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                             137 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A circuit for high-speed carry propagation in I.S.I.-F.E.T. technology 1976
15 6 p. 527-
1 p.
artikel
2 A comparative evaluation of IC packages in commercial real-time computer terminals 1976
15 6 p. 520-
1 p.
artikel
3 A data base management (DBMP) program for integrated logistics support (ILS) 1976
15 6 p. 524-
1 p.
artikel
4 Allocation of man-machine reliability 1976
15 6 p. 522-
1 p.
artikel
5 A microprocessor-controlled mask inspection and repair system 1976
15 6 p. 527-
1 p.
artikel
6 A modification to fault tree “AND” gate Dhillon, Balbir S.
1976
15 6 p. 625-626
2 p.
artikel
7 An acceptance-rectification sampling plan for maximising expected monetary return 1976
15 6 p. 521-
1 p.
artikel
8 Analytical approximations for diffused junctions under high-level conditions 1976
15 6 p. 530-
1 p.
artikel
9 Analytical solutions for the breakdown voltage of abrupt cylindrical and spherical junctions 1976
15 6 p. 529-
1 p.
artikel
10 A new assurance technology for computer software 1976
15 6 p. 524-
1 p.
artikel
11 An observation by photoconductivity of strain splitting of shallow bulk donors located near to the surface in silicon MOS devices 1976
15 6 p. 530-
1 p.
artikel
12 A peripheral-oriented microcomputer system 1976
15 6 p. 528-
1 p.
artikel
13 Application of the direct observation of nuclear reaction to the study of ion implantation 1976
15 6 p. 532-
1 p.
artikel
14 Approximation method for estimating meaningful parameters for a soft-controlled electro-mechanical system 1976
15 6 p. 523-
1 p.
artikel
15 A projection system for inspecting wafers, integrated circuits and photomasks 1976
15 6 p. 527-
1 p.
artikel
16 Architecture and applications of a 12-bit CMOS microprocessor 1976
15 6 p. 528-
1 p.
artikel
17 A simplified cost-oriented control chart for attributes 1976
15 6 p. 521-
1 p.
artikel
18 A study of the gold acceptor in a silicon p + n junction and an n-type MOS capacitor by thermally stimulated current and capacitance measurements 1976
15 6 p. 529-
1 p.
artikel
19 Automated test methods to check fast analogue-to-digital converters 1976
15 6 p. 526-
1 p.
artikel
20 Automatic detection of semiconductor mask defects Marcin Wójcik, Zbigniew
1976
15 6 p. 585-593
9 p.
artikel
21 Availability analysis of a repairable system with non-repairable stand-by units Dhillon, Balbir S.
1976
15 6 p. 561-562
2 p.
artikel
22 Availability—concepts and definitions 1976
15 6 p. 521-
1 p.
artikel
23 Aviation supply office FFW/RIW case history, 2. Abex Pump 1976
15 6 p. 525-
1 p.
artikel
24 Batch bonded crossovers for thin film circuits 1976
15 6 p. 531-
1 p.
artikel
25 Bayesian limits for the reliability of pass/fail parallel units 1976
15 6 p. 522-
1 p.
artikel
26 Bayesian reliability assessment from test data 1976
15 6 p. 522-
1 p.
artikel
27 Bibliography of inductance simulation by active RC methods Dutta Roy, Suhash C.
1976
15 6 p. 637-639
3 p.
artikel
28 Calendar of international conferences, symposia, lectures and meetings of interest 1976
15 6 p. 503-504
2 p.
artikel
29 Check list for 4,096—bit RAMs flags potential problems in memory design 1976
15 6 p. 525-
1 p.
artikel
30 Clinch-river breeder-reactor plant system reliability 1976
15 6 p. 521-522
2 p.
artikel
31 Comments on the hole mass in silicon inversion layers 1976
15 6 p. 529-
1 p.
artikel
32 Common-cause failure considerations in predicting HTGR cooling system reliability 1976
15 6 p. 521-
1 p.
artikel
33 Computerized system uses laser for functional trimming 1976
15 6 p. 531-
1 p.
artikel
34 Condemnation rates from failure data 1976
15 6 p. 525-526
2 p.
artikel
35 Conference 1976
15 6 p. 515-518
4 p.
artikel
36 Consideration for effective warranty application 1976
15 6 p. 519-
1 p.
artikel
37 Courses 1976
15 6 p. 505-507
3 p.
artikel
38 Critical concentration for metallization of doped germanium and silicon 1976
15 6 p. 529-
1 p.
artikel
39 Current gain degradation induced by emitter-base avalanche breakdown in silicon planar transistors Melia, A.J.
1976
15 6 p. 619-623
5 p.
artikel
40 DIFAR Reliability experience: 781 and Field 1976
15 6 p. 526-
1 p.
artikel
41 Direct observation of the ground state splitting of the indirect free exciton in silicon 1976
15 6 p. 530-
1 p.
artikel
42 Dynamic I2L random-access memory competes with MOS designs 1976
15 6 p. 528-
1 p.
artikel
43 Effective reliability planning and implementation 1976
15 6 p. 526-
1 p.
artikel
44 Effects on LCC of test equipment standardization 1976
15 6 p. 524-
1 p.
artikel
45 Estimating the reliability of complex systems 1976
15 6 p. 523-
1 p.
artikel
46 Factors contributing to the corrosion of the aluminum metal on semiconductor devices packaged in plastics Olberg, R.C.
1976
15 6 p. 601-611
11 p.
artikel
47 Far-infrared absorption of large electron-hole drops in stressed Ge 1976
15 6 p. 530-
1 p.
artikel
48 Field-laboratory reliability relationship 1976
15 6 p. 525-
1 p.
artikel
49 Flat TV panels with polycrystalline layers 1976
15 6 p. 526-
1 p.
artikel
50 Functional modelling of non-volatile MOS memory devices 1976
15 6 p. 527-528
2 p.
artikel
51 Gang lead bonding integrated circuits 1976
15 6 p. 527-
1 p.
artikel
52 GIDEP data aids technical problem solving 1976
15 6 p. 519-
1 p.
artikel
53 Government-Industry Data Exchange Program (GIDEP). A source of quality and reliability data 1976
15 6 p. 519-
1 p.
artikel
54 High-performance microprocessor architectures 1976
15 6 p. 528-
1 p.
artikel
55 High reliability parametric amplifier varactor diodes for satellite applications Thomson, I.
1976
15 6 p. 563-574
12 p.
artikel
56 Hot electron microwave conductivity of wide bandgap semiconductors 1976
15 6 p. 530-531
2 p.
artikel
57 IC screening. Reliability or ripoff 1976
15 6 p. 520-
1 p.
artikel
58 ICs replace memory scope for pulse measurements 1976
15 6 p. 528-
1 p.
artikel
59 IEEE Project 500—reliability data manual for nuclear power generating stations 1976
15 6 p. 524-525
2 p.
artikel
60 Important event-tree and fault-tree considerations in the reactor safety study 1976
15 6 p. 520-
1 p.
artikel
61 Improved reliability through formal field tests 1976
15 6 p. 526-
1 p.
artikel
62 Improved techniques for proximity mask alignment 1976
15 6 p. 527-
1 p.
artikel
63 Ion implantation in the field of bipolar integrated circuits and components 1976
15 6 p. 531-
1 p.
artikel
64 Ion implanted MOST technology 1976
15 6 p. 531-
1 p.
artikel
65 Is Ruby ready 1976
15 6 p. 520-
1 p.
artikel
66 Legal developments in the field of product safety 1976
15 6 p. 519-
1 p.
artikel
67 Long term dormant storage testing, initial results 1976
15 6 p. 520-
1 p.
artikel
68 Maintainability analysis versus maintenance analysis—interface and discrimination 1976
15 6 p. 524-
1 p.
artikel
69 Management of electronics equipment reliability 1976
15 6 p. 523-
1 p.
artikel
70 Markov renewal processes with some non-regeneration points and their applications to reliability theory Nakagawa, Toshio
1976
15 6 p. 633-636
4 p.
artikel
71 Maximum free charge in two-phase surface charge-coupled devices 1976
15 6 p. 529-
1 p.
artikel
72 Maximum reliability route subject to K-improvements in a non-directed network Bansal, S.P.
1976
15 6 p. 629-632
4 p.
artikel
73 Measure of the ion-implantation doping uniformity 1976
15 6 p. 531-532
2 p.
artikel
74 Metal bumps aid semiconductors and hybrid circuit producers 1976
15 6 p. 528-
1 p.
artikel
75 Microelectronic balanced modulator Bozic, S.M.
1976
15 6 p. 581-583
3 p.
artikel
76 NBS program in photomask linewidth measurements 1976
15 6 p. 527-
1 p.
artikel
77 Nuclear industry—approach to performance assurance 1976
15 6 p. 523-
1 p.
artikel
78 Objectives of nuclear system reliability and safety studies 1976
15 6 p. 520-521
2 p.
artikel
79 On a cumulative damage model with N different components 1976
15 6 p. 520-
1 p.
artikel
80 On the new procedure for the determination of surface conditions in thin films with internal layer inhomogeneity 1976
15 6 p. 531-
1 p.
artikel
81 Optimal redundancy allocation for non series-parallel networks 1976
15 6 p. 522-
1 p.
artikel
82 Part reliability information management 1976
15 6 p. 520-
1 p.
artikel
83 Phosphorus diffusion in gallium arsenide 1976
15 6 p. 528-
1 p.
artikel
84 Pitfalls in reliability programme management 1976
15 6 p. 525-
1 p.
artikel
85 Polarizability of shallow donors in silicon—a reply 1976
15 6 p. 529-
1 p.
artikel
86 Polycrystalline silicon solar cells on metallurgical silicon substrates 1976
15 6 p. 530-
1 p.
artikel
87 Polyimide supported micro-ramps for high density circuit interconnection 1976
15 6 p. 527-
1 p.
artikel
88 Present developments in digital logic design 1976
15 6 p. 527-
1 p.
artikel
89 Problems relevant to quality conformance inspection of semiconductor electronic parts 1976
15 6 p. 519-520
2 p.
artikel
90 Publication, notice, calls for paper, etc. 1976
15 6 p. 509-513
5 p.
artikel
91 Purity requirements for chemicals in semiconductor processing 1976
15 6 p. 526-527
2 p.
artikel
92 Qualitative analysis in reliability and safety studies 1976
15 6 p. 521-
1 p.
artikel
93 Quantitative evaluation of nuclear system reliability and safety characteristics 1976
15 6 p. 521-
1 p.
artikel
94 Rapid activation energy determination for a reversible failure mechanism in an integrated operational amplifier Proctor, G.
1976
15 6 p. 575-579
5 p.
artikel
95 Reactive sputtering of resistive films 1976
15 6 p. 531-
1 p.
artikel
96 Reliability analysis for simple systems Ferris-Prabhu, A.V.
1976
15 6 p. 555-560
6 p.
artikel
97 Reliability analysis management 1976
15 6 p. 523-
1 p.
artikel
98 Reliability and safety analysis methodology in the nuclear programs of ERDA 1976
15 6 p. 521-
1 p.
artikel
99 Reliability contracting for reduced support costs 1976
15 6 p. 525-
1 p.
artikel
100 Reliability demonstration of aerospace devices 1976
15 6 p. 520-
1 p.
artikel
101 Reliability in the electronics manufacturing phase Jowett, Charles
1976
15 6 p. 595-600
6 p.
artikel
102 Reliability of a 2-unit priority-standby redundant system with finite repair capability 1976
15 6 p. 522-
1 p.
artikel
103 Reliability of a 2-unit standby redundant system with constrained repair time 1976
15 6 p. 522-
1 p.
artikel
104 Reliability of intermittently used systems 1976
15 6 p. 522-
1 p.
artikel
105 Reliability of probabilistic logic circuits with random inputs Aggarwal, K.K.
1976
15 6 p. 627-628
2 p.
artikel
106 Reliability technology and nuclear power 1976
15 6 p. 521-
1 p.
artikel
107 Report on reliability design and acquisition management 1976
15 6 p. 525-
1 p.
artikel
108 Resonant scattering induced transport anomalies in zero-gap semiconductors 1976
15 6 p. 531-
1 p.
artikel
109 Selective optical valley pumping in silicon and germanium 1976
15 6 p. 530-
1 p.
artikel
110 Some current academic research in system reliability theory 1976
15 6 p. 522-
1 p.
artikel
111 Source evaporant systems for thermal evaporation 1976
15 6 p. 531-
1 p.
artikel
112 Spares and systems availability 1976
15 6 p. 523-
1 p.
artikel
113 Special army requirements for tactical data systems 1976
15 6 p. 523-524
2 p.
artikel
114 Stochastic behavior of two-unit redundant systems which operate at discrete times Mine, H.
1976
15 6 p. 551-554
4 p.
artikel
115 Structure of amorphous Ge alloy films 1976
15 6 p. 530-
1 p.
artikel
116 Studies of n-Type GaAs material properties by anodic current behavior 1976
15 6 p. 530-
1 p.
artikel
117 Synthesis and analysis of a cost-effective, ultrareliable, high speed, semiconductor memory system 1976
15 6 p. 522-
1 p.
artikel
118 System burn-in for reliability enhancement 1976
15 6 p. 526-
1 p.
artikel
119 System failure diagnostics using pattern recognition techniques G.W.A.D,
1976
15 6 p. 533-
1 p.
artikel
120 System reliability estimation from several data sets 1976
15 6 p. 526-
1 p.
artikel
121 Temperature characteristics of MNOS transistors 1976
15 6 p. 527-
1 p.
artikel
122 The alignment of graphic images in solid-state technology Wójcik, Zbigniew Marcin
1976
15 6 p. 613-618
6 p.
artikel
123 The assessment of reliability and maintainability from field data—the British Army's methods and experience 1976
15 6 p. 523-
1 p.
artikel
124 The economic implications of unreliability 1976
15 6 p. 519-
1 p.
artikel
125 The field and carrier waves in a semi-infinite semiconductor 1976
15 6 p. 528-529
2 p.
artikel
126 The fT of bipolar transistors with thin lightly doped bases 1976
15 6 p. 529-
1 p.
artikel
127 The interaction of the two-dimensional plasmon with the surface plasmons in an MOS structure 1976
15 6 p. 529-530
2 p.
artikel
128 Theory of iron-group impurities in II–VI compounds 1976
15 6 p. 529-
1 p.
artikel
129 The pay-off of R & M trade-off 1976
15 6 p. 522-
1 p.
artikel
130 The reliability of two-terminal parallel-series networks subject to two kinds of failure Phillips, M.J.
1976
15 6 p. 535-549
15 p.
artikel
131 The structure of cleaned and polished (100) GaAs surfaces 1976
15 6 p. 527-
1 p.
artikel
132 The use of the scanning electron microscope in the failure analysis of a typical semiconductor device 1976
15 6 p. 520-
1 p.
artikel
133 Thin-film networks take on discretes 1976
15 6 p. 531-
1 p.
artikel
134 Toshiba markets Japan's first 8-bit microprocessor chip 1976
15 6 p. 528-
1 p.
artikel
135 Trade-off of thermal cycling vs life cycle costs 1976
15 6 p. 524-
1 p.
artikel
136 Trends in failure survival techniques for avionic systems 1976
15 6 p. 520-
1 p.
artikel
137 Valley degeneracy of electrons in accumulation and inversion layers on Si(111) surface 1976
15 6 p. 530-
1 p.
artikel
                             137 gevonden resultaten
 
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