nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Characterization of deep electron traps in 4H-SiC Junction Barrier Schottky rectifiers
|
Gelczuk, Ł. |
|
2014 |
94 |
C |
p. 56-60 5 p. |
artikel |
2 |
Chromatic-stability white organic light emitting diodes based on phosphorescence doped electron transport layer
|
Zhou, Pengchao |
|
2014 |
94 |
C |
p. 6-10 5 p. |
artikel |
3 |
Compact core model for Symmetric Double-Gate Junctionless Transistors
|
Cerdeira, A. |
|
2014 |
94 |
C |
p. 91-97 7 p. |
artikel |
4 |
Compact model of power MOSFET with temperature dependent Cauer RC network for more accurate thermal simulations
|
Marek, Juraj |
|
2014 |
94 |
C |
p. 44-50 7 p. |
artikel |
5 |
Complex-coupled edge-emitting photonic crystal distributed feedback quantum cascade lasers at λ ∼7.6μm
|
Zhang, Jinchuan |
|
2014 |
94 |
C |
p. 20-22 3 p. |
artikel |
6 |
Editorial Board
|
|
|
2014 |
94 |
C |
p. IFC- 1 p. |
artikel |
7 |
Enhanced endurance reliability and low current operation for AlO x /HfO x based unipolar RRAM with Ni electrode
|
Chen, Yu-Sheng |
|
2014 |
94 |
C |
p. 1-5 5 p. |
artikel |
8 |
Field-dependent charge trapping analysis of ONO inter-poly dielectrics for NAND flash memory applications
|
Moon, Pyung |
|
2014 |
94 |
C |
p. 51-55 5 p. |
artikel |
9 |
Flexible thin-film transistors on planarized parylene substrate with recessed individual backgates
|
Farkas, Balázs |
|
2014 |
94 |
C |
p. 11-14 4 p. |
artikel |
10 |
Impedance spectroscopy analysis of the switching mechanism of reduced graphene oxide resistive switching memory
|
Ho, Nhu Thuy |
|
2014 |
94 |
C |
p. 61-65 5 p. |
artikel |
11 |
Improvement of the multi-level cell performance by a soft program method in flash memory devices
|
Park, Jong Kyung |
|
2014 |
94 |
C |
p. 86-90 5 p. |
artikel |
12 |
Interface phonon modes of dual-gate MOSFET system
|
Zhang, Nanzhu |
|
2014 |
94 |
C |
p. 72-81 10 p. |
artikel |
13 |
Investigating and modeling impact ionization current in MOSFETs
|
Chau, Quan |
|
2014 |
94 |
C |
p. 66-71 6 p. |
artikel |
14 |
ON-state characteristics of proton irradiated 4H–SiC Schottky diode: The calibration of model parameters for device simulation
|
Vobecký, J. |
|
2014 |
94 |
C |
p. 32-38 7 p. |
artikel |
15 |
Optimization of uniaxial stress for high electron mobility on biaxially-strained n-MOSFETs
|
Sun, Wookyung |
|
2014 |
94 |
C |
p. 23-27 5 p. |
artikel |
16 |
P–N junction and metal contact reliability of SiC diode in high temperature (873K) environment
|
Chand, R. |
|
2014 |
94 |
C |
p. 82-85 4 p. |
artikel |
17 |
Resistive switching of Cu/SiC/Au memory devices with a high ON/OFF ratio
|
Zhong, L. |
|
2014 |
94 |
C |
p. 98-102 5 p. |
artikel |
18 |
Switching phenomenon in TlGaSe2 layered semiconductor
|
Seyidov, МirHasanYu. |
|
2014 |
94 |
C |
p. 39-43 5 p. |
artikel |
19 |
Thermal stability of multilayer Ti2AlN-based ohmic contacts to n-GaN in ambient air
|
Borysiewicz, Michał A. |
|
2014 |
94 |
C |
p. 15-19 5 p. |
artikel |
20 |
Tunable low-pass MEMS filter using defected ground structures (DGS)
|
Guo, X.L. |
|
2014 |
94 |
C |
p. 28-31 4 p. |
artikel |