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                             26 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A hydrodynamic transport model and its applications in semiconductor device simulation Zhang, Yaxi
1993
36 12 p. 1689-1696
8 p.
artikel
2 AlAs/GaAs Schottky-collector resonant-tunnel-diodes Konishi, Y.
1993
36 12 p. 1673-1676
4 p.
artikel
3 A note on the Shukla-Sen drift velocity model for hot charge carriers in Ge and Si Roy, D.K.
1993
36 12 p. 1795-1796
2 p.
artikel
4 A study of selective and nonselective reactive ion etching of GaAs/AlGaAs materials Su, Y.K.
1993
36 12 p. 1779-1785
7 p.
artikel
5 Breakdown voltage of high-voltage GaAs Schottky diodes Ashkinazi, G.
1993
36 12 p. 1793-1794
2 p.
artikel
6 Diffusion from zinc-doped spin-on sources into n-gallium antimonide Heinz, C.
1993
36 12 p. 1685-1688
4 p.
artikel
7 Direct bonding of GaAs films on silicon circuits by epitaxial liftoff Ersen, Ali
1993
36 12 p. 1731-1739
9 p.
artikel
8 Editorial: Software survey section 1993
36 12 p. I-III
nvt p.
artikel
9 Editors' biographies 1993
36 12 p. v-
1 p.
artikel
10 Electrical studies of the reactions between ethanol vapours and inversion mode Si-thin SiO2 structures Atanassova, E.
1993
36 12 p. 1711-1716
6 p.
artikel
11 Equivalent analytical solution for the minority carrier transport in doped silicon Abenante, Luigi
1993
36 12 p. 1797-1800
4 p.
artikel
12 Investigation of Se-doped GaSb epilayers grown by low pressure metal-organic chemical vapor deposition Su, Y.K.
1993
36 12 p. 1773-1778
6 p.
artikel
13 List of contents and author index 1993
36 12 p. i-xxiv
nvt p.
artikel
14 Low temperature impurity diffusion in SiC: Planar quantum-size p-n junctions and n-p-n transistor structures Bagraev, N.T.
1993
36 12 p. 1741-1747
7 p.
artikel
15 Modeling the effect of back gate bias on the subthreshold behavior of a SiGe-channel SOI PMOS device Kuo, J.B.
1993
36 12 p. 1757-1761
5 p.
artikel
16 MOSFET effective channel width determination by nonlinear optimization McAndrew, Colin C.
1993
36 12 p. 1717-1723
7 p.
artikel
17 New boundary conditions for the simulation of Schottky structure characteristics Racko, J.
1993
36 12 p. 1790-1792
3 p.
artikel
18 On the characterization of surface states and deep traps in GaAs MESFETs Zhao, J.H.
1993
36 12 p. 1665-1672
8 p.
artikel
19 Process and device characterization of high voltage gallium arsenide P-i-N layers grown by an improved liquid phase epitaxy method Ashkinazi, G.
1993
36 12 p. 1749-1755
7 p.
artikel
20 Strain effects on device characteristics: Implementation in drift-diffusion simulators Egley, J.L.
1993
36 12 p. 1653-1664
12 p.
artikel
21 Temperature, electric field, and doping dependent mobilities of electrons and holes in semiconductors Noor Mohammad, S.
1993
36 12 p. 1677-1683
7 p.
artikel
22 Theoretical calculation and experimental evidence of the real and apparent bandgap narrowing due to heavy doping in p-type Si and strained Si1−x Ge x layers Poortmans, J.
1993
36 12 p. 1763-1771
9 p.
artikel
23 The temperature and current profiles in an emitter finger as a function of the finger length Liu, William
1993
36 12 p. 1787-1789
3 p.
artikel
24 Thin oxide grown on heavily channel-implanted substrate by using a low temperature wafer loading and N2 pre-annealing process Shye Lin Wu,
1993
36 12 p. 1725-1730
6 p.
artikel
25 Transport via the Liouville equation and moments of quantum distribution functions Grubin, H.L.
1993
36 12 p. 1697-1709
13 p.
artikel
26 W. Crawford Dunlap 1993
36 12 p. iii-
1 p.
artikel
                             26 gevonden resultaten
 
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