nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A simple model for the MOS transistor in saturation
|
El Nokali, M. |
|
1986 |
29 |
6 |
p. 591-596 6 p. |
artikel |
2 |
A simplified model for the static characteristics of amorphous silicon thin-film transistors
|
Neudeck, G.W. |
|
1986 |
29 |
6 |
p. 639-645 7 p. |
artikel |
3 |
Effects of varying the processing parameters on the interface-state density and retention characteristics of an MNOS capacitor
|
de Almeida, A.M. |
|
1986 |
29 |
6 |
p. 619-624 6 p. |
artikel |
4 |
Electroless deposition as a means of obtaining ohmic contacts: Au/Pd onto GaAs
|
Lamouche, D. |
|
1986 |
29 |
6 |
p. 625-632 8 p. |
artikel |
5 |
Experimental and theoretical evaluation of boron diffused high-low junctions for BSF solar cells
|
Girisch, R. |
|
1986 |
29 |
6 |
p. 667-676 10 p. |
artikel |
6 |
High-voltage multiple-resistivity drift-region LDMOS
|
Mena, Jóse G. |
|
1986 |
29 |
6 |
p. 647-656 10 p. |
artikel |
7 |
Measurement and characterization of interface state tunneling in metal-insulator-semiconductor structures
|
Jain, Sanjay |
|
1986 |
29 |
6 |
p. 597-606 10 p. |
artikel |
8 |
On
1
f
noise in RuO2-based thick resistive films
|
Kusy, Andrzej |
|
1986 |
29 |
6 |
p. 657-665 9 p. |
artikel |
9 |
On the difference in apparent barrier height as obtained from capacitance-voltage and current-voltage-temperature measurements on Al/p-InP Schottky barriers
|
Song, Y.P. |
|
1986 |
29 |
6 |
p. 633-638 6 p. |
artikel |
10 |
Parameter sensitivity analysis for computer modelling of metal-semiconductor junctions
|
Tarnay, K. |
|
1986 |
29 |
6 |
p. 613-617 5 p. |
artikel |
11 |
Schottky diode analysis for evaluation of RIE effects on silicon surfaces
|
Spirito, P. |
|
1986 |
29 |
6 |
p. 607-611 5 p. |
artikel |
12 |
Software survey section
|
|
|
1986 |
29 |
6 |
p. I-IV nvt p. |
artikel |
13 |
Susceptibility of on-chip protection circuits to latent failures caused by electrostatic discharges
|
Neelakantaswamy, P.S. |
|
1986 |
29 |
6 |
p. 677-679 3 p. |
artikel |