| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A memristor-based sensing and repair system for photovoltaic modules
|
Gnoli, Luca
|
|
|
117 |
C |
p.
|
artikel
|
| 2 |
A statistical study into reliability of FPGA implemented circuits: Simulation and modelling
|
Aguirre-Morales, J.D.
|
|
|
117 |
C |
p.
|
artikel
|
| 3 |
Design for reliability: Tradeoffs between lifetime and performance due to electromigration
|
Wolff, Francis
|
|
|
117 |
C |
p.
|
artikel
|
| 4 |
Editorial Board
|
|
|
|
117 |
C |
p.
|
artikel
|
| 5 |
Effect of mounting fixture on the drop reliability of solid state drive
|
Jeong, In Jun
|
|
|
117 |
C |
p.
|
artikel
|
| 6 |
Effects of bismuth additions on mechanical property and microstructure of SAC-Bi solder joint under current stressing
|
Hu, Siou-Han
|
|
|
117 |
C |
p.
|
artikel
|
| 7 |
Impact of electric field at rough copper lines on failure time due to electrochemical migration in PCBs
|
Reiss, Georg
|
|
|
117 |
C |
p.
|
artikel
|
| 8 |
Microelectronics Reliability: Publisher's Note
|
|
|
|
117 |
C |
p.
|
artikel
|
| 9 |
Nonlinear error analysis and calibration model for cyclic ADCs in large array CMOS image sensors
|
Xu, Jiangtao
|
|
|
117 |
C |
p.
|
artikel
|
| 10 |
Predicting and mitigating single-event upsets in DRAM using HOTH
|
Longofono, Stephen
|
|
|
117 |
C |
p.
|
artikel
|
| 11 |
Single Event Effects in 0.18 μm Pinned Photodiode CMOS Image Sensors: SEU and SEFI
|
Cai, Yu long
|
|
|
117 |
C |
p.
|
artikel
|
| 12 |
Soft error hardened voltage bootstrapped Schmitt trigger design for reliable circuits
|
Gupta, Neha
|
|
|
117 |
C |
p.
|
artikel
|
| 13 |
The influence of glass particle size on the interfacial bonding strength of Au/ceramic co-fired structure
|
Yan, Tingnan
|
|
|
117 |
C |
p.
|
artikel
|
| 14 |
The investigation of current condition mechanism of Al/Y2O3/p-Si Schottky barrier diodes in wide range temperature and illuminate
|
Sevgili, Ömer
|
|
|
117 |
C |
p.
|
artikel
|
Tijdschrift beschrijving