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                             11 results found
no title author magazine year volume issue page(s) type
1 Analysis of the mobility behavior of MOS2 2D FETs Cerdeira, Antonio

224 C p.
article
2 Comprehensive analysis of MOSFET threshold voltage extraction method considering DIBL effect from 300 K down to 10 K Ma, Zhizhao

224 C p.
article
3 Editorial Board
224 C p.
article
4 Editorial. Special issue. EUROSOI-ULIS 2023 Iniguez, Benjamin

224 C p.
article
5 Editorial: Special Issue – EUROSOI-ULIS 2023 (Full-Length)
224 C p.
article
6 Enhanced threshold voltage tuning in FD-SOI MOSFET with ferroelectric buried oxide Cristoloveanu, Sorin

224 C p.
article
7 Equivalence of proton-induced displacement damage in InP-based HEMT Liu, Bo

224 C p.
article
8 GatedNN: An accurate deep learning-based parameter extraction for BSIM-CMG Guo, Guangxin

224 C p.
article
9 Simulation and experimental Demonstration on A retrograde drift LDMOS Yu, Shaoxin

224 C p.
article
10 Study on electrical performance of AlGaN/GaN high electron mobility transistor based on cap layer design Zhang, Tieying

224 C p.
article
11 Suppression of de-trapping by remanent polarization in dual-mechanism flash memory Shin, Eui Joong

224 C p.
article
                             11 results found
 
 Koninklijke Bibliotheek - National Library of the Netherlands