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Journal description
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Details for article 16 of 16 found articles
| Title: |
Work function measurements during growth of ultra thin films of SiO2 on characterized silicon surfaces |
| Author: |
Raisin, C. Vieujot-Testemale, E. Brahim, A.Ben Palau, J.M. Lassabatere, L. |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 27 (1984) nr. 5 pages 5 p. |
| Year: |
1984 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 16 of 16 found articles
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