
|
|
1978
|
17 |
3 |
p. 352-
1 p.
|
artikel
|
| 93 |
Optimum preventive maintenance policies for repairable systems
|
|
|
1978
|
17 |
3 |
p. 353-
1 p.
|
artikel
|
| 94 |
Photoelectric scanning of wafer inhomogeneities
|
|
|
1978
|
17 |
3 |
p. 356-
1 p.
|
artikel
|
| 95 |
Photo-excitation of electrons from ionized silver acceptors in silicon
|
|
|
1978
|
17 |
3 |
p. 360-
1 p.
|
artikel
|
| 96 |
Photoionization of acceptors in uniaxially stressed germanium
|
|
|
1978
|
17 |
3 |
p. 358-
1 p.
|
artikel
|
| 97 |
Potential and field distribution in high resistivity microresistors and halltrons for MOS integrated circuits
|
|
|
1978
|
17 |
3 |
p. 356-
1 p.
|
artikel
|
| 98 |
Pragmatic software reliability prediction
|
|
|
1978
|
17 |
3 |
p. 354-
1 p.
|
artikel
|
| 99 |
Preloading compliant bonding tape with beam-lead integrated circuits
|
|
|
1978
|
17 |
3 |
p. 356-
1 p.
|
artikel
|
| 100 |
Preparation of highly photoconductive amorphous silicon by rf sputtering
|
|
|
1978
|
17 |
3 |
p. 361-
1 p.
|
artikel
|
| 101 |
Publications, notices, calls for papers, etc.
|
|
|
1978
|
17 |
3 |
p. 337-341
5 p.
|
artikel
|
| 102 |
Quality assurance in the manufacture of multi-pole connectors
|
|
|
1978
|
17 |
3 |
p. 351-
1 p.
|
artikel
|
| 103 |
Quantized feedback takes its place in analog-to-digital conversion
|
|
|
1978
|
17 |
3 |
p. 358-
1 p.
|
artikel
|
| 104 |
Raising yield and throughput in front-end wafer processing
|
|
|
1978
|
17 |
3 |
p. 356-
1 p.
|
artikel
|
| 105 |
Redundant systems with appreciable exchange time
|
|
|
1978
|
17 |
3 |
p. 353-354
2 p.
|
artikel
|
| 106 |
Relationship between disk diameter, chip surface, degree of integration, efficiency and quota of cost in LSI circuits
|
|
|
1978
|
17 |
3 |
p. 357-
1 p.
|
artikel
|
| 107 |
Reliability optimization in telephone switching systems design
|
|
|
1978
|
17 |
3 |
p. 352-
1 p.
|
artikel
|
| 108 |
Reliability reporting guide
|
G.W.A.D.,
|
|
1978
|
17 |
3 |
p. 365-366
2 p.
|
artikel
|
| 109 |
Reliability testing and screening: A general review paper
|
Ryerson, C.M.
|
|
1978
|
17 |
3 |
p. 367-377
11 p.
|
artikel
|
| 110 |
Resistor stability and power dissipation
|
|
|
1978
|
17 |
3 |
p. 362-
1 p.
|
artikel
|
| 111 |
Safe opening area for bipolar transistors
|
|
|
1978
|
17 |
3 |
p. 357-
1 p.
|
artikel
|
| 112 |
Selected bibliography on integrated injection logic (I2L)/merged transistor logic (MTL) technology
|
|
|
1978
|
17 |
3 |
p. 355-
1 p.
|
artikel
|
| 113 |
Single crystal silicon photocells for terrestrial use: state of the art and future prospects
|
|
|
1978
|
17 |
3 |
p. 360-
1 p.
|
artikel
|
| 114 |
Some graphical methods for maintenance planning
|
|
|
1978
|
17 |
3 |
p. 355-
1 p.
|
artikel
|
| 115 |
Some theoretical bases of error analysis in analogue circuits
|
|
|
1978
|
17 |
3 |
p. 354-
1 p.
|
artikel
|
| 116 |
System 250—a fault-tolerant, modular processing system for control applications
|
|
|
1978
|
17 |
3 |
p. 353-
1 p.
|
artikel
|
| 117 |
Techniques for servicing LSI-based gear evolve
|
|
|
1978
|
17 |
3 |
p. 353-
1 p.
|
artikel
|
| 118 |
The CCDs future takes on a bright hue
|
|
|
1978
|
17 |
3 |
p. 355-
1 p.
|
artikel
|
| 119 |
The confidence in reliability predictions
|
|
|
1978
|
17 |
3 |
p. 354-
1 p.
|
artikel
|
| 120 |
The dependence of CCD dark current upon power dissipation
|
Mavor, J.
|
|
1978
|
17 |
3 |
p. 403-404
2 p.
|
artikel
|
| 121 |
The development of the voltage-to-current transactor (VCT)
|
|
|
1978
|
17 |
3 |
p. 357-
1 p.
|
artikel
|
| 122 |
The dopant density and temperature dependence of electron mobility and resistivity in n-type silicon
|
|
|
1978
|
17 |
3 |
p. 361-
1 p.
|
artikel
|
| 123 |
The effect of low-temperature annealing upon the structure and electrical characteristics of rectifying nickel-silicon contacts
|
|
|
1978
|
17 |
3 |
p. 361-
1 p.
|
artikel
|
| 124 |
The highest and lowest reliability achievable with redundancy
|
|
|
1978
|
17 |
3 |
p. 353-
1 p.
|
artikel
|
| 125 |
The implications of microprocessor architecture on speed, programming and memory size
|
|
|
1978
|
17 |
3 |
p. 356-
1 p.
|
artikel
|
| 126 |
The influence of surface recombination on some properties of semiconductor devices—steady-state relationships
|
|
|
1978
|
17 |
3 |
p. 359-
1 p.
|
artikel
|
| 127 |
The lateral diffusion of boron in polycrystalline silicon and its influence on the fabrication of sub-micron MOSTs
|
|
|
1978
|
17 |
3 |
p. 359-
1 p.
|
artikel
|
| 128 |
The method of stages for non-Markov models
|
|
|
1978
|
17 |
3 |
p. 354-
1 p.
|
artikel
|
| 129 |
The neutral vacancy in silicon and diamond: generalized valence bond studies
|
|
|
1978
|
17 |
3 |
p. 362-
1 p.
|
artikel
|
| 130 |
The particulate matter in semiconductor chemicals
|
|
|
1978
|
17 |
3 |
p. 356-
1 p.
|
artikel
|
| 131 |
The present state, future and possibilities or application of the principles of magnetic bubble memories
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|
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1978
|
17 |
3 |
p. 355-
1 p.
|
artikel
|
| 132 |
Thermal fatigue failure of soft-soldered contacts to silicon power transistors
|
|
|
1978
|
17 |
3 |
p. 351-352
2 p.
|
artikel
|
| 133 |
Thermionic-field emission through silicon Schottky barriers at room temperature
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|
|
1978
|
17 |
3 |
p. 360-
1 p.
|
artikel
|
| 134 |
Thickness dependent effects of thermal ageing in thin conductive films
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|
|
1978
|
17 |
3 |
p. 363-
1 p.
|
artikel
|
| 135 |
Thirty LED pointer-display rigfet chip
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|
|
1978
|
17 |
3 |
p. 357-358
2 p.
|
artikel
|
| 136 |
US Army Panama field test of plastic encapsulated devices
|
Hakim, Edward B.
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1978
|
17 |
3 |
p. 387-392
6 p.
|
artikel
|
| 137 |
V-groove MOS (VMOS) enhancement lead logic
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|
|
1978
|
17 |
3 |
p. 355-
1 p.
|
artikel
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