| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
An analysis of the collection mechanisms in inversion layer solar cells
|
Heasell, E.L.
|
|
1984
|
27 |
5 |
p. 475-483
9 p.
|
article
|
| 2 |
Announcement
|
|
|
1984
|
27 |
5 |
p. 497-
1 p.
|
article
|
| 3 |
AuGeNi migration affected by operating conditions of GaAs FETs
|
Dell, J.
|
|
1984
|
27 |
5 |
p. 447-452
6 p.
|
article
|
| 4 |
Boundary conditions for pn heterojunctions
|
Lundstrom, M.S.
|
|
1984
|
27 |
5 |
p. 491-496
6 p.
|
article
|
| 5 |
Carrier trapping centers and interface states induced by r.f. sputtering of molybdenum electrodes in MOS-structure diodes
|
Noda, Minoru
|
|
1984
|
27 |
5 |
p. 399-406
8 p.
|
article
|
| 6 |
Chromium redistribution in ion-implanted GaAs
|
Yee, Camellia M.L.
|
|
1984
|
27 |
5 |
p. 453-457
5 p.
|
article
|
| 7 |
Editorial-software survey section
|
|
|
1984
|
27 |
5 |
p. I-III
nvt p.
|
article
|
| 8 |
Effects of grain-boundary trapping-state energy distribution on the activation energy of resistivity of polycrystalline-silicon films
|
Lu, Chih-Yuan
|
|
1984
|
27 |
5 |
p. 463-466
4 p.
|
article
|
| 9 |
Flicker noise in MOSFETs with gate-voltage-dependent mobility
|
Duh, K.H.
|
|
1984
|
27 |
5 |
p. 459-461
3 p.
|
article
|
| 10 |
Large-signal photoconductivity in semiconductors
|
Bube, Richard H.
|
|
1984
|
27 |
5 |
p. 467-473
7 p.
|
article
|
| 11 |
Potential and limitations of Schottky-barrier barritt devices
|
El-Gabaly, M.
|
|
1984
|
27 |
5 |
p. 433-440
8 p.
|
article
|
| 12 |
Regenerative switching in V-groove metal oxide semiconductor field-effect transistor structure
|
Bhagat, Jayant K.
|
|
1984
|
27 |
5 |
p. 441-446
6 p.
|
article
|
| 13 |
Semiempirical determination of avalanche breakdown temperature parameters in p-n junctions
|
Tjapkin, D.
|
|
1984
|
27 |
5 |
p. 407-411
5 p.
|
article
|
| 14 |
Small-signal high-frequency performance of power MOS transistors
|
McGregor, P.
|
|
1984
|
27 |
5 |
p. 419-432
14 p.
|
article
|
| 15 |
The density of states at GaAs/native oxide interfaces
|
Ahrenkiel, R.K.
|
|
1984
|
27 |
5 |
p. 485-489
5 p.
|
article
|
| 16 |
Work function measurements during growth of ultra thin films of SiO2 on characterized silicon surfaces
|
Raisin, C.
|
|
1984
|
27 |
5 |
p. 413-417
5 p.
|
article
|
Journal description