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                             34 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A depletion load self-aligned technology Borel, J.
1973
16 12 p. 1377-1381
5 p.
artikel
2 Analyses of transient capacitance experiments for AuGaAs Schottky barrier diodes in the presence of deep impurities and the interfacial layer Huang, Chern I.
1973
16 12 p. 1481-1486
6 p.
artikel
3 An analysis of the circular approximation for silicon planar junctions Wilson, P.R.
1973
16 12 p. 1511-1515
5 p.
artikel
4 An analysis of the threshold voltage for short-channel IGFET's Lee, H.S.
1973
16 12 p. 1407-1417
11 p.
artikel
5 An experimental determination of the ambipolar diffusion coefficient in germanium Cosby, R.M.
1973
16 12 p. 1441-1446
6 p.
artikel
6 Boundary conditions for forward biased p-n junctions Van Der Ziel, A.
1973
16 12 p. 1509-1511
3 p.
artikel
7 Comparison of avalanche photodiode and photoparametric upconverter signal-to-noise ratio Tandon, J.C.
1973
16 12 p. 1503-1505
3 p.
artikel
8 Effect of chemisorbed oxygen on the Au, Cu-CdS barrier height McCarthy, S.J.
1973
16 12 p. 1435-1439
5 p.
artikel
9 Effect of illumination on noise and some other characteristics of p-n junctions in InSb Lukyanchikova, N.B.
1973
16 12 p. 1473-1480
8 p.
artikel
10 Effects of diffused nickel on the silicon-silicon dioxide interface Liblich, S.
1973
16 12 p. 1495-1499
5 p.
artikel
11 Effects of electron and neutron irradiation on the electrical properties of Si on MgO·Al2O3 spinel Stein, H.J.
1973
16 12 p. 1391-1397
7 p.
artikel
12 Effects of temperature on current instabilities caused by recombination centers in semiconductors Elsharkawi, A.R.
1973
16 12 p. 1355-1361
7 p.
artikel
13 Experimental location of the surface and bulk 1 f noise currents in low-noise, high-gain NPN planar transistors Knott, K.F.
1973
16 12 p. 1429-1434
6 p.
artikel
14 1 f Noise in silicon diodes Jäntsch, O.
1973
16 12 p. 1517-1520
4 p.
artikel
15 Formation kinetics and structure of Pd2Si films on Si Bower, R.W.
1973
16 12 p. 1461-1471
11 p.
artikel
16 Low-temperature photocapacity measurement in MOS structure Kamieniecki, E.
1973
16 12 p. 1487-1493
7 p.
artikel
17 Magnetodiode transients Pfleiderer, Hans
1973
16 12 p. 1347-1354
8 p.
artikel
18 Mathematical analysis of a heterojunction, applied to the copper sulphide-cadmium sulphide solar cell te Velde, T.S.
1973
16 12 p. 1305-1314
10 p.
artikel
19 Measurement of low densities of surface states at the SiSiO2-interface Declerck, G.
1973
16 12 p. 1451-1460
10 p.
artikel
20 Metal-germanium Schottky barriers Thanailakis, A.
1973
16 12 p. 1383-1389
7 p.
artikel
21 Metal semiconductor contact: Resistivity and noise Nougier, J.P.
1973
16 12 p. 1399-1405
7 p.
artikel
22 Minority carrier transport in metal-semiconductor junctions Calzolari, P.U.
1973
16 12 p. 1501-1503
3 p.
artikel
23 Notice of meeting 1973
16 12 p. 1523-
1 p.
artikel
24 On phosphorus diffusion in silicon under oxidizing atmospheres Masetti, G.
1973
16 12 p. 1419-1421
3 p.
artikel
25 P.I.B. International symposium—XXIII. Optical and acoustical micro-electronics 1973
16 12 p. 1521-
1 p.
artikel
26 P-I-N junctions in polycrystalline-silicon Mónico-García, J.P.
1973
16 12 p. 1515-1517
3 p.
artikel
27 Single-section lumped models for integrated circuit resistors Bhattacharyya, A.B.
1973
16 12 p. 1506-1509
4 p.
artikel
28 Some pitfalls in fast ramp C-V measurements McCaughan, Daniel V.
1973
16 12 p. 1423-1427
5 p.
artikel
29 Surface charge and stress in the Si/SiO2 system Brotherton, S.D.
1973
16 12 p. 1367-1375
9 p.
artikel
30 Surface effects of GaAs0·6P0·4 light emitting diodes Leistiko Jr., O.
1973
16 12 p. 1321-1336
16 p.
artikel
31 Thermal effects on the forward characteristics of silicon p-i-n diodes at high pulse currents Silber, D.
1973
16 12 p. 1337-1346
10 p.
artikel
32 Thermal noise of a silicon double-injection plasma diode Bilger, H.R.
1973
16 12 p. 1363-1365
3 p.
artikel
33 Thermal properties of annular and array geometry semiconductor devices on composite heat sinks Board, K.
1973
16 12 p. 1315-1320
6 p.
artikel
34 Transport in semiconductors with low scattering rate and at high frequencies Sah, C.T.
1973
16 12 p. 1447-1449
3 p.
artikel
                             34 gevonden resultaten
 
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