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                             20 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 An algorithm for treating interface surface charge in the two-dimensional discretization of Poisson's equation for the numerical analysis of semiconductor devices such as MOSFETs Sutherland, A.D.
1980
23 10 p. 1085-1087
3 p.
artikel
2 Carrier compensation in O+ implanted n-type GaAs Asano, T.
1980
23 10 p. 1089-1090
2 p.
artikel
3 Distributed series resistance in photovoltaic devices; intensity and loading effects Smirnov, Georgy M.
1980
23 10 p. 1055-1058
4 p.
artikel
4 Effect of minority carrier injection on lateral current in MIS tunnel structures Ruzyłło, J.
1980
23 10 p. 1041-1045
5 p.
artikel
5 Electrical properties of CVD Al2O3GaAs MIS capacitors Tanaka, Kuniaki
1980
23 10 p. 1093-1094
2 p.
artikel
6 Equivalent temperature of hot electrons van der Ziel, A.
1980
23 10 p. 1035-1036
2 p.
artikel
7 Erratum 1980
23 10 p. 1099-
1 p.
artikel
8 Examination of CCDs using voltage contrast with a scanning electron microscope Rodman, J.K.
1980
23 10 p. 1029-1033
5 p.
artikel
9 Fabrication and characteristics of “autodoped depletion VMOSTs” Bhattacharyya, A.B.
1980
23 10 p. 1094-1097
4 p.
artikel
10 Formation and stability of In contacts to n-type CdTe Braithwaite, R.E.
1980
23 10 p. 1091-1092
2 p.
artikel
11 Interface charges beneath laser-annealed insulators on silicon Kamins, T.I.
1980
23 10 p. 1037-1039
3 p.
artikel
12 Mechanism of operation of field-effect devices Gupta, Ravendra K.
1980
23 10 p. 1011-1014
4 p.
artikel
13 Memory hysteresis measurements on silicon oxynitride films Horváth, Zs.J.
1980
23 10 p. 1053-1054
2 p.
artikel
14 Operation model of floating-Si-gate channel-corner-avalanche-transition (FCAT) nonvolatile memory devices Horiuchi, Masatada
1980
23 10 p. 1047-1051
5 p.
artikel
15 Properties of CdSe thin film transistors prepared by photolithography Lee, M.J.
1980
23 10 p. 1087-1088
2 p.
artikel
16 Temperature effects in silicon solar cells Agarwala, Amita
1980
23 10 p. 1021-1028
8 p.
artikel
17 The effect of high temperature annealing on the spatial variation of bulk lifetime near the SiSiO2 interface Manchanda, L.
1980
23 10 p. 1015-1020
6 p.
artikel
18 Theory and application of a nondestructive photovoltaic technique for the measurement of resistivity variations in circular semiconductor slices Larrabee, R.D.
1980
23 10 p. 1059-1068
10 p.
artikel
19 Theory of extrinsic and intrinsic heterojunctions in thermal equilibrium von Ross, Oldwig
1980
23 10 p. 1069-1075
7 p.
artikel
20 Two-dimensional field distribution analysis of reverse biased p-n junction devices Yasuda, Seiji
1980
23 10 p. 1077-1084
8 p.
artikel
                             20 gevonden resultaten
 
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