| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A Schottky phototransistor
|
Lee, Chung L.
|
|
1978
|
21 |
7 |
p. 989-991
3 p.
|
artikel
|
| 2 |
Characterization of pyrolytic boron nitride as a diffusion source for silicon
|
Nevin, Joseph H.
|
|
1978
|
21 |
7 |
p. 987-988
2 p.
|
artikel
|
| 3 |
Correlation between Schottky electron and hole currents from a metal contact on chemically etched silicon
|
Tove, P.A.
|
|
1978
|
21 |
7 |
p. 919-922
4 p.
|
artikel
|
| 4 |
Determination of diffusion length and surface recombination velocity by light excitation
|
Hu, Chenming
|
|
1978
|
21 |
7 |
p. 965-968
4 p.
|
artikel
|
| 5 |
Determination of doping factor, mobility ratio and excess concentration using photovoltages at extreme band bendings
|
Heilig, K.
|
|
1978
|
21 |
7 |
p. 975-980
6 p.
|
artikel
|
| 6 |
Effect of back surface field on photocurrent in a semiconductor junction
|
Sinha, Amitabha
|
|
1978
|
21 |
7 |
p. 943-951
9 p.
|
artikel
|
| 7 |
Energy relaxation of photoexcited hot electrons at very low temperatures
|
Levinson, Y.B.
|
|
1978
|
21 |
7 |
p. 923-926
4 p.
|
artikel
|
| 8 |
N-type doping of indium phosphide by implantation
|
Davies, D.Eirug
|
|
1978
|
21 |
7 |
p. 981-985
5 p.
|
artikel
|
| 9 |
On low-frequency noise in tunnel diodes
|
Kleinpenning, T.G.M.
|
|
1978
|
21 |
7 |
p. 927-931
5 p.
|
artikel
|
| 10 |
Temperature coefficient of resistance for p- and n-type silicon
|
Norton, P.
|
|
1978
|
21 |
7 |
p. 969-974
6 p.
|
artikel
|
| 11 |
The energy levels and the defect signature of sulfur-implanted silicon by thermally stimulated measurements
|
Koyama, R.Y.
|
|
1978
|
21 |
7 |
p. 953-955
3 p.
|
artikel
|
| 12 |
Theory of diffusion constant-, lifetime- and surface recombination velocity-measurements with the scanning electron microscope
|
Kamm, J.D.
|
|
1978
|
21 |
7 |
p. 957-964
8 p.
|
artikel
|
| 13 |
The role of source boundary condition in spreading resistance calculations
|
Leong, M.S.
|
|
1978
|
21 |
7 |
p. 933-941
9 p.
|
artikel
|
| 14 |
The similarity of the dark and photo-stimulated dielectric relaxation in Langmuir films
|
Jonscher, A.K.
|
|
1978
|
21 |
7 |
p. 991-994
4 p.
|
artikel
|
| 15 |
Trap levels in P and N buried channel CCD
|
Lakhoua, N.
|
|
1978
|
21 |
7 |
p. 994-997
4 p.
|
artikel
|
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