nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A complete analytic model for the base and collector current in lateral p-n-p transistors
|
Eltoukhy, A.A. |
|
1984 |
27 |
1 |
p. 69-75 7 p. |
artikel |
2 |
An analytical method for determining intrinsic drain/source resistance of lightly doped drain (LDD) devices
|
Duvvury, Charvaka |
|
1984 |
27 |
1 |
p. 89-96 8 p. |
artikel |
3 |
Autocorrelation measurements of CdS x Se1-x thin film noise
|
Filiač, V. |
|
1984 |
27 |
1 |
p. 27-32 6 p. |
artikel |
4 |
Carrier mobility in inversion layers and rf plasma induced radiation defects at the SiSiO2 interface
|
Kassabov, J. |
|
1984 |
27 |
1 |
p. 13-19 7 p. |
artikel |
5 |
Comment on W.W. Anderson's “dielectric relaxation contribution to dispersion of junction admittance”
|
de Visschere, P. |
|
1984 |
27 |
1 |
p. 109-111 3 p. |
artikel |
6 |
Computer analysis on the collection of alpha-generated charge for reflecting and absorbing surface conditions around the collector
|
Terrill, K. |
|
1984 |
27 |
1 |
p. 45-52 8 p. |
artikel |
7 |
Current multiplication in MIS structures
|
Chein Wei Jen, |
|
1984 |
27 |
1 |
p. 1-11 11 p. |
artikel |
8 |
Current transport mechanisms of electrochemically deposited CdS/CdTe heterojunction
|
Ou, S.S. |
|
1984 |
27 |
1 |
p. 21-25 5 p. |
artikel |
9 |
Diffusion length and surface recombination velocity measurements with the scanning electron microscope: The highly-doped emitter of a p-n junction
|
Burk, D.E. |
|
1984 |
27 |
1 |
p. 59-67 9 p. |
artikel |
10 |
Editorial Board
|
|
|
1984 |
27 |
1 |
p. IFC- 1 p. |
artikel |
11 |
Influence of anneal temperature on the mobile ion concentration in MOS structures
|
Greeuw, G. |
|
1984 |
27 |
1 |
p. 77-81 5 p. |
artikel |
12 |
Orientation dependence of avalanche breakdown voltage in GaAs with nonuniform doping profiles
|
Shenai, K. |
|
1984 |
27 |
1 |
p. 107-108 2 p. |
artikel |
13 |
The electrical properties of zinc implanted GaAs
|
Kular, S.S. |
|
1984 |
27 |
1 |
p. 83-88 6 p. |
artikel |
14 |
Theory of the surface depletion region for semiconductors with linearly graded impurity profiles
|
Tarasewicz, S.W. |
|
1984 |
27 |
1 |
p. 33-43 11 p. |
artikel |
15 |
The theory of the long-channel MOSFET
|
Nussbaum, Allen |
|
1984 |
27 |
1 |
p. 97-106 10 p. |
artikel |
16 |
Tunneling of holes from acceptor levels in an applied field
|
Nie, Hui-Quan |
|
1984 |
27 |
1 |
p. 53-58 6 p. |
artikel |