| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A bibliography on electron beam induced current analysis of semiconductor devices
|
|
|
1977
|
16 |
5 |
p. 553-
1 p.
|
artikel
|
| 2 |
A computer algorithm for accurate and repeatable profile analysis using anodization and stripping of silicon
|
|
|
1977
|
16 |
5 |
p. 553-
1 p.
|
artikel
|
| 3 |
A cost effective approach to weapon acceptance
|
|
|
1977
|
16 |
5 |
p. 547-
1 p.
|
artikel
|
| 4 |
Advances in film extend component capabilities
|
|
|
1977
|
16 |
5 |
p. 557-
1 p.
|
artikel
|
| 5 |
AECL's reliability and maintainability program
|
|
|
1977
|
16 |
5 |
p. 548-
1 p.
|
artikel
|
| 6 |
AFSATCOM terminal segment reliability test program
|
|
|
1977
|
16 |
5 |
p. 549-
1 p.
|
artikel
|
| 7 |
Aluminium corrosion in the presence of phosphosilicate glass and moisture
|
|
|
1977
|
16 |
5 |
p. 554-
1 p.
|
artikel
|
| 8 |
A mathematical study of space-charge layer capacitance for an abrupt p-n semiconductor junction
|
|
|
1977
|
16 |
5 |
p. 556-
1 p.
|
artikel
|
| 9 |
AMIS: a sharp eye on integrated-circuit masks
|
|
|
1977
|
16 |
5 |
p. 553-
1 p.
|
artikel
|
| 10 |
A multi-state system model
|
|
|
1977
|
16 |
5 |
p. 550-
1 p.
|
artikel
|
| 11 |
Analysis of non-catastrophic failures in electronic devices due to random noise
|
Prakash, Chandra
|
|
1977
|
16 |
5 |
p. 587-588
2 p.
|
artikel
|
| 12 |
An approach for determining optimum RAM requirements
|
|
|
1977
|
16 |
5 |
p. 555-
1 p.
|
artikel
|
| 13 |
An engineering approach to the availability evaluation of complex systems
|
|
|
1977
|
16 |
5 |
p. 549-
1 p.
|
artikel
|
| 14 |
An ion implanted bipolar silicon integrated circuit process
|
|
|
1977
|
16 |
5 |
p. 558-
1 p.
|
artikel
|
| 15 |
A note on a four-state system
|
|
|
1977
|
16 |
5 |
p. 547-
1 p.
|
artikel
|
| 16 |
An X-ray fluorescence technique for the rapid determination of phosphorous in PSG film
|
|
|
1977
|
16 |
5 |
p. 553-
1 p.
|
artikel
|
| 17 |
Application of tape automated bonding technology to hybrid microcircuits
|
|
|
1977
|
16 |
5 |
p. 558-
1 p.
|
artikel
|
| 18 |
A probabilistic approach to design for the ECCS of a PWR
|
|
|
1977
|
16 |
5 |
p. 552-
1 p.
|
artikel
|
| 19 |
A reliability incentive based bid decision
|
|
|
1977
|
16 |
5 |
p. 548-
1 p.
|
artikel
|
| 20 |
ARIES—an automated reliability estimation system for redundant digital structures
|
|
|
1977
|
16 |
5 |
p. 551-
1 p.
|
artikel
|
| 21 |
A test approach for commercial communication satellites
|
|
|
1977
|
16 |
5 |
p. 552-
1 p.
|
artikel
|
| 22 |
Avionic reliability experience. AR-104 and 7818
|
|
|
1977
|
16 |
5 |
p. 550-551
2 p.
|
artikel
|
| 23 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1977
|
16 |
5 |
p. 527-529
3 p.
|
artikel
|
| 24 |
Charge pumping effect and its application in the MOS transistors investigations
|
|
|
1977
|
16 |
5 |
p. 556-
1 p.
|
artikel
|
| 25 |
Color TV fires: a persistent problem
|
|
|
1977
|
16 |
5 |
p. 549-
1 p.
|
artikel
|
| 26 |
Comments on a paper by melia
|
Harrett, T.
|
|
1977
|
16 |
5 |
p. 605-
1 p.
|
artikel
|
| 27 |
Common mode failure analysis of reliability networks
|
|
|
1977
|
16 |
5 |
p. 547-
1 p.
|
artikel
|
| 28 |
Comparison of availability results evaluated by numerical and analytical methods for the exponential case
|
Basker, B.A.
|
|
1977
|
16 |
5 |
p. 567-569
3 p.
|
artikel
|
| 29 |
Component reliability exposed to thermal neutron environment—II
|
Lal, Krishan
|
|
1977
|
16 |
5 |
p. 583-585
3 p.
|
artikel
|
| 30 |
Conductivity of complementary error function n-type diffused layers in gallium arsenide
|
|
|
1977
|
16 |
5 |
p. 556-
1 p.
|
artikel
|
| 31 |
Contamination in solder baths
|
|
|
1977
|
16 |
5 |
p. 546-
1 p.
|
artikel
|
| 32 |
Contour maps reveal non-uniformity in semiconductor processing
|
|
|
1977
|
16 |
5 |
p. 553-
1 p.
|
artikel
|
| 33 |
Controlling switching supplies with LSI circuits
|
|
|
1977
|
16 |
5 |
p. 555-
1 p.
|
artikel
|
| 34 |
Copperhead design to unit production cost
|
|
|
1977
|
16 |
5 |
p. 552-
1 p.
|
artikel
|
| 35 |
Diffusivity of charged carriers in semiconductors in strong electric fields
|
|
|
1977
|
16 |
5 |
p. 556-
1 p.
|
artikel
|
| 36 |
Dormancy effects on nonelectronics
|
|
|
1977
|
16 |
5 |
p. 546-
1 p.
|
artikel
|
| 37 |
Duane growth model: estimation of final MTBF with confidence limits using a hand calculator
|
|
|
1977
|
16 |
5 |
p. 550-
1 p.
|
artikel
|
| 38 |
Effective masses in (100) silicon inversion layers
|
|
|
1977
|
16 |
5 |
p. 557-
1 p.
|
artikel
|
| 39 |
Effectiveness of reliability system testing on quality and reliability
|
|
|
1977
|
16 |
5 |
p. 552-
1 p.
|
artikel
|
| 40 |
Effect of heat treatment on chemical and electronic structure of solid SiO; an electron spectroscopy study
|
|
|
1977
|
16 |
5 |
p. 556-
1 p.
|
artikel
|
| 41 |
Effects of temperature on avionics reliability
|
|
|
1977
|
16 |
5 |
p. 552-
1 p.
|
artikel
|
| 42 |
Electrical properties of Cd x Hg 1−x Te thin films for hall effect device applications
|
|
|
1977
|
16 |
5 |
p. 557-
1 p.
|
artikel
|
| 43 |
Electron-beam lithography draws a finer line
|
|
|
1977
|
16 |
5 |
p. 554-
1 p.
|
artikel
|
| 44 |
Electron states at steps in semiconductor surfaces
|
|
|
1977
|
16 |
5 |
p. 557-
1 p.
|
artikel
|
| 45 |
Failure analysis methods
|
|
|
1977
|
16 |
5 |
p. 549-
1 p.
|
artikel
|
| 46 |
Fault diagnosis in sequential circuits
|
|
|
1977
|
16 |
5 |
p. 549-550
2 p.
|
artikel
|
| 47 |
Fault tree analysis—an efficient reduction algorithm
|
|
|
1977
|
16 |
5 |
p. 549-
1 p.
|
artikel
|
| 48 |
Field Trial experience with PCM exchanges
|
|
|
1977
|
16 |
5 |
p. 548-549
2 p.
|
artikel
|
| 49 |
Flight inspection data and crack initiation times
|
|
|
1977
|
16 |
5 |
p. 551-
1 p.
|
artikel
|
| 50 |
GaAs planar Gunn devices with sulfur-ion implanted n layers
|
|
|
1977
|
16 |
5 |
p. 559-
1 p.
|
artikel
|
| 51 |
Generation of reliability and safety data by analysis of expert opinions
|
|
|
1977
|
16 |
5 |
p. 551-
1 p.
|
artikel
|
| 52 |
Implementation of the Anik satellite product assurance requirements
|
|
|
1977
|
16 |
5 |
p. 549-
1 p.
|
artikel
|
| 53 |
Increased reliability of communication networks by distributing connections to transmission paths independent on one another
|
|
|
1977
|
16 |
5 |
p. 547-
1 p.
|
artikel
|
| 54 |
Influence of ion sputtering and etching on the surface potential of passivated silicon
|
|
|
1977
|
16 |
5 |
p. 558-
1 p.
|
artikel
|
| 55 |
Integrated circuit regulators
|
|
|
1977
|
16 |
5 |
p. 555-
1 p.
|
artikel
|
| 56 |
16-k RAM eases memory design for mainframes and microcomputers
|
|
|
1977
|
16 |
5 |
p. 555-
1 p.
|
artikel
|
| 57 |
Large-scale integration is ready to answer the call of telecommunications
|
|
|
1977
|
16 |
5 |
p. 555-
1 p.
|
artikel
|
| 58 |
Launch risk analysis
|
|
|
1977
|
16 |
5 |
p. 551-552
2 p.
|
artikel
|
| 59 |
Literature survey on three-state device reliability systems
|
Dhillon, Balbir S.
|
|
1977
|
16 |
5 |
p. 601-602
2 p.
|
artikel
|
| 60 |
Low noise “OHMIC” contacts on n-type silicon
|
|
|
1977
|
16 |
5 |
p. 554-
1 p.
|
artikel
|
| 61 |
Low pressure CVD production processes for poly, nitride and oxide
|
|
|
1977
|
16 |
5 |
p. 554-
1 p.
|
artikel
|
| 62 |
LSI and analog signal processing—Some examples of problems and their solution
|
|
|
1977
|
16 |
5 |
p. 603-604
2 p.
|
artikel
|
| 63 |
LSI controls gaining in home appliances
|
|
|
1977
|
16 |
5 |
p. 555-
1 p.
|
artikel
|
| 64 |
Magnetron sputtering of SiO2 an alternative to chemical vapor deposition
|
|
|
1977
|
16 |
5 |
p. 554-
1 p.
|
artikel
|
| 65 |
Masks for printing thick-film circuits
|
|
|
1977
|
16 |
5 |
p. 554-
1 p.
|
artikel
|
| 66 |
Measurement of the barrier height ΦB of SiSnO2 heterojunction by the high-frequency capacitance method
|
|
|
1977
|
16 |
5 |
p. 555-
1 p.
|
artikel
|
| 67 |
Measurement of the resistivity of a thin square sample with a square four-probe array
|
|
|
1977
|
16 |
5 |
p. 555-
1 p.
|
artikel
|
| 68 |
Measurements of low-frequency noise and surface state concentration in MOS transistors
|
|
|
1977
|
16 |
5 |
p. 556-
1 p.
|
artikel
|
| 69 |
Micro-APP: a building block for low-cost high-speed associative parallel processing
|
|
|
1977
|
16 |
5 |
p. 553-
1 p.
|
artikel
|
| 70 |
Microprocessor development equipment
|
|
|
1977
|
16 |
5 |
p. 553-
1 p.
|
artikel
|
| 71 |
Microwave field-effect transistors from sulphur-implanted GaAs
|
|
|
1977
|
16 |
5 |
p. 559-
1 p.
|
artikel
|
| 72 |
Microwave hot electron effects in semiconductor quantized inversion layers
|
|
|
1977
|
16 |
5 |
p. 557-
1 p.
|
artikel
|
| 73 |
MIL-STD-781
|
|
|
1977
|
16 |
5 |
p. 548-
1 p.
|
artikel
|
| 74 |
MOSPOWER—The challenge to power bipolars
|
Jenkins, J.O.M.
|
|
1977
|
16 |
5 |
p. 607-616
10 p.
|
artikel
|
| 75 |
Multilayered ion-implanted Baritt diodes with improved efficiency
|
|
|
1977
|
16 |
5 |
p. 559-
1 p.
|
artikel
|
| 76 |
Net negative charge of electron-hole drops in germanium
|
|
|
1977
|
16 |
5 |
p. 556-
1 p.
|
artikel
|
| 77 |
New analogue component concepts for digital processing systems
|
|
|
1977
|
16 |
5 |
p. 550-
1 p.
|
artikel
|
| 78 |
Nuclear power plant reliability audits
|
|
|
1977
|
16 |
5 |
p. 552-
1 p.
|
artikel
|
| 79 |
Optically induced charge storage in ion implanted SiO2
|
|
|
1977
|
16 |
5 |
p. 559-
1 p.
|
artikel
|
| 80 |
Optically induced electron spin resonance in doped amorphous silicon
|
|
|
1977
|
16 |
5 |
p. 556-557
2 p.
|
artikel
|
| 81 |
Optical MTF evaluation techniques for microelectronic printers
|
|
|
1977
|
16 |
5 |
p. 553-
1 p.
|
artikel
|
| 82 |
Optimum number of checks in checking policy
|
Yamada, Shigeru
|
|
1977
|
16 |
5 |
p. 589-591
3 p.
|
artikel
|
| 83 |
Optimum test samples for reliability improvement
|
|
|
1977
|
16 |
5 |
p. 546-
1 p.
|
artikel
|
| 84 |
Photoresist scumming. Part 1. The nature of negative photoresist scumming
|
|
|
1977
|
16 |
5 |
p. 553-
1 p.
|
artikel
|
| 85 |
Planning statistical experimental designs in R & M applications
|
|
|
1977
|
16 |
5 |
p. 550-
1 p.
|
artikel
|
| 86 |
Possibility of application of thin Pb 1−x Sn x Te films as the mechanical stress transducers
|
|
|
1977
|
16 |
5 |
p. 558-
1 p.
|
artikel
|
| 87 |
Prediction of software failures
|
|
|
1977
|
16 |
5 |
p. 547-548
2 p.
|
artikel
|
| 88 |
Problems and solutions in the preparation of SOS wafers
|
|
|
1977
|
16 |
5 |
p. 553-
1 p.
|
artikel
|
| 89 |
Product liability and its effect on engineering practice
|
|
|
1977
|
16 |
5 |
p. 550-
1 p.
|
artikel
|
| 90 |
Properties of a giant electron-hole drop in germanium
|
|
|
1977
|
16 |
5 |
p. 556-
1 p.
|
artikel
|
| 91 |
Publications, notices, calls for papers, etc.
|
|
|
1977
|
16 |
5 |
p. 531-537
7 p.
|
artikel
|
| 92 |
Pulse measurements of channel conductance in MOS transistors
|
|
|
1977
|
16 |
5 |
p. 556-
1 p.
|
artikel
|
| 93 |
RA system using process failure analysis for ICs
|
|
|
1977
|
16 |
5 |
p. 546-
1 p.
|
artikel
|
| 94 |
Recent patents on microelectronics
|
|
|
1977
|
16 |
5 |
p. 539-543
5 p.
|
artikel
|
| 95 |
Reduced lateral diffusion and reverse leakage in Beimplanted GaAs 1−x P x diodes
|
|
|
1977
|
16 |
5 |
p. 558-
1 p.
|
artikel
|
| 96 |
Reduced support costs for shipboard electronic systems
|
|
|
1977
|
16 |
5 |
p. 552-
1 p.
|
artikel
|
| 97 |
Reducing solder shorts in wave soldering
|
|
|
1977
|
16 |
5 |
p. 546-
1 p.
|
artikel
|
| 98 |
Regrowth kinetics of amorphous Ge layers created by 74Ge and 28Si implantation of Ge crystals
|
|
|
1977
|
16 |
5 |
p. 558-
1 p.
|
artikel
|
| 99 |
Regulatory requirements and product assurances
|
|
|
1977
|
16 |
5 |
p. 545-
1 p.
|
artikel
|
| 100 |
Relaxation of (111) silicon surface atoms from studies of Si4H9 clusters
|
|
|
1977
|
16 |
5 |
p. 556-
1 p.
|
artikel
|
| 101 |
Reliability analysis of logic circuits
|
|
|
1977
|
16 |
5 |
p. 549-
1 p.
|
artikel
|
| 102 |
Reliability and maintainability in nuclear power generation—viewpoint of a utility
|
|
|
1977
|
16 |
5 |
p. 549-
1 p.
|
artikel
|
| 103 |
Reliability and maintainability of television receivers
|
|
|
1977
|
16 |
5 |
p. 548-
1 p.
|
artikel
|
| 104 |
Reliability assessment for heavy machinery by “HI-FMECA” Method
|
|
|
1977
|
16 |
5 |
p. 552-
1 p.
|
artikel
|
| 105 |
Reliability, availability, maintainability/logistics (RAM/LOG)
|
|
|
1977
|
16 |
5 |
p. 547-
1 p.
|
artikel
|
| 106 |
Reliability evaluation of integrated circuits
|
|
|
1977
|
16 |
5 |
p. 546-
1 p.
|
artikel
|
| 107 |
Reliability improvement by redundancy voting in analogue electronic systems
|
Klaassen, K.B.
|
|
1977
|
16 |
5 |
p. 593-600
8 p.
|
artikel
|
| 108 |
Reliability improvement warranty (RIW) and the Army lightweight Doppler navigation system (LDNS)
|
|
|
1977
|
16 |
5 |
p. 550-
1 p.
|
artikel
|
| 109 |
Reliability improvement warranty techniques and applications
|
|
|
1977
|
16 |
5 |
p. 550-
1 p.
|
artikel
|
| 110 |
Reliability in the electronics manufacturing phase
|
|
|
1977
|
16 |
5 |
p. 545-
1 p.
|
artikel
|
| 111 |
Reliability model for electronic cooling blowers
|
|
|
1977
|
16 |
5 |
p. 545-
1 p.
|
artikel
|
| 112 |
Reliability prediction of hairpin-type springs
|
|
|
1977
|
16 |
5 |
p. 545-
1 p.
|
artikel
|
| 113 |
RGB colour decoder using three ICs from the TDA2500 range
|
|
|
1977
|
16 |
5 |
p. 555-
1 p.
|
artikel
|
| 114 |
Rheology and modelling of the spin coating process
|
|
|
1977
|
16 |
5 |
p. 554-
1 p.
|
artikel
|
| 115 |
Satellite Reliability, a users point of view
|
|
|
1977
|
16 |
5 |
p. 549-
1 p.
|
artikel
|
| 116 |
Screening procedure for adhesion degradation due to solder leaching in thick-film hybrid microcircuits
|
|
|
1977
|
16 |
5 |
p. 557-
1 p.
|
artikel
|
| 117 |
Sheet resistivity for planar process control
|
|
|
1977
|
16 |
5 |
p. 556-
1 p.
|
artikel
|
| 118 |
Simulating maintenance work in an engineering firm: A case study
|
Basker, B.A.
|
|
1977
|
16 |
5 |
p. 571-581
11 p.
|
artikel
|
| 119 |
Single-slice superhet
|
|
|
1977
|
16 |
5 |
p. 555-
1 p.
|
artikel
|
| 120 |
Some investigations on secondary breakdown in p-n junctions considering the effect of thermally generated carriers
|
|
|
1977
|
16 |
5 |
p. 555-
1 p.
|
artikel
|
| 121 |
Sound velocity in amorphous Ge and Si
|
|
|
1977
|
16 |
5 |
p. 556-
1 p.
|
artikel
|
| 122 |
Space transportation system payload safety policy
|
|
|
1977
|
16 |
5 |
p. 551-
1 p.
|
artikel
|
| 123 |
Statistical methods for estimating variance components for integrated circuits device parameters
|
Retajczyk Jr., T.F.
|
|
1977
|
16 |
5 |
p. 561-566
6 p.
|
artikel
|
| 124 |
Strahlungsbelastungs-Untersuchungen an elektronischen Bauelementen des Symphonie-Satelliten
|
|
|
1977
|
16 |
5 |
p. 550-
1 p.
|
artikel
|
| 125 |
Surface state excitons in semiconductors
|
|
|
1977
|
16 |
5 |
p. 556-
1 p.
|
artikel
|
| 126 |
System probabilistic studies at the nuclear regulatory commission
|
|
|
1977
|
16 |
5 |
p. 552-
1 p.
|
artikel
|
| 127 |
Technical problem management
|
|
|
1977
|
16 |
5 |
p. 545-
1 p.
|
artikel
|
| 128 |
The DryOx process for etching silicon dioxide
|
|
|
1977
|
16 |
5 |
p. 554-
1 p.
|
artikel
|
| 129 |
The effect of film thickness on certain properties of Cr-SiO cermet thin films
|
|
|
1977
|
16 |
5 |
p. 557-
1 p.
|
artikel
|
| 130 |
The life cycle cost impacts of unsafe designs
|
|
|
1977
|
16 |
5 |
p. 546-547
2 p.
|
artikel
|
| 131 |
The repair or modification of pads, tracks and plated-thru holes on PCB's
|
|
|
1977
|
16 |
5 |
p. 546-
1 p.
|
artikel
|
| 132 |
The roughness parameters of glass films
|
|
|
1977
|
16 |
5 |
p. 558-
1 p.
|
artikel
|
| 133 |
Thin film resistor networks in hybrid circuits
|
|
|
1977
|
16 |
5 |
p. 557-
1 p.
|
artikel
|
| 134 |
Thin silicon ion-implanted p-i-n photodiodes
|
|
|
1977
|
16 |
5 |
p. 558-559
2 p.
|
artikel
|
| 135 |
TMS 9940 — Single chip microcomputer
|
Bryant, John D.
|
|
1977
|
16 |
5 |
p. 617-626
10 p.
|
artikel
|
| 136 |
Travelling-wave tube reliability estimates, life tests and space flight experience
|
|
|
1977
|
16 |
5 |
p. 546-
1 p.
|
artikel
|
| 137 |
Ultrasonic wire welding. Part 1—Wedge-wedge bonding of aluminium wires
|
|
|
1977
|
16 |
5 |
p. 554-
1 p.
|
artikel
|
| 138 |
Weapon system parametric life cycle cost analysis
|
|
|
1977
|
16 |
5 |
p. 552-
1 p.
|
artikel
|
| 139 |
Wear reliability of aircraft splines
|
|
|
1977
|
16 |
5 |
p. 551-
1 p.
|
artikel
|
| 140 |
Where there's smoke, there will be an IC
|
|
|
1977
|
16 |
5 |
p. 555-
1 p.
|
artikel
|
Tijdschrift beschrijving