nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A depletion load self-aligned technology
|
Borel, J. |
|
1973 |
16 |
12 |
p. 1377-1381 5 p. |
artikel |
2 |
Analyses of transient capacitance experiments for AuGaAs Schottky barrier diodes in the presence of deep impurities and the interfacial layer
|
Huang, Chern I. |
|
1973 |
16 |
12 |
p. 1481-1486 6 p. |
artikel |
3 |
An analysis of the circular approximation for silicon planar junctions
|
Wilson, P.R. |
|
1973 |
16 |
12 |
p. 1511-1515 5 p. |
artikel |
4 |
An analysis of the threshold voltage for short-channel IGFET's
|
Lee, H.S. |
|
1973 |
16 |
12 |
p. 1407-1417 11 p. |
artikel |
5 |
An experimental determination of the ambipolar diffusion coefficient in germanium
|
Cosby, R.M. |
|
1973 |
16 |
12 |
p. 1441-1446 6 p. |
artikel |
6 |
Boundary conditions for forward biased p-n junctions
|
Van Der Ziel, A. |
|
1973 |
16 |
12 |
p. 1509-1511 3 p. |
artikel |
7 |
Comparison of avalanche photodiode and photoparametric upconverter signal-to-noise ratio
|
Tandon, J.C. |
|
1973 |
16 |
12 |
p. 1503-1505 3 p. |
artikel |
8 |
Effect of chemisorbed oxygen on the Au, Cu-CdS barrier height
|
McCarthy, S.J. |
|
1973 |
16 |
12 |
p. 1435-1439 5 p. |
artikel |
9 |
Effect of illumination on noise and some other characteristics of p-n junctions in InSb
|
Lukyanchikova, N.B. |
|
1973 |
16 |
12 |
p. 1473-1480 8 p. |
artikel |
10 |
Effects of diffused nickel on the silicon-silicon dioxide interface
|
Liblich, S. |
|
1973 |
16 |
12 |
p. 1495-1499 5 p. |
artikel |
11 |
Effects of electron and neutron irradiation on the electrical properties of Si on MgO·Al2O3 spinel
|
Stein, H.J. |
|
1973 |
16 |
12 |
p. 1391-1397 7 p. |
artikel |
12 |
Effects of temperature on current instabilities caused by recombination centers in semiconductors
|
Elsharkawi, A.R. |
|
1973 |
16 |
12 |
p. 1355-1361 7 p. |
artikel |
13 |
Experimental location of the surface and bulk 1 f noise currents in low-noise, high-gain NPN planar transistors
|
Knott, K.F. |
|
1973 |
16 |
12 |
p. 1429-1434 6 p. |
artikel |
14 |
1 f Noise in silicon diodes
|
Jäntsch, O. |
|
1973 |
16 |
12 |
p. 1517-1520 4 p. |
artikel |
15 |
Formation kinetics and structure of Pd2Si films on Si
|
Bower, R.W. |
|
1973 |
16 |
12 |
p. 1461-1471 11 p. |
artikel |
16 |
Low-temperature photocapacity measurement in MOS structure
|
Kamieniecki, E. |
|
1973 |
16 |
12 |
p. 1487-1493 7 p. |
artikel |
17 |
Magnetodiode transients
|
Pfleiderer, Hans |
|
1973 |
16 |
12 |
p. 1347-1354 8 p. |
artikel |
18 |
Mathematical analysis of a heterojunction, applied to the copper sulphide-cadmium sulphide solar cell
|
te Velde, T.S. |
|
1973 |
16 |
12 |
p. 1305-1314 10 p. |
artikel |
19 |
Measurement of low densities of surface states at the SiSiO2-interface
|
Declerck, G. |
|
1973 |
16 |
12 |
p. 1451-1460 10 p. |
artikel |
20 |
Metal-germanium Schottky barriers
|
Thanailakis, A. |
|
1973 |
16 |
12 |
p. 1383-1389 7 p. |
artikel |
21 |
Metal semiconductor contact: Resistivity and noise
|
Nougier, J.P. |
|
1973 |
16 |
12 |
p. 1399-1405 7 p. |
artikel |
22 |
Minority carrier transport in metal-semiconductor junctions
|
Calzolari, P.U. |
|
1973 |
16 |
12 |
p. 1501-1503 3 p. |
artikel |
23 |
Notice of meeting
|
|
|
1973 |
16 |
12 |
p. 1523- 1 p. |
artikel |
24 |
On phosphorus diffusion in silicon under oxidizing atmospheres
|
Masetti, G. |
|
1973 |
16 |
12 |
p. 1419-1421 3 p. |
artikel |
25 |
P.I.B. International symposium—XXIII. Optical and acoustical micro-electronics
|
|
|
1973 |
16 |
12 |
p. 1521- 1 p. |
artikel |
26 |
P-I-N junctions in polycrystalline-silicon
|
Mónico-García, J.P. |
|
1973 |
16 |
12 |
p. 1515-1517 3 p. |
artikel |
27 |
Single-section lumped models for integrated circuit resistors
|
Bhattacharyya, A.B. |
|
1973 |
16 |
12 |
p. 1506-1509 4 p. |
artikel |
28 |
Some pitfalls in fast ramp C-V measurements
|
McCaughan, Daniel V. |
|
1973 |
16 |
12 |
p. 1423-1427 5 p. |
artikel |
29 |
Surface charge and stress in the Si/SiO2 system
|
Brotherton, S.D. |
|
1973 |
16 |
12 |
p. 1367-1375 9 p. |
artikel |
30 |
Surface effects of GaAs0·6P0·4 light emitting diodes
|
Leistiko Jr., O. |
|
1973 |
16 |
12 |
p. 1321-1336 16 p. |
artikel |
31 |
Thermal effects on the forward characteristics of silicon p-i-n diodes at high pulse currents
|
Silber, D. |
|
1973 |
16 |
12 |
p. 1337-1346 10 p. |
artikel |
32 |
Thermal noise of a silicon double-injection plasma diode
|
Bilger, H.R. |
|
1973 |
16 |
12 |
p. 1363-1365 3 p. |
artikel |
33 |
Thermal properties of annular and array geometry semiconductor devices on composite heat sinks
|
Board, K. |
|
1973 |
16 |
12 |
p. 1315-1320 6 p. |
artikel |
34 |
Transport in semiconductors with low scattering rate and at high frequencies
|
Sah, C.T. |
|
1973 |
16 |
12 |
p. 1447-1449 3 p. |
artikel |