| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A circuit for high-speed carry propagation in I.S.I.-F.E.T. technology
|
|
|
1976
|
15 |
6 |
p. 527-
1 p.
|
artikel
|
| 2 |
A comparative evaluation of IC packages in commercial real-time computer terminals
|
|
|
1976
|
15 |
6 |
p. 520-
1 p.
|
artikel
|
| 3 |
A data base management (DBMP) program for integrated logistics support (ILS)
|
|
|
1976
|
15 |
6 |
p. 524-
1 p.
|
artikel
|
| 4 |
Allocation of man-machine reliability
|
|
|
1976
|
15 |
6 |
p. 522-
1 p.
|
artikel
|
| 5 |
A microprocessor-controlled mask inspection and repair system
|
|
|
1976
|
15 |
6 |
p. 527-
1 p.
|
artikel
|
| 6 |
A modification to fault tree “AND” gate
|
Dhillon, Balbir S.
|
|
1976
|
15 |
6 |
p. 625-626
2 p.
|
artikel
|
| 7 |
An acceptance-rectification sampling plan for maximising expected monetary return
|
|
|
1976
|
15 |
6 |
p. 521-
1 p.
|
artikel
|
| 8 |
Analytical approximations for diffused junctions under high-level conditions
|
|
|
1976
|
15 |
6 |
p. 530-
1 p.
|
artikel
|
| 9 |
Analytical solutions for the breakdown voltage of abrupt cylindrical and spherical junctions
|
|
|
1976
|
15 |
6 |
p. 529-
1 p.
|
artikel
|
| 10 |
A new assurance technology for computer software
|
|
|
1976
|
15 |
6 |
p. 524-
1 p.
|
artikel
|
| 11 |
An observation by photoconductivity of strain splitting of shallow bulk donors located near to the surface in silicon MOS devices
|
|
|
1976
|
15 |
6 |
p. 530-
1 p.
|
artikel
|
| 12 |
A peripheral-oriented microcomputer system
|
|
|
1976
|
15 |
6 |
p. 528-
1 p.
|
artikel
|
| 13 |
Application of the direct observation of nuclear reaction to the study of ion implantation
|
|
|
1976
|
15 |
6 |
p. 532-
1 p.
|
artikel
|
| 14 |
Approximation method for estimating meaningful parameters for a soft-controlled electro-mechanical system
|
|
|
1976
|
15 |
6 |
p. 523-
1 p.
|
artikel
|
| 15 |
A projection system for inspecting wafers, integrated circuits and photomasks
|
|
|
1976
|
15 |
6 |
p. 527-
1 p.
|
artikel
|
| 16 |
Architecture and applications of a 12-bit CMOS microprocessor
|
|
|
1976
|
15 |
6 |
p. 528-
1 p.
|
artikel
|
| 17 |
A simplified cost-oriented control chart for attributes
|
|
|
1976
|
15 |
6 |
p. 521-
1 p.
|
artikel
|
| 18 |
A study of the gold acceptor in a silicon p + n junction and an n-type MOS capacitor by thermally stimulated current and capacitance measurements
|
|
|
1976
|
15 |
6 |
p. 529-
1 p.
|
artikel
|
| 19 |
Automated test methods to check fast analogue-to-digital converters
|
|
|
1976
|
15 |
6 |
p. 526-
1 p.
|
artikel
|
| 20 |
Automatic detection of semiconductor mask defects
|
Marcin Wójcik, Zbigniew
|
|
1976
|
15 |
6 |
p. 585-593
9 p.
|
artikel
|
| 21 |
Availability analysis of a repairable system with non-repairable stand-by units
|
Dhillon, Balbir S.
|
|
1976
|
15 |
6 |
p. 561-562
2 p.
|
artikel
|
| 22 |
Availability—concepts and definitions
|
|
|
1976
|
15 |
6 |
p. 521-
1 p.
|
artikel
|
| 23 |
Aviation supply office FFW/RIW case history, 2. Abex Pump
|
|
|
1976
|
15 |
6 |
p. 525-
1 p.
|
artikel
|
| 24 |
Batch bonded crossovers for thin film circuits
|
|
|
1976
|
15 |
6 |
p. 531-
1 p.
|
artikel
|
| 25 |
Bayesian limits for the reliability of pass/fail parallel units
|
|
|
1976
|
15 |
6 |
p. 522-
1 p.
|
artikel
|
| 26 |
Bayesian reliability assessment from test data
|
|
|
1976
|
15 |
6 |
p. 522-
1 p.
|
artikel
|
| 27 |
Bibliography of inductance simulation by active RC methods
|
Dutta Roy, Suhash C.
|
|
1976
|
15 |
6 |
p. 637-639
3 p.
|
artikel
|
| 28 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1976
|
15 |
6 |
p. 503-504
2 p.
|
artikel
|
| 29 |
Check list for 4,096—bit RAMs flags potential problems in memory design
|
|
|
1976
|
15 |
6 |
p. 525-
1 p.
|
artikel
|
| 30 |
Clinch-river breeder-reactor plant system reliability
|
|
|
1976
|
15 |
6 |
p. 521-522
2 p.
|
artikel
|
| 31 |
Comments on the hole mass in silicon inversion layers
|
|
|
1976
|
15 |
6 |
p. 529-
1 p.
|
artikel
|
| 32 |
Common-cause failure considerations in predicting HTGR cooling system reliability
|
|
|
1976
|
15 |
6 |
p. 521-
1 p.
|
artikel
|
| 33 |
Computerized system uses laser for functional trimming
|
|
|
1976
|
15 |
6 |
p. 531-
1 p.
|
artikel
|
| 34 |
Condemnation rates from failure data
|
|
|
1976
|
15 |
6 |
p. 525-526
2 p.
|
artikel
|
| 35 |
Conference
|
|
|
1976
|
15 |
6 |
p. 515-518
4 p.
|
artikel
|
| 36 |
Consideration for effective warranty application
|
|
|
1976
|
15 |
6 |
p. 519-
1 p.
|
artikel
|
| 37 |
Courses
|
|
|
1976
|
15 |
6 |
p. 505-507
3 p.
|
artikel
|
| 38 |
Critical concentration for metallization of doped germanium and silicon
|
|
|
1976
|
15 |
6 |
p. 529-
1 p.
|
artikel
|
| 39 |
Current gain degradation induced by emitter-base avalanche breakdown in silicon planar transistors
|
Melia, A.J.
|
|
1976
|
15 |
6 |
p. 619-623
5 p.
|
artikel
|
| 40 |
DIFAR Reliability experience: 781 and Field
|
|
|
1976
|
15 |
6 |
p. 526-
1 p.
|
artikel
|
| 41 |
Direct observation of the ground state splitting of the indirect free exciton in silicon
|
|
|
1976
|
15 |
6 |
p. 530-
1 p.
|
artikel
|
| 42 |
Dynamic I2L random-access memory competes with MOS designs
|
|
|
1976
|
15 |
6 |
p. 528-
1 p.
|
artikel
|
| 43 |
Effective reliability planning and implementation
|
|
|
1976
|
15 |
6 |
p. 526-
1 p.
|
artikel
|
| 44 |
Effects on LCC of test equipment standardization
|
|
|
1976
|
15 |
6 |
p. 524-
1 p.
|
artikel
|
| 45 |
Estimating the reliability of complex systems
|
|
|
1976
|
15 |
6 |
p. 523-
1 p.
|
artikel
|
| 46 |
Factors contributing to the corrosion of the aluminum metal on semiconductor devices packaged in plastics
|
Olberg, R.C.
|
|
1976
|
15 |
6 |
p. 601-611
11 p.
|
artikel
|
| 47 |
Far-infrared absorption of large electron-hole drops in stressed Ge
|
|
|
1976
|
15 |
6 |
p. 530-
1 p.
|
artikel
|
| 48 |
Field-laboratory reliability relationship
|
|
|
1976
|
15 |
6 |
p. 525-
1 p.
|
artikel
|
| 49 |
Flat TV panels with polycrystalline layers
|
|
|
1976
|
15 |
6 |
p. 526-
1 p.
|
artikel
|
| 50 |
Functional modelling of non-volatile MOS memory devices
|
|
|
1976
|
15 |
6 |
p. 527-528
2 p.
|
artikel
|
| 51 |
Gang lead bonding integrated circuits
|
|
|
1976
|
15 |
6 |
p. 527-
1 p.
|
artikel
|
| 52 |
GIDEP data aids technical problem solving
|
|
|
1976
|
15 |
6 |
p. 519-
1 p.
|
artikel
|
| 53 |
Government-Industry Data Exchange Program (GIDEP). A source of quality and reliability data
|
|
|
1976
|
15 |
6 |
p. 519-
1 p.
|
artikel
|
| 54 |
High-performance microprocessor architectures
|
|
|
1976
|
15 |
6 |
p. 528-
1 p.
|
artikel
|
| 55 |
High reliability parametric amplifier varactor diodes for satellite applications
|
Thomson, I.
|
|
1976
|
15 |
6 |
p. 563-574
12 p.
|
artikel
|
| 56 |
Hot electron microwave conductivity of wide bandgap semiconductors
|
|
|
1976
|
15 |
6 |
p. 530-531
2 p.
|
artikel
|
| 57 |
IC screening. Reliability or ripoff
|
|
|
1976
|
15 |
6 |
p. 520-
1 p.
|
artikel
|
| 58 |
ICs replace memory scope for pulse measurements
|
|
|
1976
|
15 |
6 |
p. 528-
1 p.
|
artikel
|
| 59 |
IEEE Project 500—reliability data manual for nuclear power generating stations
|
|
|
1976
|
15 |
6 |
p. 524-525
2 p.
|
artikel
|
| 60 |
Important event-tree and fault-tree considerations in the reactor safety study
|
|
|
1976
|
15 |
6 |
p. 520-
1 p.
|
artikel
|
| 61 |
Improved reliability through formal field tests
|
|
|
1976
|
15 |
6 |
p. 526-
1 p.
|
artikel
|
| 62 |
Improved techniques for proximity mask alignment
|
|
|
1976
|
15 |
6 |
p. 527-
1 p.
|
artikel
|
| 63 |
Ion implantation in the field of bipolar integrated circuits and components
|
|
|
1976
|
15 |
6 |
p. 531-
1 p.
|
artikel
|
| 64 |
Ion implanted MOST technology
|
|
|
1976
|
15 |
6 |
p. 531-
1 p.
|
artikel
|
| 65 |
Is Ruby ready
|
|
|
1976
|
15 |
6 |
p. 520-
1 p.
|
artikel
|
| 66 |
Legal developments in the field of product safety
|
|
|
1976
|
15 |
6 |
p. 519-
1 p.
|
artikel
|
| 67 |
Long term dormant storage testing, initial results
|
|
|
1976
|
15 |
6 |
p. 520-
1 p.
|
artikel
|
| 68 |
Maintainability analysis versus maintenance analysis—interface and discrimination
|
|
|
1976
|
15 |
6 |
p. 524-
1 p.
|
artikel
|
| 69 |
Management of electronics equipment reliability
|
|
|
1976
|
15 |
6 |
p. 523-
1 p.
|
artikel
|
| 70 |
Markov renewal processes with some non-regeneration points and their applications to reliability theory
|
Nakagawa, Toshio
|
|
1976
|
15 |
6 |
p. 633-636
4 p.
|
artikel
|
| 71 |
Maximum free charge in two-phase surface charge-coupled devices
|
|
|
1976
|
15 |
6 |
p. 529-
1 p.
|
artikel
|
| 72 |
Maximum reliability route subject to K-improvements in a non-directed network
|
Bansal, S.P.
|
|
1976
|
15 |
6 |
p. 629-632
4 p.
|
artikel
|
| 73 |
Measure of the ion-implantation doping uniformity
|
|
|
1976
|
15 |
6 |
p. 531-532
2 p.
|
artikel
|
| 74 |
Metal bumps aid semiconductors and hybrid circuit producers
|
|
|
1976
|
15 |
6 |
p. 528-
1 p.
|
artikel
|
| 75 |
Microelectronic balanced modulator
|
Bozic, S.M.
|
|
1976
|
15 |
6 |
p. 581-583
3 p.
|
artikel
|
| 76 |
NBS program in photomask linewidth measurements
|
|
|
1976
|
15 |
6 |
p. 527-
1 p.
|
artikel
|
| 77 |
Nuclear industry—approach to performance assurance
|
|
|
1976
|
15 |
6 |
p. 523-
1 p.
|
artikel
|
| 78 |
Objectives of nuclear system reliability and safety studies
|
|
|
1976
|
15 |
6 |
p. 520-521
2 p.
|
artikel
|
| 79 |
On a cumulative damage model with N different components
|
|
|
1976
|
15 |
6 |
p. 520-
1 p.
|
artikel
|
| 80 |
On the new procedure for the determination of surface conditions in thin films with internal layer inhomogeneity
|
|
|
1976
|
15 |
6 |
p. 531-
1 p.
|
artikel
|
| 81 |
Optimal redundancy allocation for non series-parallel networks
|
|
|
1976
|
15 |
6 |
p. 522-
1 p.
|
artikel
|
| 82 |
Part reliability information management
|
|
|
1976
|
15 |
6 |
p. 520-
1 p.
|
artikel
|
| 83 |
Phosphorus diffusion in gallium arsenide
|
|
|
1976
|
15 |
6 |
p. 528-
1 p.
|
artikel
|
| 84 |
Pitfalls in reliability programme management
|
|
|
1976
|
15 |
6 |
p. 525-
1 p.
|
artikel
|
| 85 |
Polarizability of shallow donors in silicon—a reply
|
|
|
1976
|
15 |
6 |
p. 529-
1 p.
|
artikel
|
| 86 |
Polycrystalline silicon solar cells on metallurgical silicon substrates
|
|
|
1976
|
15 |
6 |
p. 530-
1 p.
|
artikel
|
| 87 |
Polyimide supported micro-ramps for high density circuit interconnection
|
|
|
1976
|
15 |
6 |
p. 527-
1 p.
|
artikel
|
| 88 |
Present developments in digital logic design
|
|
|
1976
|
15 |
6 |
p. 527-
1 p.
|
artikel
|
| 89 |
Problems relevant to quality conformance inspection of semiconductor electronic parts
|
|
|
1976
|
15 |
6 |
p. 519-520
2 p.
|
artikel
|
| 90 |
Publication, notice, calls for paper, etc.
|
|
|
1976
|
15 |
6 |
p. 509-513
5 p.
|
artikel
|
| 91 |
Purity requirements for chemicals in semiconductor processing
|
|
|
1976
|
15 |
6 |
p. 526-527
2 p.
|
artikel
|
| 92 |
Qualitative analysis in reliability and safety studies
|
|
|
1976
|
15 |
6 |
p. 521-
1 p.
|
artikel
|
| 93 |
Quantitative evaluation of nuclear system reliability and safety characteristics
|
|
|
1976
|
15 |
6 |
p. 521-
1 p.
|
artikel
|
| 94 |
Rapid activation energy determination for a reversible failure mechanism in an integrated operational amplifier
|
Proctor, G.
|
|
1976
|
15 |
6 |
p. 575-579
5 p.
|
artikel
|
| 95 |
Reactive sputtering of resistive films
|
|
|
1976
|
15 |
6 |
p. 531-
1 p.
|
artikel
|
| 96 |
Reliability analysis for simple systems
|
Ferris-Prabhu, A.V.
|
|
1976
|
15 |
6 |
p. 555-560
6 p.
|
artikel
|
| 97 |
Reliability analysis management
|
|
|
1976
|
15 |
6 |
p. 523-
1 p.
|
artikel
|
| 98 |
Reliability and safety analysis methodology in the nuclear programs of ERDA
|
|
|
1976
|
15 |
6 |
p. 521-
1 p.
|
artikel
|
| 99 |
Reliability contracting for reduced support costs
|
|
|
1976
|
15 |
6 |
p. 525-
1 p.
|
artikel
|
| 100 |
Reliability demonstration of aerospace devices
|
|
|
1976
|
15 |
6 |
p. 520-
1 p.
|
artikel
|
| 101 |
Reliability in the electronics manufacturing phase
|
Jowett, Charles
|
|
1976
|
15 |
6 |
p. 595-600
6 p.
|
artikel
|
| 102 |
Reliability of a 2-unit priority-standby redundant system with finite repair capability
|
|
|
1976
|
15 |
6 |
p. 522-
1 p.
|
artikel
|
| 103 |
Reliability of a 2-unit standby redundant system with constrained repair time
|
|
|
1976
|
15 |
6 |
p. 522-
1 p.
|
artikel
|
| 104 |
Reliability of intermittently used systems
|
|
|
1976
|
15 |
6 |
p. 522-
1 p.
|
artikel
|
| 105 |
Reliability of probabilistic logic circuits with random inputs
|
Aggarwal, K.K.
|
|
1976
|
15 |
6 |
p. 627-628
2 p.
|
artikel
|
| 106 |
Reliability technology and nuclear power
|
|
|
1976
|
15 |
6 |
p. 521-
1 p.
|
artikel
|
| 107 |
Report on reliability design and acquisition management
|
|
|
1976
|
15 |
6 |
p. 525-
1 p.
|
artikel
|
| 108 |
Resonant scattering induced transport anomalies in zero-gap semiconductors
|
|
|
1976
|
15 |
6 |
p. 531-
1 p.
|
artikel
|
| 109 |
Selective optical valley pumping in silicon and germanium
|
|
|
1976
|
15 |
6 |
p. 530-
1 p.
|
artikel
|
| 110 |
Some current academic research in system reliability theory
|
|
|
1976
|
15 |
6 |
p. 522-
1 p.
|
artikel
|
| 111 |
Source evaporant systems for thermal evaporation
|
|
|
1976
|
15 |
6 |
p. 531-
1 p.
|
artikel
|
| 112 |
Spares and systems availability
|
|
|
1976
|
15 |
6 |
p. 523-
1 p.
|
artikel
|
| 113 |
Special army requirements for tactical data systems
|
|
|
1976
|
15 |
6 |
p. 523-524
2 p.
|
artikel
|
| 114 |
Stochastic behavior of two-unit redundant systems which operate at discrete times
|
Mine, H.
|
|
1976
|
15 |
6 |
p. 551-554
4 p.
|
artikel
|
| 115 |
Structure of amorphous Ge alloy films
|
|
|
1976
|
15 |
6 |
p. 530-
1 p.
|
artikel
|
| 116 |
Studies of n-Type GaAs material properties by anodic current behavior
|
|
|
1976
|
15 |
6 |
p. 530-
1 p.
|
artikel
|
| 117 |
Synthesis and analysis of a cost-effective, ultrareliable, high speed, semiconductor memory system
|
|
|
1976
|
15 |
6 |
p. 522-
1 p.
|
artikel
|
| 118 |
System burn-in for reliability enhancement
|
|
|
1976
|
15 |
6 |
p. 526-
1 p.
|
artikel
|
| 119 |
System failure diagnostics using pattern recognition techniques
|
G.W.A.D,
|
|
1976
|
15 |
6 |
p. 533-
1 p.
|
artikel
|
| 120 |
System reliability estimation from several data sets
|
|
|
1976
|
15 |
6 |
p. 526-
1 p.
|
artikel
|
| 121 |
Temperature characteristics of MNOS transistors
|
|
|
1976
|
15 |
6 |
p. 527-
1 p.
|
artikel
|
| 122 |
The alignment of graphic images in solid-state technology
|
Wójcik, Zbigniew Marcin
|
|
1976
|
15 |
6 |
p. 613-618
6 p.
|
artikel
|
| 123 |
The assessment of reliability and maintainability from field data—the British Army's methods and experience
|
|
|
1976
|
15 |
6 |
p. 523-
1 p.
|
artikel
|
| 124 |
The economic implications of unreliability
|
|
|
1976
|
15 |
6 |
p. 519-
1 p.
|
artikel
|
| 125 |
The field and carrier waves in a semi-infinite semiconductor
|
|
|
1976
|
15 |
6 |
p. 528-529
2 p.
|
artikel
|
| 126 |
The fT of bipolar transistors with thin lightly doped bases
|
|
|
1976
|
15 |
6 |
p. 529-
1 p.
|
artikel
|
| 127 |
The interaction of the two-dimensional plasmon with the surface plasmons in an MOS structure
|
|
|
1976
|
15 |
6 |
p. 529-530
2 p.
|
artikel
|
| 128 |
Theory of iron-group impurities in II–VI compounds
|
|
|
1976
|
15 |
6 |
p. 529-
1 p.
|
artikel
|
| 129 |
The pay-off of R & M trade-off
|
|
|
1976
|
15 |
6 |
p. 522-
1 p.
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artikel
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| 130 |
The reliability of two-terminal parallel-series networks subject to two kinds of failure
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Phillips, M.J.
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1976
|
15 |
6 |
p. 535-549
15 p.
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artikel
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| 131 |
The structure of cleaned and polished (100) GaAs surfaces
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1976
|
15 |
6 |
p. 527-
1 p.
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artikel
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| 132 |
The use of the scanning electron microscope in the failure analysis of a typical semiconductor device
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1976
|
15 |
6 |
p. 520-
1 p.
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artikel
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| 133 |
Thin-film networks take on discretes
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1976
|
15 |
6 |
p. 531-
1 p.
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artikel
|
| 134 |
Toshiba markets Japan's first 8-bit microprocessor chip
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1976
|
15 |
6 |
p. 528-
1 p.
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artikel
|
| 135 |
Trade-off of thermal cycling vs life cycle costs
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1976
|
15 |
6 |
p. 524-
1 p.
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artikel
|
| 136 |
Trends in failure survival techniques for avionic systems
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1976
|
15 |
6 |
p. 520-
1 p.
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artikel
|
| 137 |
Valley degeneracy of electrons in accumulation and inversion layers on Si(111) surface
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1976
|
15 |
6 |
p. 530-
1 p.
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artikel
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