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Journal description
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Details for article 11 of 13 found articles
| Title: |
Schottky diode analysis for evaluation of RIE effects on silicon surfaces |
| Author: |
Spirito, P. Ransom, C.M. Oehrlein, G.S. |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 29 (1986) nr. 6 pages 5 p. |
| Year: |
1986 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 11 of 13 found articles
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