nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A closed-form expression to analyze electronic properties in delta-doped heterostructures
|
Chen, Xiying |
|
2004 |
48 |
12 |
p. 2321-2327 7 p. |
artikel |
2 |
A compact deep-submicron MOSFET g ds model including hot-electron and thermoelectric effects
|
Zhou, X. |
|
2004 |
48 |
12 |
p. 2125-2131 7 p. |
artikel |
3 |
A comprehensive geometrical and biasing analysis for latchup in 0.18-μm CoSi2 STI CMOS structure
|
Goh, Wang-Ling |
|
2004 |
48 |
12 |
p. 2109-2114 6 p. |
artikel |
4 |
Analysis and optimisation of the trench gated emitter switched thyristor
|
Spulber, O. |
|
2004 |
48 |
12 |
p. 2207-2211 5 p. |
artikel |
5 |
Analytical model for the programming of source side injection SST superflash split-gate cell using two-dimensional analysis
|
Guan, Huinan |
|
2004 |
48 |
12 |
p. 2199-2206 8 p. |
artikel |
6 |
A sum-over-paths impulse-response moment-extraction algorithm for RC IC-interconnect networks
|
Le Coz, Y.L. |
|
2004 |
48 |
12 |
p. 2133-2145 13 p. |
artikel |
7 |
Author index
|
|
|
2004 |
48 |
12 |
p. III-IX nvt p. |
artikel |
8 |
Calculation of lattice heating in SiC RF power devices
|
Bertilsson, Kent |
|
2004 |
48 |
12 |
p. 2103-2107 5 p. |
artikel |
9 |
Capacitance analysis of devices with electrically floating regions
|
Yamaguchi, Ken |
|
2004 |
48 |
12 |
p. 2115-2124 10 p. |
artikel |
10 |
Characterization of double gate MOSFETs fabricated by a simple method on a recrystallized silicon film
|
Lin, Xinnan |
|
2004 |
48 |
12 |
p. 2315-2319 5 p. |
artikel |
11 |
Comment on “Negative Schottky barrier between titanium and n-type Si(001) for low-resistance ohmic contacts”
|
Osvald, J. |
|
2004 |
48 |
12 |
p. 2347-2349 3 p. |
artikel |
12 |
Complementary tunneling transistor for low power application
|
Wang, P.-F. |
|
2004 |
48 |
12 |
p. 2281-2286 6 p. |
artikel |
13 |
Determining the generation lifetime in a MOS capacitor using linear sweep techniques
|
Ťapajna, Milan |
|
2004 |
48 |
12 |
p. 2339-2342 4 p. |
artikel |
14 |
Differential capacitance as a method of determining the presence of a quasi-bidimensional electronic gas
|
Martı́nez-Orozco, J.C. |
|
2004 |
48 |
12 |
p. 2277-2280 4 p. |
artikel |
15 |
Drain current thermal noise modeling for deep submicron n- and p-channel MOSFETs
|
Han, Kwangseok |
|
2004 |
48 |
12 |
p. 2255-2262 8 p. |
artikel |
16 |
Dynamic surface temperature measurements in SiC epitaxial power diodes performed under single-pulse self-heating conditions
|
Hillkirk, Leonardo Martin |
|
2004 |
48 |
12 |
p. 2181-2189 9 p. |
artikel |
17 |
Effects of generation/recombination processes and leakage current through interfacial “punctures” on electrical characterization of unipolar directly bonded semiconductor structures
|
Stuchinsky, V.A. |
|
2004 |
48 |
12 |
p. 2165-2173 9 p. |
artikel |
18 |
Electrical properties of high permittivity ZrO2 gate dielectrics on strained-Si
|
Maiti, C.K. |
|
2004 |
48 |
12 |
p. 2235-2241 7 p. |
artikel |
19 |
Electrical simulation of the flicker in poly-Si TFT-LCD pixels for the large-area and high-quality TFT-LCD development and manufacturing
|
Son, Myung-Sik |
|
2004 |
48 |
12 |
p. 2307-2313 7 p. |
artikel |
20 |
Fabrication of ZnO-based metal–insulator–semiconductor diodes by ion implantation
|
Alivov, Ya.I. |
|
2004 |
48 |
12 |
p. 2343-2346 4 p. |
artikel |
21 |
Field emission of vertically-aligned carbon nanotube arrays grown on porous silicon substrate
|
Li, Juntao |
|
2004 |
48 |
12 |
p. 2147-2151 5 p. |
artikel |
22 |
High resolution transport spectroscopy in ultimate MOSFETs at very low temperature
|
Sanquer, M. |
|
2004 |
48 |
12 |
p. 2213-2217 5 p. |
artikel |
23 |
Hole mobility enhancement and Si cap optimization in nanoscale strained Si1−x Ge x PMOSFETs
|
Shi, Zhonghai |
|
2004 |
48 |
12 |
p. 2299-2306 8 p. |
artikel |
24 |
Impulse responses of submicron GaAs photodetectors
|
Ohno, T. |
|
2004 |
48 |
12 |
p. 2159-2163 5 p. |
artikel |
25 |
Influence of annealing ambient on GaAs oxide prepared by the liquid phase method
|
Chou, Dei-Wei |
|
2004 |
48 |
12 |
p. 2175-2179 5 p. |
artikel |
26 |
Influences of nonuniformity in metal concentration in gate dielectric silicate on CMIS inverters' propagation delay time
|
Ono, Mizuki |
|
2004 |
48 |
12 |
p. 2191-2198 8 p. |
artikel |
27 |
Integral function method for determination of nonlinear harmonic distortion
|
Cerdeira, Antonio |
|
2004 |
48 |
12 |
p. 2225-2234 10 p. |
artikel |
28 |
Keyword index
|
|
|
2004 |
48 |
12 |
p. XI-XV nvt p. |
artikel |
29 |
LDMOS in SOI technology with very-thin silicon film
|
Bawedin, M. |
|
2004 |
48 |
12 |
p. 2263-2270 8 p. |
artikel |
30 |
Low-frequency noise in Si0.7Ge0.3 surface channel pMOSFETs with ALD HfO2/Al2O3 gate dielectrics
|
von Haartman, M. |
|
2004 |
48 |
12 |
p. 2271-2275 5 p. |
artikel |
31 |
Optoelectronic properties of Zn0.52Se0.48/Si Schottky diodes
|
Venkatachalam, S. |
|
2004 |
48 |
12 |
p. 2219-2223 5 p. |
artikel |
32 |
Predictive model of a reduced surface field p-LDMOSFET using neural network
|
Kim, Byunghwhan |
|
2004 |
48 |
12 |
p. 2153-2157 5 p. |
artikel |
33 |
Preparation and electrical properties of SrTiO3 ceramics doped with M2O3–PbO–CuO
|
Zhao, Jingchang |
|
2004 |
48 |
12 |
p. 2287-2291 5 p. |
artikel |
34 |
Promotion of piezoelectric properties of lead zirconate titanate ceramics with (Zr,Ti) partially replaced by Nb2O5
|
Chen, Bing-Huei |
|
2004 |
48 |
12 |
p. 2293-2297 5 p. |
artikel |
35 |
Quarter micron BiCMOS technology platform with implanted-base- or SiGe-bipolar transistor for wireless communication ICs
|
Tilke, Armin T. |
|
2004 |
48 |
12 |
p. 2243-2249 7 p. |
artikel |
36 |
Response to “Comment on ‘Negative Schottky barrier between titanium and n-type Si(001) for low-resistance ohmic contacts”’ [Solid State Electron. 2004;48:335–8]
|
Tao, M. |
|
2004 |
48 |
12 |
p. 2351-2352 2 p. |
artikel |
37 |
Simulation of submicrometer metal–semiconductor–metal ultraviolet photodiodes on gallium nitride
|
Li, J. |
|
2004 |
48 |
12 |
p. 2329-2334 6 p. |
artikel |
38 |
The SILC study by PDO method
|
Wang, Z(i)ou |
|
2004 |
48 |
12 |
p. 2335-2338 4 p. |
artikel |
39 |
100 Å-thick tunnel junction by double impurity doping liquid phase epitaxy for V-band TUNNETT oscillation
|
Nishizawa, Jun-ichi |
|
2004 |
48 |
12 |
p. 2251-2254 4 p. |
artikel |