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                             140 results found
no title author magazine year volume issue page(s) type
1 A bibliography on electron beam induced current analysis of semiconductor devices 1977
 16 5 p. 553-
1 p.
 article
2 A computer algorithm for accurate and repeatable profile analysis using anodization and stripping of silicon 1977
 16 5 p. 553-
1 p.
 article
3 A cost effective approach to weapon acceptance 1977
 16 5 p. 547-
1 p.
 article
4 Advances in film extend component capabilities 1977
 16 5 p. 557-
1 p.
 article
5 AECL's reliability and maintainability program 1977
 16 5 p. 548-
1 p.
 article
6 AFSATCOM terminal segment reliability test program 1977
 16 5 p. 549-
1 p.
 article
7 Aluminium corrosion in the presence of phosphosilicate glass and moisture 1977
 16 5 p. 554-
1 p.
 article
8 A mathematical study of space-charge layer capacitance for an abrupt p-n semiconductor junction 1977
 16 5 p. 556-
1 p.
 article
9 AMIS: a sharp eye on integrated-circuit masks 1977
 16 5 p. 553-
1 p.
 article
10 A multi-state system model 1977
 16 5 p. 550-
1 p.
 article
11 Analysis of non-catastrophic failures in electronic devices due to random noise Prakash, Chandra
 1977
 16 5 p. 587-588
2 p.
 article
12 An approach for determining optimum RAM requirements 1977
 16 5 p. 555-
1 p.
 article
13 An engineering approach to the availability evaluation of complex systems 1977
 16 5 p. 549-
1 p.
 article
14 An ion implanted bipolar silicon integrated circuit process 1977
 16 5 p. 558-
1 p.
 article
15 A note on a four-state system 1977
 16 5 p. 547-
1 p.
 article
16 An X-ray fluorescence technique for the rapid determination of phosphorous in PSG film 1977
 16 5 p. 553-
1 p.
 article
17 Application of tape automated bonding technology to hybrid microcircuits 1977
 16 5 p. 558-
1 p.
 article
18 A probabilistic approach to design for the ECCS of a PWR 1977
 16 5 p. 552-
1 p.
 article
19 A reliability incentive based bid decision 1977
 16 5 p. 548-
1 p.
 article
20 ARIES—an automated reliability estimation system for redundant digital structures 1977
 16 5 p. 551-
1 p.
 article
21 A test approach for commercial communication satellites 1977
 16 5 p. 552-
1 p.
 article
22 Avionic reliability experience. AR-104 and 7818 1977
 16 5 p. 550-551
2 p.
 article
23 Calendar of international conferences, symposia, lectures and meetings of interest 1977
 16 5 p. 527-529
3 p.
 article
24 Charge pumping effect and its application in the MOS transistors investigations 1977
 16 5 p. 556-
1 p.
 article
25 Color TV fires: a persistent problem 1977
 16 5 p. 549-
1 p.
 article
26 Comments on a paper by melia Harrett, T.
 1977
 16 5 p. 605-
1 p.
 article
27 Common mode failure analysis of reliability networks 1977
 16 5 p. 547-
1 p.
 article
28 Comparison of availability results evaluated by numerical and analytical methods for the exponential case Basker, B.A.
 1977
 16 5 p. 567-569
3 p.
 article
29 Component reliability exposed to thermal neutron environment—II Lal, Krishan
 1977
 16 5 p. 583-585
3 p.
 article
30 Conductivity of complementary error function n-type diffused layers in gallium arsenide 1977
 16 5 p. 556-
1 p.
 article
31 Contamination in solder baths 1977
 16 5 p. 546-
1 p.
 article
32 Contour maps reveal non-uniformity in semiconductor processing 1977
 16 5 p. 553-
1 p.
 article
33 Controlling switching supplies with LSI circuits 1977
 16 5 p. 555-
1 p.
 article
34 Copperhead design to unit production cost 1977
 16 5 p. 552-
1 p.
 article
35 Diffusivity of charged carriers in semiconductors in strong electric fields 1977
 16 5 p. 556-
1 p.
 article
36 Dormancy effects on nonelectronics 1977
 16 5 p. 546-
1 p.
 article
37 Duane growth model: estimation of final MTBF with confidence limits using a hand calculator 1977
 16 5 p. 550-
1 p.
 article
38 Effective masses in (100) silicon inversion layers 1977
 16 5 p. 557-
1 p.
 article
39 Effectiveness of reliability system testing on quality and reliability 1977
 16 5 p. 552-
1 p.
 article
40 Effect of heat treatment on chemical and electronic structure of solid SiO; an electron spectroscopy study 1977
 16 5 p. 556-
1 p.
 article
41 Effects of temperature on avionics reliability 1977
 16 5 p. 552-
1 p.
 article
42 Electrical properties of Cd x Hg 1−x Te thin films for hall effect device applications 1977
 16 5 p. 557-
1 p.
 article
43 Electron-beam lithography draws a finer line 1977
 16 5 p. 554-
1 p.
 article
44 Electron states at steps in semiconductor surfaces 1977
 16 5 p. 557-
1 p.
 article
45 Failure analysis methods 1977
 16 5 p. 549-
1 p.
 article
46 Fault diagnosis in sequential circuits 1977
 16 5 p. 549-550
2 p.
 article
47 Fault tree analysis—an efficient reduction algorithm 1977
 16 5 p. 549-
1 p.
 article
48 Field Trial experience with PCM exchanges 1977
 16 5 p. 548-549
2 p.
 article
49 Flight inspection data and crack initiation times 1977
 16 5 p. 551-
1 p.
 article
50 GaAs planar Gunn devices with sulfur-ion implanted n layers 1977
 16 5 p. 559-
1 p.
 article
51 Generation of reliability and safety data by analysis of expert opinions 1977
 16 5 p. 551-
1 p.
 article
52 Implementation of the Anik satellite product assurance requirements 1977
 16 5 p. 549-
1 p.
 article
53 Increased reliability of communication networks by distributing connections to transmission paths independent on one another 1977
 16 5 p. 547-
1 p.
 article
54 Influence of ion sputtering and etching on the surface potential of passivated silicon 1977
 16 5 p. 558-
1 p.
 article
55 Integrated circuit regulators 1977
 16 5 p. 555-
1 p.
 article
56 16-k RAM eases memory design for mainframes and microcomputers 1977
 16 5 p. 555-
1 p.
 article
57 Large-scale integration is ready to answer the call of telecommunications 1977
 16 5 p. 555-
1 p.
 article
58 Launch risk analysis 1977
 16 5 p. 551-552
2 p.
 article
59 Literature survey on three-state device reliability systems Dhillon, Balbir S.
 1977
 16 5 p. 601-602
2 p.
 article
60 Low noise “OHMIC” contacts on n-type silicon 1977
 16 5 p. 554-
1 p.
 article
61 Low pressure CVD production processes for poly, nitride and oxide 1977
 16 5 p. 554-
1 p.
 article
62 LSI and analog signal processing—Some examples of problems and their solution 1977
 16 5 p. 603-604
2 p.
 article
63 LSI controls gaining in home appliances 1977
 16 5 p. 555-
1 p.
 article
64 Magnetron sputtering of SiO2 an alternative to chemical vapor deposition 1977
 16 5 p. 554-
1 p.
 article
65 Masks for printing thick-film circuits 1977
 16 5 p. 554-
1 p.
 article
66 Measurement of the barrier height ΦB of SiSnO2 heterojunction by the high-frequency capacitance method 1977
 16 5 p. 555-
1 p.
 article
67 Measurement of the resistivity of a thin square sample with a square four-probe array 1977
 16 5 p. 555-
1 p.
 article
68 Measurements of low-frequency noise and surface state concentration in MOS transistors 1977
 16 5 p. 556-
1 p.
 article
69 Micro-APP: a building block for low-cost high-speed associative parallel processing 1977
 16 5 p. 553-
1 p.
 article
70 Microprocessor development equipment 1977
 16 5 p. 553-
1 p.
 article
71 Microwave field-effect transistors from sulphur-implanted GaAs 1977
 16 5 p. 559-
1 p.
 article
72 Microwave hot electron effects in semiconductor quantized inversion layers 1977
 16 5 p. 557-
1 p.
 article
73 MIL-STD-781 1977
 16 5 p. 548-
1 p.
 article
74 MOSPOWER—The challenge to power bipolars Jenkins, J.O.M.
 1977
 16 5 p. 607-616
10 p.
 article
75 Multilayered ion-implanted Baritt diodes with improved efficiency 1977
 16 5 p. 559-
1 p.
 article
76 Net negative charge of electron-hole drops in germanium 1977
 16 5 p. 556-
1 p.
 article
77 New analogue component concepts for digital processing systems 1977
 16 5 p. 550-
1 p.
 article
78 Nuclear power plant reliability audits 1977
 16 5 p. 552-
1 p.
 article
79 Optically induced charge storage in ion implanted SiO2 1977
 16 5 p. 559-
1 p.
 article
80 Optically induced electron spin resonance in doped amorphous silicon 1977
 16 5 p. 556-557
2 p.
 article
81 Optical MTF evaluation techniques for microelectronic printers 1977
 16 5 p. 553-
1 p.
 article
82 Optimum number of checks in checking policy Yamada, Shigeru
 1977
 16 5 p. 589-591
3 p.
 article
83 Optimum test samples for reliability improvement 1977
 16 5 p. 546-
1 p.
 article
84 Photoresist scumming. Part 1. The nature of negative photoresist scumming 1977
 16 5 p. 553-
1 p.
 article
85 Planning statistical experimental designs in R & M applications 1977
 16 5 p. 550-
1 p.
 article
86 Possibility of application of thin Pb 1−x Sn x Te films as the mechanical stress transducers 1977
 16 5 p. 558-
1 p.
 article
87 Prediction of software failures 1977
 16 5 p. 547-548
2 p.
 article
88 Problems and solutions in the preparation of SOS wafers 1977
 16 5 p. 553-
1 p.
 article
89 Product liability and its effect on engineering practice 1977
 16 5 p. 550-
1 p.
 article
90 Properties of a giant electron-hole drop in germanium 1977
 16 5 p. 556-
1 p.
 article
91 Publications, notices, calls for papers, etc. 1977
 16 5 p. 531-537
7 p.
 article
92 Pulse measurements of channel conductance in MOS transistors 1977
 16 5 p. 556-
1 p.
 article
93 RA system using process failure analysis for ICs 1977
 16 5 p. 546-
1 p.
 article
94 Recent patents on microelectronics 1977
 16 5 p. 539-543
5 p.
 article
95 Reduced lateral diffusion and reverse leakage in Beimplanted GaAs 1−x P x diodes 1977
 16 5 p. 558-
1 p.
 article
96 Reduced support costs for shipboard electronic systems 1977
 16 5 p. 552-
1 p.
 article
97 Reducing solder shorts in wave soldering 1977
 16 5 p. 546-
1 p.
 article
98 Regrowth kinetics of amorphous Ge layers created by 74Ge and 28Si implantation of Ge crystals 1977
 16 5 p. 558-
1 p.
 article
99 Regulatory requirements and product assurances 1977
 16 5 p. 545-
1 p.
 article
100 Relaxation of (111) silicon surface atoms from studies of Si4H9 clusters 1977
 16 5 p. 556-
1 p.
 article
101 Reliability analysis of logic circuits 1977
 16 5 p. 549-
1 p.
 article
102 Reliability and maintainability in nuclear power generation—viewpoint of a utility 1977
 16 5 p. 549-
1 p.
 article
103 Reliability and maintainability of television receivers 1977
 16 5 p. 548-
1 p.
 article
104 Reliability assessment for heavy machinery by “HI-FMECA” Method 1977
 16 5 p. 552-
1 p.
 article
105 Reliability, availability, maintainability/logistics (RAM/LOG) 1977
 16 5 p. 547-
1 p.
 article
106 Reliability evaluation of integrated circuits 1977
 16 5 p. 546-
1 p.
 article
107 Reliability improvement by redundancy voting in analogue electronic systems Klaassen, K.B.
 1977
 16 5 p. 593-600
8 p.
 article
108 Reliability improvement warranty (RIW) and the Army lightweight Doppler navigation system (LDNS) 1977
 16 5 p. 550-
1 p.
 article
109 Reliability improvement warranty techniques and applications 1977
 16 5 p. 550-
1 p.
 article
110 Reliability in the electronics manufacturing phase 1977
 16 5 p. 545-
1 p.
 article
111 Reliability model for electronic cooling blowers 1977
 16 5 p. 545-
1 p.
 article
112 Reliability prediction of hairpin-type springs 1977
 16 5 p. 545-
1 p.
 article
113 RGB colour decoder using three ICs from the TDA2500 range 1977
 16 5 p. 555-
1 p.
 article
114 Rheology and modelling of the spin coating process 1977
 16 5 p. 554-
1 p.
 article
115 Satellite Reliability, a users point of view 1977
 16 5 p. 549-
1 p.
 article
116 Screening procedure for adhesion degradation due to solder leaching in thick-film hybrid microcircuits 1977
 16 5 p. 557-
1 p.
 article
117 Sheet resistivity for planar process control 1977
 16 5 p. 556-
1 p.
 article
118 Simulating maintenance work in an engineering firm: A case study Basker, B.A.
 1977
 16 5 p. 571-581
11 p.
 article
119 Single-slice superhet 1977
 16 5 p. 555-
1 p.
 article
120 Some investigations on secondary breakdown in p-n junctions considering the effect of thermally generated carriers 1977
 16 5 p. 555-
1 p.
 article
121 Sound velocity in amorphous Ge and Si 1977
 16 5 p. 556-
1 p.
 article
122 Space transportation system payload safety policy 1977
 16 5 p. 551-
1 p.
 article
123 Statistical methods for estimating variance components for integrated circuits device parameters Retajczyk Jr., T.F.
 1977
 16 5 p. 561-566
6 p.
 article
124 Strahlungsbelastungs-Untersuchungen an elektronischen Bauelementen des Symphonie-Satelliten 1977
 16 5 p. 550-
1 p.
 article
125 Surface state excitons in semiconductors 1977
 16 5 p. 556-
1 p.
 article
126 System probabilistic studies at the nuclear regulatory commission 1977
 16 5 p. 552-
1 p.
 article
127 Technical problem management 1977
 16 5 p. 545-
1 p.
 article
128 The DryOx process for etching silicon dioxide 1977
 16 5 p. 554-
1 p.
 article
129 The effect of film thickness on certain properties of Cr-SiO cermet thin films 1977
 16 5 p. 557-
1 p.
 article
130 The life cycle cost impacts of unsafe designs 1977
 16 5 p. 546-547
2 p.
 article
131 The repair or modification of pads, tracks and plated-thru holes on PCB's 1977
 16 5 p. 546-
1 p.
 article
132 The roughness parameters of glass films 1977
 16 5 p. 558-
1 p.
 article
133 Thin film resistor networks in hybrid circuits 1977
 16 5 p. 557-
1 p.
 article
134 Thin silicon ion-implanted p-i-n photodiodes 1977
 16 5 p. 558-559
2 p.
 article
135 TMS 9940 — Single chip microcomputer Bryant, John D.
 1977
 16 5 p. 617-626
10 p.
 article
136 Travelling-wave tube reliability estimates, life tests and space flight experience 1977
 16 5 p. 546-
1 p.
 article
137 Ultrasonic wire welding. Part 1—Wedge-wedge bonding of aluminium wires 1977
 16 5 p. 554-
1 p.
 article
138 Weapon system parametric life cycle cost analysis 1977
 16 5 p. 552-
1 p.
 article
139 Wear reliability of aircraft splines 1977
 16 5 p. 551-
1 p.
 article
140 Where there's smoke, there will be an IC 1977
 16 5 p. 555-
1 p.
 article
                             140 results found
 
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