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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
7 results found
| no | title | author | magazine | year | volume | issue | page(s) | type |
| 1 | Aspect ratio-dependent leaning of a block array in 3D NAND flash memory |
Kim, Beomsu |
|
158 | C |
p. |
article |
|
| 2 | Editorial Board |
|
158 | C |
p. |
article |
||
| 3 | Fault and self-repair for high reliability in die-to-die interconnection of 2.5D/3D IC |
Song, Renhao |
|
158 | C |
p. |
article |
|
| 4 | Heavy ions and alpha particles irradiation impact on III-V broken-gap gate-all-around TFET |
Kumar, Pankaj |
|
158 | C |
p. |
article |
|
| 5 | Optical, electrical, and mechanical reliability of 1700 PPI Micro-LED device |
Wang, Kefeng |
|
158 | C |
p. |
article |
|
| 6 | Study of the high-k/SiO2 stacked gate micro-pattern trench CSTBT |
Li, Ang |
|
158 | C |
p. |
article |
|
| 7 | Synergistic enhancement of adhesion and electromigration reliability of cobalt via super-diluted (0.06 at.%) tungsten alloying as next-generation interconnect materials |
Fang, Jau-Shiung |
|
158 | C |
p. |
article |
7 results found